是德科技材料测试XX 是德科技

是德科技材料测试是德科技材料测试XXXX 是德科技是德科技 Application Engineer Keysight Technologies2019 09Sun Chengzhi2Industry Application ProductsElectronicsCapacitors substrates PCB antennas ferrites absorbers SAR phantommaterialsAerospace Defense Stealth RAM radiation absorbingmaterials radomesIndustrial MaterialsCeramics pos ites A D andautomotive ponents coatingsPolymers plastics Fibers films Insulation materialsHydrogel Disposable diaper soft contactlens Liquidcrystal Displays Otherproducts containingthese materials Tires paint adhesives etc Food Agriculture Foodpreservation spoilage research food developmentfor microwave packaging moisture measurementsMiningMoisturemeasurements inwood orpaper oil contentanalysis Pharmaceutical MedicalDrug researchand manufacturing bio implants human tissuecharacterization biomass fermentation3 0r rj 0r r rj Interaction ofa materialin thepresence ofan externalmagic fieldPermittivity Dielectric Constant Permeabilitym Hx 10470 m Fx 1036190 Interaction ofa materialin thepresence ofan externalelectric field4 r rrj rrrj Electric MagicPermittivityPermeabilityFieldsFieldsSTORAGELOSSMUTSTOR AGELOSS5Df tanrr Cycle perStored EnergyCycleper LostEnergyQD 1tan Dissipation FactorD QualityFactor Qr r r 8 0001 001 01 11 00001125102050100Wood0 10 20 IceA lcoholSteakWaterSaltMylarAirTeflonQuartzAluminaTiO Water2PC BoardLowLoss Lossy r tanr r 9InstrumentMaterial FixtureSoftware10Measurement FixtureSparameters M U T Network AnalyzerBest formicrowave frequencies11The material is stimulatedwith anAC sourceand theactual voltageacross the materialismonitored Material testparameters arederived byknowing thedimensions of thematerialand bymeasuring itscapacitance anddissipation factorImpedanceAnalyzer LCR meterBest for RFfrequencies12Transmission LineResonantCavityFree SpaceCoaxialProbeParallel Plate Capacitance Inductance16451B 53A16454AASTM2520SPDR13N 1501AExxFrequencyMaterial typesLiquid1GHz20GHz50GHz100GHz10GHz1MHz1kHz DCSolidSemi solids Powder GelSubstrateN1500A MaterialsMeasurement SuiteDielectrictest fixtureLiquidtest fixtureMagicmaterial testfixture16451B16453AToroidal core16454A10GHz SplitCylinder ResonatorSplitpost dielectricresonators SPDR N1501A Dielectricprobe16452A1 1THzna support keysight materials N 1501AMCA WxxSOFTWARE HARDWARE ACCURATE RESULTS14The measured data fromthe instrumentis notalways presentedin themost convenientterminology orformat In thiscase software isrequired toconvert themeasureddatato permittivityor permeability Software mayalso berequired tomodel anyinteraction betweenthe fixtureand MUTto allowthe extractionof thebulk materialproperties Software16Host PEWE4990 E4991E4980X ALPNAP937XAP50XXAENAFieldFox M9485A17 材料应用的频率 r和 r期望值 测量精度要求 材料特性 i e homogeneous isotropic 材料存在形式 i e liquid powder solid sheet 样品尺寸 接触或者不接触 温度IT DEPENDS ON20LiquidSolidCp GEquivalentCircuitThickness tElectrodes Area A Permittivity EvaluationCo Air Capacitance 000CGjCCC jCj GYpp 00 CGjCCpr tan 00r rprAGtAC t 21RF Solution 1MHz to1GHz Permittivity EvaluationLF HF Solution 20Hz to30MHz 平板电容法16451B16451BE4990AE4991B withoption00216453A2216451B FeaturesLF HF Precise measurements are possiblein thefrequency rangeup to30MHz Guard electrodeto eliminatethe effectoftheedge capacitance Attachment simplifiesOPEN andSHORT pensation Four electrodesare preparedto aommodatethe contactingand non contacting electrodemethods andvarious sizesof MUT It can be usedwith anyImpedance measuringinstrument thathas a4 terminal pairconfiguration 16451BE4990APermittivity Evaluation23Applicable MUTDimensions andCorresponding Electrodes 38mmA 5mmBlarge thin filmCsmall thin filmDElectrode TypeMaterialDiameter MaterialThickness ElectrodeDiameterA40mm 56mm t 10mm38mmB10mm 56mm t 10mm5mm diameter ofapplied thinfilm electrodes16451B DIELECTRICMATERIAL SOLUTIONPermittivity EvaluationElectrode TypeMaterialDiameter MaterialThickness ElectrodeDiameter C56mm t 10mm5 50mmD20mm 56mm t 10mm5 14mmLF HF24GUARD ELECTRODETECHNIQUELines of Electric FieldLinesofElectricFieldEdge capacitanceGuard Permittivity Evaluation2816453A Features Wide frequency range from1MHz to1GHz High measurementauracy of r andtan with OPEN SHORT LOAD calibration E4991B Option002 material measurementsoftware provides directread outof plexpermittivityRF16453AE4991B16453A r tan PermittivityE valuation29Upper electrodefits intoflat sheetmaterial Easy touse Adjustment FreeElectrode16453A16453A DIELECTRICMATERIAL TESTFIXTUREMUTUpper ElectrodeLowerElectrodespringPermittivity EvaluationRFtddtd 15mm0 3mm t 3mmApplicable MUTDimensions30InexpensiveWorks wellfor thinsheets PC boards films etc Frequency limited to1GHzSample shouldbe flat smooth sheetAurate Bestforlow frequenciesRelativelysimple putationof r31Toroidal Core MUT Permeability Evaluation32 Wide frequencyrange from1kHz to1GHz withhigh r tan auracy Extend Calplane withextension cablefor temperaturetest Simple measurementswithout theneed towind awire aroundthe toroid Temperature characteristicsmeasurementsarepossible from 55 C to 150 C Key FeaturesINDUCTANCEMETHODE4990A SolutionE4990A 42942A 16454A 1KHz to120MHz E4991B SolutionE4991B withopt 002 16454A 1MHz to1GHz 16454AcbhNo magicflux leakage 02 ln 1 r RelativepermeabilityZ mMeasured impedancewith MUTZsm Measuredimpedance withoutMUTh Heightof MUT Material UnderTest c Outerdiameter ofMUTb Innerdiameter ofMUT33 Applicable MUTDimensions 16454A MAGNETICMATERIAL SOLUTIONcbhSmallSize LargeSizec 8mm c 20mmb 3 1mm b 5mmh 3mm h 8 5mmPermeability Evaluation34High frequencymeasurement limited by interwinding capacitanceCanmeasure onlymaterials withwhich havelow permittivityPermeability EvaluationBroad frequencyrangein lowfrequenciesRelatively auratemeasurementEasy setupwith lowcost solution35Dielectric measurementsetup forliquid usingthe coaxialprobe method37高温探头 0 200 20GHz low end0 01GHz withimpedance analyzer Withstands 40to200degrees C Survives corrosivechemicals Flanged designallows measuringflat surfacedsolids细长探头 0 500 50GHz Low costconsumable design Fits intight spaces smaller samplesizes For liquidsand softsemi solids only高性能探头 0 500 50GHz Withstands 40to200degrees C Hermetically sealedon bothends OK forautoclave Food gradestainless steel38Three standards Air Short Water Air Short Load UserDefined DebyeCole ColeCole Davidson PermittivityData42Convenient easy touseLittle orno samplepreparationNondestructive formanymaterialsRequires samplethickness of 1cm typicalSolids musthave aflat surfaceDoes not provide rIdeal forliquids orsemisolidsBroad frequencyrange 0 2 50GHz dependingon r Limited auracyin r 5 and low loss resolution 0 05in tan Not suitedto high rlow r materials43Keysight SplitCylinder ResonatorIPC TM 650 2 5 5 5 1344 00313 01142 30321 c sscrs ssc crQQ VVfVf fV Qf sffcsQ cemptycavitysample insertedfc Resonant Frequencyof EmptyCavityfs Resonant Frequencyof FilledCavityQc Q ofEmpty CavityQs Q ofFilled CavityVs Volume ofEmpty CavityVc Volume ofSampleASTM2520S2146SPDR Split PostDielectric Resonator SPDR supplier QWED SampleDielectric ResonatorDielectricResonatorSPDR fixtureENA PNA NetworkAnalyzerwith N1500 003Measurement SoftwareSampleE5063A Key Features Superior auracyto measurelower lossmaterials Convenient andfast measurementof substrates PCB andthin films Non destructive andnon contacting measurement Just insertyour MUTinto theslit ofthe fixture Enable tomeasure multi layer PCB48Very aurate best forPCB materialsVerysensitive tolowloss to10 6for somecavities Doesnotprovide broadbandfrequency dataPrecise sample shape required forASTM usually destructive SPDR andSCR methodsare nondestructive49Network AnalyzerSampleholder connectedbetween coaxcablesCalibration isrequiredCoaxialWaveguide50Material assumptions Sample fillsfixture crosssection No airgaps atfixture walls Smooth flat faces perpendicular tolong axis HomogeneousMethod features Broadband low endlimited bypractical sample length Limited lowloss resolution depends onsamplelength Measures magicmaterials Anisotropic materialscanbemeasured inwaveguide54Algorithm MeasuredS parameters OutputNicolson Ross S11 S21 S12 S22 r and rNIST PrecisionS11 S21 S22 rFast TransmissionS21 S12 rPoly Fit1S11 S21 S12 S22 r and rPoly Fit2S12 S21 rStack TwoS21 S12 2samples r and rTRANSMISSION MODELSReflectionmodelsAlgorithm MeasuredS parameters OutputShortBacked S11 rArbitrary BackedS11 rSingle DoubleThickness S11 2samples r and rDe embedding55Provides both r and rSimple fixturesFrequencylimitedto 100MHz banded inwaveguide Precisesampleshaperequired usually destructive Adaptable to free space Broadfrequencyrange 0 1 110GHz Limited lowloss resolutionLiquidsand gasesmustbe contained56Dielectric measurementsetup forfree spacemeasurement57lReflection S11 Transmission S21 Material assumptions Flat parallel faced samples Sample innon reactive region Beam spotis containedin sample Known thickness 20 360Method features Non contacting non destructive High frequency low endlimitedbypractical samplesize Useful for high temperature Antenna polarizationmay bevaried foranisotropic materials Measures magicmaterials58 No tolerancerequirements onsample Sample iseasily thermallyisolated Fibrous insulationvirtually transparentto microwaves59Incident WaveReflectedWaveport1port2MUTS21Results indB60Keysight PNA X dualsource workanalyzerSample inholder betweentwo antennaeKeysight MaterialsMeasurement SoftwarewithFreeSpaceCalibration VirginiaDiodes Inc Transmit andReceive TR Frequency Extenders62ThruReflect