便捷式矿石分析仪工作原理-调整.doc

便捷式矿石分析仪工作原理Describtions货名：便捷式矿石分析仪Innov-X Explorer Portable XRF analyzerBrand品牌：Innov-XItem型号：DP6000 Original manufacturer产地：美国USA功能：通过探测矿石中元素被激发的X射线荧光，可对矿石中的元素进行定性分析和定量分析用途：可分析从镁矿(Mg)到钚矿(Pu)之间的所有83种自然矿石工作原理：便捷式矿石分析仪主要由X射线管和能量探测器构成。X射线管产生入射X射线照射在矿石表面，矿石中的元素受入射X射线的激发后会放射出X射线荧光，而且不同的元素所放射出的X射线荧光能量是不同的，具有特征性。能量探测器可以测量这些放射出来的X射线荧光的能量及数量，仪器软件通过将能量探测器所收集到的信息计算得出样品中元素的种类及其含量。Function and Working principle Descriptions XRF Spectrometry is used to identify elements in a substance and quantify the amount of those elements present. An element is identified by its characteristic X-ray emission wavelength () or energy (E). The amount of an element present is quantified by measuring the intensity of its characteristic line. XRF Spectrometry ultimately determines the elemental composition of a material.All atoms have a fixed number of electrons (negatively charged particles) arranged in orbitals around the nucleus. The number of electrons in a given atom is equal to the number of protons (positively charged particles) in the nucleus; and, the number of protons is indicated by the Atomic Number in the Periodic Table of Elements. Each Atomic Number is assigned an elemental name, such as Iron (Fe), with Atomic Number 26. Energy Dispersive (ED) XRF and Wavelength Dispersive (WD) XRF Spectrometry typically utilize activity in the first three electron orbitals, the K, L, and M lines, where K is closest to the nucleus. Each electron orbital corresponds to a specific and different energy level for a given element.In XRF Spectrometry, high-energy primary X-ray photons are emitted from a source (X-ray tube) and strike the sample. The primary photons from the X-ray tube have enough energy to knock electrons out of the innermost, K or L, orbitals. When this occurs, the atoms become ions, which are unstable. Electrons seek stability; therefore, an electron from an outer orbital, L or M, will move into the newly vacant space at the inner orbital. As the electron from the outer orbital moves into the inner orbital space, it emits an energy known as a secondary X-ray photon. This phenomenon is called fluorescence. The secondary X-ray produced is characteristic of a specific element.The energy (E) of the emitted fluorescent X-ray photon is determined by the difference in energies between the initial and final orbitals of the individual transition.This is described by the formula E=hc/ where h is Plancks constant;c is the velocity of light; and is the characteristic wavelength of the photon. Wavelengths are inversely proportional to the energies; they are characteristic for each element.For example the K energy for Iron (Fe) is about 6.4keV.The number of element-specific characteristic X-rays produced in a sample over a given period of time, or the intensity, can be measured to determine the quantity of a given element in a