奈米材料结构分析-南台科技大学.doc

南台科技大學95學年度第二學期課程資訊課程名稱奈米材料結構分析課程編碼10M02801系所代碼1開課班級博研機電一甲 碩研機械一甲 碩研奈米一甲 開課教師王聖璋 學分3.0時數3上課節次地點一1 2 3 教室K214必選修選修課程概述課程主要介紹包括物顯微結構形貌觀察、物相種類確定及其定量分析、微晶及納米粉體尺寸測定、體材料及及其微區成分分析和定量測定等；同時側重介紹進行上述顯微結構分析通常所採用的各種現代儀器的主要功能特性及其分析方法，其中包括X射線衍射儀(XRD)、TEM, SPM等儀器的原理課程目標材料顯微結構分析是材料科學中最為重要的研究方法之一。準確、快捷的分析結果為材料的製備工藝、材料性能微結構表徵研究及其材料顯微結構設計提供可靠的實驗和理論依據。課程大綱1. Introduction-What is the nanotechnology ?-How to characterize the nanophase materials2. Crystal Structure (I)-Basic theory of crystal3. Crystal Structure (II)-Reciprocal lattice4. Crystal Structure (III)-Stereographic projection5. X-Ray Characterization (I)-Histroy of X-ray-Characterization of X-Ray-Braggs law 6. X-Ray Characterization (II)-Diffraction7. X-Ray Characterization (III)-Identification procedure8.TEM (I)- basic theory9. TEM (II) -Bright field image-Dark field image- Diffraction Pattern-HRTEM10. TEM (III)-TEM sample preparation-Practical operation of TEM11.SEM -A Guide to Scanning Microscope Observation-EDS analysis in SEM12.SPM13. AFM英文大綱1. Introduction-What is the nanotechnology ?-How to characterize the nanophase materials2. Crystal Structure (I)-Basic theory of crystal3. Crystal Structure (II)-Reciprocal lattice4. Crystal Structure (III)-Stereographic projection5. X-Ray Characterization (I)-Histroy of X-ray-Characterization of X-Ray-Braggs law 6. X-Ray Characterization (II)-Diffraction7. X-Ray Characterization (III)-Identification procedure8.TEM (I)- basic theory9. TEM (II) -Bright field image-Dark field image- Diffraction Pattern-HRTEM10. TEM (III)-TEM sample preparation-Practical operation of TEM11.SEM -A Guide to Scanning Microscope Observation-EDS analysis in SEM12.SPM13.