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微 系 统 封 装 术 语 汇 总 表Aaccelerated stress test 加速应力测试accelerator 促进剂active components 有源元件active trimming 有源修调additive plating 加成电镀additive process 加成工艺advanced statistical analysis program(ASTAP) 高级统计分析程序alloy 合金alpha particle 粒子analog circuit 模拟电路analog-to-digital(A/D) 模拟到数字anisotropic adhesive 各向异性导电胶application specific integrated circuit(ASIC) 专用集成电路area array TAB 面阵载带自动焊array 阵列aspect ratio 深宽比assembly 组装assembly/rework 组装/返修Bbackbonding 背面焊接back-end-of-the-line(BEOL) 后道工序backplane 背板backside metallurgy(BSM) 背面合金化ball grid array(BGA) 球栅阵列ball limiting metallurgy(BLM) 球限金属化层bandwidth 宽带bare die 裸芯片BiCMOS 双极互补金属氧化物半导体BIFET 双极场效应晶体管binder 粘合剂BiNMOS 双极NMOSbipolar junction transistor(BJT) 双极结晶体管bipolar transistor 双极晶体管block copolymer 块状异分子聚合物built-in self-test(BIST) 内建自测试blind via 盲孔board 电路板boiling 沸腾bondability 可键和性brazing 钎焊接BTAB 凸点载带自动焊bumped tape 凸点载带buried via 埋孔burn-in 老化burn-off 烧掉Ccache memory 缓冲存储器camber 弯度capacitance 电容card 插卡card-on-board 板上插卡catalyst 催化剂cell design, standard(standard cell design) 标准单元设计central processor(CP) 中央处理器ceramic 陶瓷ceramic ball grid array(CBGA) 陶瓷球栅阵列ceramic column grid array(CCGA) 陶瓷柱栅阵列ceramic dual-in-line package(CDIP) 陶瓷双列直插式封装ceramic quad flat pack(CQFP)陶瓷四边引力脚扁平封装cermet 陶瓷合金channels 信道characteristic impedance(Z0) 特征阻抗chemical vapor deposition(CVD) 化学气相淀积chemorheology 化学流变学chip 芯片chip carrier 芯片载体chip design, depopulated(depopulated chip disign) 非常规芯片设计chip-on-board(COB) 板上芯片chip-on-chip(COC) 叠层芯片chip-on-flex(COF) 柔性基板上芯片cladding 包层clock skew 时钟偏移coated-metal core substrate 涂层金属芯基板coefficient of thermal expansion(CTE) 热膨胀系数Coffin-Mason equation Coffin-Mason方程cofiring 共烧cofired ceramic 共烧陶瓷colorant 着色剂column grid array(CGA) 柱栅阵列compliant bond 柔性粘接剂complimentary metal-oxidesemiconductor(CMOS) 互补金属氧化物半导体compression seal 压缩粘接conduction 传导conduction adhesive 导电粘接剂conductive epoxy 导电环氧树脂胶conductive ink technology 导电涂料工艺conductor, electrical(electrical conductor) 电导体conductor, thermal(thermal conductor) 热导体conformal coating 保形涂层connections 连接connectivity 可连性contact angle 接触角controlled collapse chip connection(C4) 可控塌陷芯片连接controlling collapse 可控塌陷convection 对流coplanar leads(flat leads) 平面引脚copolymer 异分子聚合物cordierite 堇青石coupled noise 耦合噪声(与串扰同义)coupler 偶联剂coupling capacitor 耦合电容crazing 微裂creep 蠕变crossover 跨接cross talk 串扰crystallization 结晶化cumulative distribution function(CDF) 累积分布函数cure 固化curing agent 固化剂curing cycle 固化循环current carrying capacity 电流输运能力current design 用户设计cycles per instruction 单指令周期Ddecoupling capacitor 去耦电容deep sub-micron 深亚微米delamination 分层delay equation 延迟方程delta-I noise(I) I噪声design limits 设计约数devitrification 除琉化dew point 露点die 芯片die bond 芯片粘合die stacking 芯片层叠dielectric 绝缘介质dielectric constant 介质常数dielectric layer 绝缘层dielectric loss 介电损耗differential scanning calorimetry(DSC) 差分扫描热量计digital-to-analog(D/A) 数字到模拟diode 二极管direct access storage device(DASD) 直接存取存储器件direct chip attach(DCA) 芯片直接安装discrete component 分立元件discrete device 分立器件distance to neutral point(DNP) 到中性点的距离doctor blade 刮浆刀double-sided substrate 双面基板dynamic RAM(DRAM) 动态随机存储器driver 驱动器dry film photoresist 干膜光刻胶dry pressing 干膜压dual-in-line package(DIP) 双列直插式封装dynamic flex 可动柔性电路dynamic random access memory(DRAM) 动态随机存储器Eeffective inductance(LEFF) 有效电感electrically long transmission line 长传输线electrically short transmission line 短传输线electroless plating 化学镀electromigration 电迁移electron beam lithography 电子束光刻electroplating 电镀electrostatic discharge(ESD) 静电放电elongation 延伸率emitter-coupled logic(ECL) 发射极耦合逻辑enameling 涂瓷漆encapsulation 包封end of life(EOL) 可用期engineering change(EC) 工程更改entity 整体eutectic 共晶etching 腐蚀external resistance 外热阻Ffailure 失效failure rate 失效率fast wave propagation 快波传输fatigue 疲劳ferroelectric 铁电field effect transistor(FET) 场效应晶体管field replaceable unit(FRU) 现场可置换单元filler 填充剂finite element modeling 有限元建模first-incident switching 初次关联开关flame retarder 阻燃剂flat PAC 扁平封装flexible circuit carrier 柔性电路载体flexible coating 柔性涂层flexible printed circuit(FPC) 柔性印刷电路flexural strength 弯曲强度flip-chip 倒装floor planning 预决策flow regime, laminar(laminar flow regime) 层流flow regime, turbulent(turbulent flor regime) 湍流flux 助焊剂footprint 痕迹fracture toughness 断裂韧度free-space optical interconnect 自由空间光互连frit 玻璃料front-end-of-the line(FEOL) 前道工序FR4functional test 功能测试Ggallium arsenide(GaAs) 砷化镓gate array 门阵列gate, logic(logic gate) 逻辑门gate, sea of(sea of gate)(参见门阵列) 门海gate, structural(structural gate) 结构化门glass 玻璃glass-ceramic 玻璃陶瓷glass+ceramic 玻璃+陶瓷glass ceramic 玻璃陶瓷glass fabric 玻璃纤维glass transition temperature(Tg) 玻璃转化温度glazed substrate 玻璃基板glazing 涂玻璃glob top 封顶global wiring 总布线gold flash 金飞边green 生的green ceramic 生陶瓷green-sheet 生基片ground plane 接地面guided probe 定向探测guided-wave 波导gullwing 鸥翼式Hhard glass 耐火玻璃heat flux 热流量heat sink 热沉hermetic 气密high-level noise tolerance(NTH) 高电平噪声容限homogenous medium 均匀介质hot-gas reflow 热气回流hot-knife soldering 热刀焊接hybrid 混合集成hybrid module 混合组件Iimpedance 阻抗impregnation 浸渍inductance 电感inert atmosphere 惰性气体infrared reflow(IR) 红外气流inhomogeneous medium 非均匀介质injection molded card(IMC) 注模成型卡input/output terminal(I/O) 输入/输出端insulation resistance(IR) 绝缘电阻insulator metal substrate technology(IMST) 绝缘体金属基板工艺insulators 绝缘体integrated circuit 集成电路interchip wiring 芯片之间互连线interconnection 互连interface 界面internal resistance 内部热阻interpenetrating polymer network(IPN) 互穿聚合物网络invar 镍铁合金ion implantation 离子注入ion migration 离子迁移isopak 等高封装JJ-lead J引线脚Josephson superconducting device 约瑟夫森超导器件Kkeeper bar, tab 载带自动焊的定位器kirkendahl voiding 空洞known good die(KGD) 优质芯片kovar 柯伐Llaminar flow regime 层流laminate 层压片lamination 层压large-scale integration(LSI) 大规模集成laser diode 激光二极管laser soldering 激光焊接lead frame 引线框架leaded-chip carrier plastic(PLCC) 塑料有引脚芯片载体leaded-chip carrier(LLCC) 有引脚芯片载体lift-off 剥离line discontinuity 引线突变点line loading 引线负数line resistance 引线电阻line per channel 每道引线数liquid crystal display(LCD) 液晶显示logic part 逻辑设计logic part 逻辑部件logic primitive 逻辑单元logic service terminal(LST) 逻辑辅助端口loss-less transmission line 无损耗传输线lossy transmission line 有损耗传输线low level noise tolerance(NTL) 低电平噪声容限low-fired cofired 低温共烧low-loss transmission line 低损耗传输线Mmacro 宏manhattan distance(length) 曼哈顿长度mask 掩模MCM-C 陶瓷基板多芯片组件MCM-D 淀积薄膜互连基板多芯片组件multilayer 多层mean time to failure(MTTF) 平均失效时间medium-scale integration(MSI) 中规模集成memory adder 求和寄存器metal migration 金属迁移metallization 金属化metal-oxide-semiconductor(MOS) 金属氧化物半导体metallization layer 金属化导电层metallized ceramic(MC) 金属化陶瓷micron 微米microstrip line 微带线microstructure 微结构Miners rule 迈纳规则module 组件moir 云纹法mold release 脱模剂molecular beam epitaxy(MBE) 分子束外延monolithic systems technology(MST) 单片系统技术Monto Carlo analysis 蒙特卡洛分析multichip module(MCM) 多芯片组件multichip package 多芯片封装multilayer ceramic(MLC) 多层陶瓷multilayer substrates 多层基板multi-reflection switching 多反射开关NN-type N型near infrared reflectance analysis(NIRA) 近红外反射分析仪negative resist 负抗蚀剂NET 网络noise 噪声noise saturation 噪声饱和nonlinear dielectric 非线性介质Ooptical interconnects 光互连optical lithography 光学光刻optical mask 光学掩模organic resist 有机抗蚀剂organic solvent 有机溶剂organic substrate 有机基板outer lead bonding 外引脚焊接overcoat 保护涂层overflow wire 引线过剩overglaze 面釉overlay 叠放Ppackage crossing 封装跨接package delay 封装延迟package level 封装级别pad 焊盘pad-grid array package(for VHSICS) 焊块栅阵列封装(用于VHSICS)PGA 焊盘栅阵列封装或针栅阵列封装parasitic effect 寄生效应passivation 钝化passive components(elements) 无源元件(单元)passive trimming 无源修调paste 浆料peel strength(peel test) 伸展强度(剥离试验)permeability 渗透率phase diagram 相图phosphosilicate glass(PSG) 磷硅玻璃photolithography 光刻physical design 物理设计pick-and-place 取放pin 针pin-grid array(PGA) 针栅阵列pin-through-hole(PTH) 针通孔封装pitch 节距placement 置放planar motor 平面马达plasma 等离子体plasma etching 等离子体刻蚀plastic 塑料plastic ball grid array(PBGA) 塑料球栅阵列plastic quad flat pack(PQFP) 塑料四边引脚扁平封装plating 镀plated through-hole(PTH) 镀通孔polyimides 聚酰亚胺polysilicon layer 多晶硅层porcelain 瓷料porcelain enamel technology(PET) 搪瓷技术positive resist 正刻蚀剂power distribution 电源分配power plane 电源导电层prepreg 预制层,半固化片pressure contact 压力接触printed-circuit board(PCB) 印刷电路板probability density function(PDF) 概率密度函数purple plague 紫斑pyrolyzed(burned) 热分解Qquad flat pack(QFP) 四边引脚扁平封装quad in-line package(QUIP) 四列直插式封装Rradial-spread coating 径向扩展涂敷工艺radiation 辐射random access memory(RAM) 随机存储器reaction injection molding(RIM) 反应注入铸模reactive etching 反应刻蚀receiver 接收装置reflection noise 反射噪声reflow soldering 回流焊接relative humidity(RH) 相对湿度reliability 可靠性Rents rule 瑞特规则resin 树脂resist 抗蚀剂resistance 电阻resistivity() 电阻率rheology 流变学rigid flex 刚性柔性板rosin flux 树脂型助焊剂routing program 规划程序rules design systems 通用设计系统Sself-generated noise tolerance 自产生噪声容限schematic 电路图screening 丝网印刷sealing 封接self stretching soldering technology(SST) 自拉伸焊接技术semiconductor 半导体sensor 传感器sheet resistance 方块电阻signal distribution 信号分配signal wiring 信号布线silicon bumping 硅凸点工艺silicon efficiency 硅效率simultaneously switching driver 同时开关驱动single-chip carrier 单芯片载体single-chip module(SCM) 单芯片组件single-in-line package(SIP) 单列直插式封装single-layer metallized package(SLAM) 单层金属化封装sintering 烧结skin effect 趋肤效应slow wave propagation 慢波传输slurry 悬浮度small outline package(SOP) 小外形封装small-scale integration(SSI) 小规模集成soft error 软误差soft glass 软玻璃softening point 软化点solder 焊料solder dam 焊料屏障solder glasses 焊接玻璃solder mask 阻焊层solder mask over bare copper(SMOBC) 裸铜板上阻焊层solderability 可焊度soldering 焊接solid logic technology(SLT) 固化逻辑工艺space transformer 空间转移SPICE 集成电路模拟程序sputter cleaning 溅射清洗sputtering 溅射static flex 固定柔性电路Steiner tree 抽头stencil 模板storage control element(SCE) 存储控制单元storage hierarchy 存储的分级结构stress corrosion 应力侵蚀stripline 带状线stub 接线柱subtracting patterning 递减制模subtractive process 减成工艺superconductor 超导体surface mount device(SMD) 表面安装器件surface mount technology(SMT) 表面安装技术surface tension 表面张力switching noise 开关噪声Tturbulent flow regome 湍流tape automated bonding(TAB) 载带自动焊tape ball grid array(TBGA) 载带焊球阵列temperature cycling 温度循环tensile strength 张应力强度terminal 引脚thermal coefficient of expansion(TCE) 热膨胀系数thermal conduction module(TCM) 热传导组件thermal conductivity 热导率thermal cycling 热循环thermal fatigue 热疲劳thermal gradient 热梯度thermal mismatch 热失配thermal network 热网络thermal resistance(/W) 热阻thermocompression bonding(T/C) 热压键合thermo gravimetric analysis(TGA) 热解重量分析法thermoplastic 热塑性thermosetting 热固性thermosonic bonding(T/C) 热声键合Thevnin equivalent 戴维宁等效thick-film 厚膜thick-film process 厚膜工艺thin-film 薄膜thin-film packaging 薄膜封装thin-film process 薄

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