六西格玛案例R2ppt课件

1、Measure OutlineIdentify Input, Process and Output IndicatorsFishboneCE metricsCollect DataData Collection Plan and Operation DefinitionMSAMSA PlanMSA ConclusionProcess CapabilityDPPM, Cpk, Yield, Z valueID IPO IndicatorsCollect DataMSAProcess CapabilityFishbone Diagram ID IPO IndicatorsCollect DataM

2、SAProcess CapabilityDetermine the major categories (Input &/or Process Indicators) of the effect (CTQ/CTP)CTQ / CTPWhy Gap?Manpower(Generic Category)Machine(Generic Category)Material(Generic Category)Method(Generic Category)Measurement(Generic Category)Input IndicatorsProcessIndicatorsProcessIndicat

3、orsProcessIndicatorsInput IndicatorsCause & Effect Matrix ID IPO IndicatorsCollect DataMSAProcess CapabilityScale: 0=None, 1=Low, 3=Moderate, 9=StrongX4X5X6ID IPO IndicatorsCollect DataMSAProcess CapabilityOperational definition Operational definitionX20.X4X3X2X1Source of XsInput/ Process Indicator

4、(X)Sl. No.Y4Y3Y2Fishbone or CE MatrixY1Source of Ys Output Indicator (Y)Sl. No.Remarks:While writing operational definition keep in mind the data to be collected for each Y & X. Data Collection Plan-1 Fishbone or CE Matrix Key Indicator Operation Definition & SummaryData Collection Plan -2ID IPO Ind

5、icatorsCollect DataMSAProcess CapabilityRemarks:Other data refers to additional information from stratification perspective.Performance measure (Y)Operational definitionData source and locationSample sizeWho will collect the dataWhen will data be collectedHow will data be collectedOther data that sh

6、ould be collected at the same timeY1 客戶退貨率#退貨Qty/ /#出貨Qty品保1QA/ Andy Chenby Lot1.Customer complainX1-X15MSAProcess / Input (X)Operational definitionData source and locationSample sizeWho will collect the dataWhen will data be collectedHow will data be collectedOther data that should be collected at

7、the same timeMSA Plan (for all Ys)ID IPO IndicatorsCollect DataMSAProcess Capability外觀離散型特性Y1:污點Y2:刮傷Y3:印刷位置測試人員3 person3 person3 person測試設備目視目視目視進行方法編號130給3位進行 判定，循環2次 編號130給3位進行 判定，循環2次 編號130給3位進行 判定，循環2次 判定方法共取得180個資料, 依Gage R&R計算之數值判定 共取得180個資料, 依Gage R&R計算之數值判定 共取得180個資料, 依Gage R&R計算之數值判定 Sampl

8、ing10 good, 10 NG, 10 grey10 good, 10 NG, 10 grey10 good, 10 NG, 10 greyMesurement Methods卡尺厚薄規溫度計CCD投影機Calibration PlanGRR PlanMSA Plans (for Key Xs)ID IPO IndicatorsCollect DataMSAProcess CapabilityID IPO IndicatorsCollect DataMSAProcess Capability% ConP/TV(SV/Proc)P/SV(%SV)P/T(SV/Toler)Distinct C

9、ategoriesAcceptable 1% 10% 10% 5Maybe Accept1 9%10 30%10 30%10 30%3 - 4Not Acceptable 9% 30% 30% 30%0)1OK0.857730.1290996.6440.0000 空銲0.498270.1290993.85960.0001 站立0.944340.1290997.31480.0000 短路1.0000 0.1290997.7460.0000 錫少0.384740.1290992.98020.0014 Overall0.748070.06534911.44730.0000 2OK0.944340.1

10、290997.31480.0000 空銲0.666370.1290995.16160.0000 站立10.1290997.7460.0000 短路10.1290997.7460.0000 錫少0.551670.1290994.27320.0000 Overall0.833040.06471912.87170.0000 3OK0.90180.1290996.98530.0000 空銲0.591440.1290994.58130.0000 站立0.944340.1290997.31480.0000 短路10.1290997.7460.0000 錫少0.327310.1290992.53530.00

11、56 Overall0.769330.065211.79960.0000 Action PlanOwnerDue dateAssign SMT inspectors to attend the IPC-A-610C training course and get the certification.SMT/Ray7/ESMT inspectors must be certified by QA every 3 months to ensure their capability. SMT/RayFrom now on1. Reliability of SMT inspector need to

12、be improved.2. The detection sensitivity of solder open and solder insufficiency need to clarify and train the SMT inspectors. Remark: Agreement Analysis, 算出Kappa 值要大於90%,假设Kappa 70%, 表示 人員需求重新訓練後, 重作Attribute gauge實驗.Key Findings and Conclusion:Baseline Y1 (Continue Data)ID IPO IndicatorsCollect Da

13、taMSAProcess CapabilityCurrent Baseline Performance:Mean: 7.28 Standard Deviation: s =2.36 Distribution Shap：Too WidlyConclusion: variance is big and shift mean, both of Mean and variance need to be improvedBaseline Y2 (Discrete Data) ID IPO IndicatorsCollect DataMSAProcess CapabilityCurrent Baselin

14、e Performance: Yield Rate 80%Baseline SummaryID IPO IndicatorsCollect DataMSAProcess CapabilityBaseline Summarization (Ys)Continuous (Y)Output indicatorAverageStandard deviation CpCpkSigma Level Y1Y2Y3Discrete (Y)Output indicatorNo. of unitsNo. of opportunities per unit No. of defectsDPMOSigma Level Y1Y2Y3Baseline definitionProcess Capability Gap