MIL-STD-1916抽样计画表.docx

TABLE I. Code letter (CL) for entry into the sampling tables 表I 樣本代字(CL)抽樣對照表Lot or productionInterval size批量 Verification levels 查證水準 (VL)VII VI V IV III II I 2-170 171-288 289-544 A A A A A A A A A A A A A A A A A B A B C 545-960 961-1632 1633-3072 A A A A A A A A B A B C B C D C D E D E E 3073-5440 5441-9216 9217-17408 A B C B C D C D E D E E E E E E E E E E E17409-30720 30721 and larger D E E E E E E E E E E E E ETABLE II Attributes sampling plans 表II 計數值抽樣計畫CodeLetter Verification levels 查證水準 (VL)T加嚴 VII VI V IV III II IR減量樣本代字 A B C D E Sample size (na) 樣本大小 3072 4096 5120 6144 8192 1280 1536 2048 2560 3072 512 640 768 1024 1280 192 256 320 384 512 80 96 128 160 192 32 40 48 64 80 12 16 20 24 32 5 6 8 10 12 3 3 3 4 5NOTES:備考(1) When the lot size is less than or equal to the sample size, 100 percent attributes inspection is required.(1)當批量小於或等於樣本數，實施100%計數檢驗是必須的。(2) One Verification level (VL) to the left/right of the specified normal VL is the respective tightened/reduced plan. Tightened inspection of VL-VII is T, reduced inspection of VL-I is R. (2)查證水準(VL)正常檢驗左右欄分別為加嚴與減量檢驗計畫，VL-VII正常檢驗之加嚴檢驗為左邊T欄，VL-I減量檢驗則為右邊之R欄。 TABLE III Variables sampling plans 表III 計量值抽樣計畫CodeLetter Verification levels 查證水準 (VL)T加嚴 VII VI V IV III II IR減量樣本代字 A B C D E Sample size (nv) 樣本大小 113 122 129 136 145 87 92 100 107 113 64 69 74 81 87 44 49 54 58 64 29 32 37 41 44 18 20 23 26 29 9 11 13 15 18 4 5 7 8 9 2 2 2 3 4樣本代字 A B C D E k values (one- or two-side) k值(單邊或雙邊) 3.51 3.58 3.64 3.69 3.76 3.27 3.32 3.40 3.46 3.51 3.00 3.07 3.12 3.21 3.27 2.69 2.79 2.86 2.91 3.00 2.40 2.46 2.56 2.63 2.69 2.05 2.14 2.21 2.32 2.40 1.64 1.77 1.86 1.93 2.05 1.21 1.33 1.45 1.56 1.64 1.20 1.20 1.20 1.20 1.21樣本代字 A B C D E F values (two-side) F值(雙邊) .136 .134 .132 .130 .128 .145 .143 .140 .138 .136 .157 .154 .152 .148 .145 .174 .168 .165 .162 .157 .193 .188 .182 .177 .174 .222 .214 .208 .199 .193 .271 .253 .242 .233 .222 .370 .333 .301 .283 .271 .707 .707 .707 .435 .370NOTES:備考(1) When the lot size is less than or equal to the sample size, 100 percent attributes inspection is required. (1)當批量小於或等於樣本數，實施100%計數檢驗是必須的。(2) One Verification level (VL) to the left/right of the specified normal VL is the respective tightened/reduced plan. Tightened inspection of VL-VII is T, reduced inspection of VL-I is R. (2)查證水準(VL)正常檢驗左右欄分別為加嚴與減量檢驗計畫，VL-VII正常檢驗之加嚴檢驗為左邊T欄，VL-I減量檢驗則為右邊之R欄。 TABLE IV Continuous sampling plans表IV 連續抽樣計畫CodeLetter Verification levels 查證水準 (VL)T加嚴 VII VI V IV III II IR減量樣本代字 A B C D E Screening phase: clearance number (i) 篩選階段：篩選數量(i) 3867 7061113371682726912 2207 3402 5609 841111868 1134 1754 2524 3957 5709 527 842 1237 1714 2605 264 372 572 815 1101 125 180 246 368 513 55 83 116 155 228 27 36 53 73 96 NA NA NA NA NA樣本代字 A B C D E Sampling phase: frequencies (f) 抽樣階段：頻率(f) 1/3 4/17 1/6 2/17 1/12 4/17 1/6 2/17 1/12 1/17 1/6 2/17 1/12 1/17 1/24 2/17 1/12 1/17 1/24 1/34 1/12 1/17 1/24 1/34 1/48 1/17 1/24 1/34 1/48 1/68 1/24 1/34 1/48 1/68 1/96 1/34 1/48 1/68 1/96 1/136 1/48 1/68 1/96 1/136 1/192 NOTES:備考：(1) Use of other i and f combinations are permitted provided they are computed in accordance with Appendix, paragraph 30.5. (1)本標準允許使用其他的篩選數量(i)與抽樣頻率(f)組合，該組合依照附件第30.5節裁減修改條件加以計算。(2) During the screening phase, one Verification level (VL) to the left of the specified normal VL is the tightened plan. Tightened inspection of VL-VII is T. There is no reduced plan while in the screening phase. During the sampling phase, one Verification level (VL) to the left/right of the specified normal VL is the respective tightened/reduced plan. Tightened inspection of VL-VII is T, reduced inspection of VL-I is R. (2)在篩選階段正常檢驗查證水準(VL)左邊之隔欄為加嚴檢驗樣本大小，查證水準VL-VII之加嚴檢驗為T欄。另在篩選階段並無減量檢驗。 在抽樣階段正常檢驗查證水準(VL)左邊之隔欄為加嚴檢驗抽樣頻率；減量檢驗抽樣頻率則為右邊之隔欄。查證水準VL-VII之加嚴檢驗為T欄；查證水準VL-I之減量檢驗為R欄。(3) Sample units shall be chosen with frequency (f) so as to give each unit of product an equal chance of being inspected. The inspector shou