5s 6s管理_6s黑带培训教材英文

ProcessCapabilityAnalysis,(MeasurePhase),ScopeofModule,ProcessVariationProcessCapabilitySpecification,ProcessandControlLimitsProcessPotentialvsProcessPerformanceShort-TermvsLong-TermProcessCapabilityProcessCapabilityforNon-NormalDataCycle-Time(ExponentialDistribution)RejectRate(BinomialDistribution)DefectRate(PoissonDistribution),ProcessVariation,ProcessVariationistheinevitabledifferencesamongindividualmeasurementsorunitsproducedbyaprocess.SourcesofVariationwithinunit(positionalvariation)betweenunits(unit-unitvariation)betweenlots(lot-lotvariation)betweenlines(line-linevariation)acrosstime(time-timevariation)measurementerror(repeatability=1,),Exponential(x;),Example4,Acustomerservicemanagerwantstodeterminetheprocesscapabilityforhisdepartment.Aprimaryperformanceindexisthetimetakentocloseacustomercomplaint.Thegoalforthisindexistocloseacomplaintwithinonecalendarweek.Performanceoverthelast400complaintswasreviewed.,Example4,StatQualityToolsCapabilityAnalysis(Weibull),Example4,Example4A,StatQualityToolsCapabilitySixpack(Weibull),Example4A,ProcessCapabilityforRejectRate,ForaNormalDistribution,theproportionofpartsproducedbeyondaspecificationlimitis,RejectRate,ProcessCapabilityforRejectRate,Thus,foreveryrejectratethereisanaccompanyingZ-Score,whereRecallthatHence,ProcessCapabilityforRejectRate,EstimationofPpkforRejectRateDeterminethelong-termrejectrate(p)Determinetheinversecumulativeprobabilityforp,usingCalcProbabilityDistributionNormalZ-ScoreisthemagnitudeofthereturnedvaluePpkisone-thirdoftheZ-Score,Example5,Asalesmanagerplanstoassesstheprocesscapabilityofhistelephonesalesdepartmentshandlingofincomingcalls.Thefollowingdatawascollectedoveraperiodof20days:numberofincomingcallsperdaynumberofunansweredcallsperdays,Example5,StatQualityToolsCapabilityAnalysis(Binomial),Example5,ProcessCapabilityforDefectRate,Otherapplications,approximatingaPoissonDistribution:errorratesparticlecountchemicalconcentration,ProcessCapabilityforDefectRate,EstimationofYtpforDefectRateDefinesizeofaninspectionunitDeterminethelong-termdefectsperunit(DPU)DPU=TotalDefectsTotalUnitsDeterminethethroughputyield(Ytp)Ytp=expDPU,ProcessCapabilityforDefectRate,EstimationofSigma-CapabilityforDefectRateDeterminetheopportunitiesperunitDeterminethelong-termdefectsperopportunity(d)d=defectsperunitopportunitiesperunitDeterminetheinversecumulativeprobabilityford,usingCalcProbabilityDistributionNormalZ-ScoreisthemagnitudeofthereturnedvalueSigma-Capability=Z-Score+1.5,Example6,Theprocessmanagerforawiremanufacturerisconcernedabouttheeffectivenessofthewireinsulationprocess.Randomlengthsofelectricalwiringaretakenandtestedforweakspotsintheirinsulationbymeansofatestvoltage.Thenumberofweakspotsandthelengthofeachpieceofwirearerecorded.,Example6,StatQualityToolsCapabilityAnalysis(Poisson),Example6,DefectsperUnit=0.0265194ThroughputYield=expDPU=exp0.0265194=0.9738c.f.First-TimeYield=2/100=0.02,Example6,Define1InspectionUnit=125unitlengthofwirei.e.Units=Length125,Example6A,StatQualityToolsCapabilityAnalysis(Poisson),Example6A,DefectsperUnit=3.31493ThroughputYield=expDPU=exp3.31493=0.0363c.f.First-TimeYield=2/100=0.02,Example6B,DefectsperUnit=3.31493OpportunitiesperUnit=1DefectsperOpportunity=3.31493Z-Score=?,Example6B,1inspectionunit=1unit