OPT-C200规格书英文版.doc

OPT-C200Product SpecificationShanghai Optech Science and Technology Co.LTDCatalogue 1.Product configuration- 3 -2.Sample specification- 4 -3.Equipment support requirements- 5 -4.The warranty for the equipment- 6 -5.Service- 6 -6.Training- 7 -7.Documents attached- 7 -OPT-C200 is a product of Shanghai Optech Science and Technology Co.LTD by applying electroluminescent principle for the detection of internal defects in solar cells. This equipment gives the opportunity to analysis the EL image to control the choice of material better and to detect the problems coming from the process of production of solar cell, It is a necessary equipment for solar cell chips and components manufacturers.OPT-C200 test sample is solar cell chips, the chip must be faced up to be stacked in the test box during the process. 1.Product configurationSubsystemconfiguration The loading system- Using two robots during sample mounting process,every sample mounting box can load five hundreds solar cell chips.- There are six sample taking boxes in the finishing module,defect types and defect priority can be defined by user, every catching box can load two hundreds solar cell chips- A variety of cell types test match 125125 156156 (gate 2, 3 grid, other)The standard configuration Catching system- A group of six catching boxesOptionalImaging system- Using high resolution, high sensitivity, near infrared camera - Use SONY chips- Maintain Room temperature 30 by refrigeration - Exposure time 1-10s adjustable - Resolution:1.4MThe standard configuration Human machine interface - Testing mode:it can monitor and count chips during normal producing- Debugging mode:it can monitor every signal and debug robot by itselfThe standard configuration The electric power supply- Adopting dc regulated power supply - DC30V / 10A The standard configuration Image display and analysis- Set up parameter about catching box（defect name、loading warning、decreasing distance for every time）- Toolbox for automatic recognition of defects: Provide information data for different type of defects.- Setup for selective mode: Manual,semi-auto, automatic - Image processing: gain, gray scale, shear, rotate - Search: bar code query, query the date - Other: user-defined The standard configuration The Windows XP operating system The standard configuration size （mm）weight （KG）Test case3100*1200*170015002.Sample specificationEL picture Defects Crack Black cone Black border Broken linesOther performance Content Note productivity（p/h）16001800Sample size (mm)125 125 / 156 156Of monocrystalline/polycrystalline silicon solar cell Breakage rate 0.05%3.Equipment support requirementsRequirements Specifications Space total size （mm）3100*1200*1700power requirements AC220V 15AAir supply requirements 0.60.8MPaNetwork Optional Equipment working environment +15+40( temperature )1075(humidity )Equipment placed environment +5+40(temperature ) 585(humidity )4.The warranty for the equipment - Start time: after the equipment acceptance - Warranty time: one year Note: one year warranty period refer to problems occurred not due to artificial reason and not due to the non-controllable accident (such as earthquake, fire) firmware damage. 5.Service - On-site installation and debugging equipment - Standard installation time: 5 days x 8 hours work time - Phone support: 7 days 24 hours - On-site support (working days) : reach the site within 24 hours (depending on the specific situation) - On-site support (day off), arrived at the scene within 48 hours (depending on the specific situation) - Warranty: in accordance with company standards for service 6.Training - Equipment usage - Fault handling - Equipment maintenance 7.Documents attached u Users manual,including: - Operation process - Ma