ECA-535BAAA-1987.pdf

t i: 1 e i a 535baaa 87 m 3234600 0074138 3 m a a 2 ln ci) l n i a iti i may 1987 detail spec i f cat i on fixed tantalum chip capacitor style 1 protected-standard capacitance range eia-535baaa electronic industries association engineering department copyright electronic components, assemblies *01 * c r * u r ua or 0 5 ua whichever is greater. example: 1 uf 35 wvdc 25 c dcl = .o1 x 1.0 x 35 = 0.35 ua since 0;35 is less than 0.5 uf the l i m i t is 0.25 ua f o r t h i s rating. b) when measured at +85 c a t rated voltage ( u r ) the dc leakage shall not exceed 10 times the l i m i t a t 20 c. c ) when measured a t +125 c a t upper category voltage ( u c ) the dc leakage shall not exceed 12.5 t i m e s the l i m i t a t 20 c. copyright electronic components, assemblies table iii copyright electronic components, assemblies o inspection requirements: 2 . 1 procedures : 2.1.1 for qualification approval the procedures shall be in accordance with the sectional specification, iec publication 384-3 (qc300800), sub-clause 3.4. 2 . 1 . 2 for quality conformance inspection the test schedule (table iv) includes sampling, periodicity, severities and requirements.# by subclause 3.5.1 of the sectional specification. the formation of inspection lots is covered table i v notes 1 - sub-clause numbers of tests and performance requirements refer to the sectional specification, iec publication 384-13 (qc300800) and section one of this specification: 2 - inspection levels and aqls are selected from iec publication 410: sampling plans and procedures for inspection by attributes. copyright electronic components, assemblies 4 visual examination 4y4 dimensions sub-group a2 4.5.1 leakage current 4 . 5 2 capacitance 425.3 tangent of loss angle group b inspection sub-group b1 4.7 solderability 4.71.2 final d conditions or of t e s t i l aql nd (see note 1) (see note 2) - (lot-by-lot) nd s-4 2 : 5 % nd ii 1;0% protective resistance: 1000 ohms frequency: 120 hz frequency: 120 hz ( lot-by-lot ) d method 1 s-3 2.5% visual measurements examination performance requirements (see note 1) a s i n 4.4.2 legible mark- ing and as specified i n 1.5 of t h i s specification as specified i n table i of this spec. 1.3 herein within speci- fied tolerance table i i b as i n 4.7 good tinning as evidenced by free flow- ing of the solder w i t h wetting of the terminations copyright electronic components, assemblies 5 damp h e a t , cyclic, t e s t db, remaining cycles 4.11.6 final measurements sub-group c 3 2 4.12 damp heat steady state 4212.1 i n i t i a l measurement 4-12.2 final measurement d recovery: 1 t o 2 h visual examination leakage current capacitance tangent of loss angle recovery : 1 t o 2 h capacitance visual examination leakage current capacitance tangent of loss angle 6 91 n o visible damage legible mark- ing 1 : 3 herein change = 10% of value measured i n 4 :11.1 = 1:2 t i m e s i n i t i a l l i m i t n o visible damage legible marking 123 herein change = 10% of value measured i n 4.012.1 = 1.2 t i m e s i n i t i a l l i m i t copyright electronic components, assemblies .15ii1 i n i t i a l mea sureme n t 4 a s . 2 final measurement d 3 duration: 2000 h ambient temp, 85 c - applied voltage: u r recovery : 1 t o 2 h capacitance visual examination leakage current capacitance tangent of l o s s angle sub-group c3.14 d 6 4.13 characteristics the capacitors a t high and low temperature ed a t each s h a l l be measur- temperature step step 1: 20 c - leakage current i i i capacitance tangent of l o s s angle - 41 15 1 n o v i s i b l e damage legible marking = 2 t i m e s i n i t i a l l i m i t change = 10% of value measured i n 4:15.1 = 1.25 times i n i t i a l l i m i t for u s e as reference value copyright electronic components, assemblies & materials association provided by ihs under license with eca licensee=ihs employees/1111111001, user=wing, bernie not for resale, 03/30/2007 00:23:28 mdtno reproduction or networking permitted without license from ihs -,-,- e i a 535baaa 87 m 3234600 0074354 i m d conditions clause number and or of t e s t t e s t (see note 1) nd (see note i) step 2: a t -55 capacitance eea-535baaa qc300801/uso001 page 13 sample size q criterion acceptability requirements (see note 3) (see note 1) of performance nn c tangent of loss angle step 3: 20 c leakage current capacitance tangent of loss angle ste? 4: 85 c leakage current capacitance tangent of loss angle step 5: 125 c leakage current capacitance tangent of loss angle table i i b 1.3 herein change = +,-5% of value measured i n step 1 table i i b 1.3 herein table i i b table i i b 1.3 herein table i i b table i i b copyright electronic components, assemblies & materials association provided by ihs under license with eca licensee=ihs employees/1111111001, user=wing, bernie not for resale, 03/30/2007 00:23:28 mdtno reproduction or networking permitted without license from ihs -,-,- e i a 535baaa 87 3234600 0074355 3 = ei a-5 3 5 b m qc3008ol-usooo1 page 14 clause number and t e s t (see note 1) sub-group c3.5a 4.15.1 i n i t i a l 4-14 surge measurement 4.15.2 final mea sur ement sub-grow c3 .35b 4.16 reverse voltage sample size & criterion d conditions of or of t e s t acceptability ijd (see note 1) (see note 3) pn c - step 6: 20 c leakage current capacitance tangent of loss angle - 12 6 1 d capacitance number of cycles: 1000 temp: 85 c v o l tage : table iii protect ive resistor: 33 ohms + , 5 % duration of change: 30 s duration of discharge: 5 min 30 s leakage current capacitance tangent of loss angle n o t applicable a performance requirements (see note i) as i n step 3 1.3 herein change = 10% of value measured i