透射电子显微学常用缩写词.doc

ACF absorption correction factorA/D analog to digital (converter)ADF annular dark fieldAEM analytical electron microscope/microscopyAES Auger electron spectrometer/spectroscopyAFF aberration-free focusALCHEMI atom location by channeling-enhanced microanalysisAPB anti-phase domain boundaryATW atmospheric thin windowBF bright fieldBFP back focal planeBSE backscattered electronBSED backscattered-electron diffractionBZB Brillouin-zone boundaryC(1,2,etc.)condenser (l, 2, etc.) lensCB coherent bremsstrahlungCBED convergent-beam electron diffractionCBIM convergent-beam imagingCCD charge-coupled deviceCCF cross-correlation functionCCM charge-collection microscopyCDF centered dark fieldCF coherent Fennel/FoucaultCFEG cold field-emission gunCL CathodeoluminescenceCRT cathode-ray tubeCS crystallographic shearCSL coincident-site latticeDF dark fieldDOS density of states DP diffraction patternDQE detection of quantum efficiencyDSTEM dedicated scanning transmission electron microscopyDTSA desktop spectrum analyzerEBIC electron beam-induced current/conductivityEELS electron energy-loss spectrometryEFI energy-filtered imagingELNES energy-loss near-edge structureELP energy-loss program (Gatan)EMMA electron microscope microanalyzerEMS electron microscopy image simulationEPMA electron probe microanalyzerESCA electron spectroscopy for chemical analysisESI electron spectroscopic imagingEXAFS extended X-ray absorption fine structureEXELFS extended energy-loss fine structureFCF fluorescence correction factorFEG field-emission gunFET field-effect transistorFFT fast Fourier transformFOLZ first-order Laue zoneFSE fast secondary electronFTP file transfer protocolFWHM full width at half maximumFWTM full width at tenth maximumGB grain boundaryGCS generalized cross sectionGIF Gatan image filterGOS generaled oscillator strengthHAADF high-angle annular dark fieldHOLZ higher-order Laue zoneHPGe high-purity germaniumHRTEM high-resolution transmission electron microscope/microscopyHV high vacuumHVEM high voltage electron microscope/microscopyIDB inversion domain boundaryIEEE International Electronics and Electrical EngineeringIG intrinsic GeIVEM intermediate voltage electron microscope/microscopyK-M Kossel-M?llenstedtLEED low-energy electron diffractionLLS linear least-squaresLUT look-up tableMC minimum contrastMCA multichannel analyzerMDM minimum detectable massMLS multiple least-squaresMMF minimum mass fractionMSDS material safety data sheetsNCEMSS National Center for Electron Microscopy simulation systemNIH National Institutes of HealthNIST National Institute of Standards and TechnologyOR orientation relationshipOTEDP oblique-textured electron diffraction patternPB phase boundaryP/B peak-to-background ratioPEELS parallel electron energy-loss spectrometer/spectroscopyPIMS Precision Ion-Milling SystemPIPS Precision Ion-Polishing SystemPM photomultiplierPOA phase-object approximationQHRTEM quantitative high-resolution transmission electron microsc.RB translation boundary (yes, it does!)RCP rocking-beam channeling patternsRDF radial distribution functionREM reflection electron microscope/microscopyRHEED reflection high-energy electron diffractionRHF relativistic Hartree-FockRHFS relativistic Hartree-Fock-SlaterSAD selected-area diffractionSE secondary electronSEELS serial electron energy-loss spectrometer/spectrometrySEM scanning electron microscope/microscopySF stacking faultSHRLI simulated high-resolution lattice imagesSIMS secondary ion mass spectrometryS/N signal-to-noise ratioSOLZ second-order Laue zoneSRM standard reference materialSTEM scanning transmission electron microscope/microscopySTM scanning tunneling microscope/microscopyTB twin boundaryTEM transmission electron microscope/microscopyTMBA too many bloody acronymsUHV ultrahigh vacuumUTW ultra thin windowV/F voltage to frequency (converter)VLM visible-light microscope/microscopyWB weak beamWBDF weak-beam dark fieldWDS wavelength-dispersiveWP whole patternWPOA weak-phase object approximationWWW World Wide WebXANES X-ray absorption near-edge struc