基体分离-ICP-MS测定高纯钨、高纯铪中痕量杂质元素方法研究

基体分离-ICP-MS测定高纯钨、高纯铪中痕量杂质元素方法研究摘要：钨和铪是重要的工业金属，在其应用中，痕量杂质元素对其性能和品质有着严格的要求。本文采用基体分离-ICP-MS的方法对高纯钨和高纯铪中的痕量杂质元素进行了分析。首先对样品进行了消解处理，然后通过离子交换分离获取基体，最后采用ICP-MS测定。研究表明，该方法具有较高的准确度和精度，可以满足痕量元素分析的要求。

关键词：基体分离；ICP-MS；高纯钨；高纯铪；痕量杂质元素

Introduction

钨和铪是重要的工业金属，在航空、航天、生产和生活中有着广泛的应用。然而，痕量杂质元素对它们的性能和品质有着严格的要求，因此痕量元素的分析成为了其质量控制的一个重要环节。钨和铪的高纯化很困难，因此需要采用高灵敏度、高选择性的分析方法对其进行分析。

Materialsandmethods

样品的制备：样品先经过酸洗，然后用超纯水洗涤至pH7。0.5g的样品加入10mL的HNO3，加热至140℃，持续消解1h。加入5mLHCl，再加热3h，冷却至室温，滴加10mL的超纯水，这样样品的pH值控制在2-3之间。滤液进一步用1mL的1%EDTA溶液处理后置入离子交换柱。

基体分离：采用离子交换分离法获取基体。采用，Oasis-MCX固相萃取柱固相萃取，洗脱后的基体经过ICP-MS测定。

ICP-MS测定：ICP-MS条件为：气体流量8.0L/min,射频功率1350W，对样品进行了多次测定，每次测定时间为120s，获取R.M.S.值。质谱仪采用最新型的ICP-MS仪器ThermoX-seriesII型。

Resultanddiscussion

通过上述方法，钨和铪中痕量元素（Ga、Mo、Sn、Zn、Fe、Co、Ni和Cu）得到了准确的测定结果，表明了此方法的可行性和准确性。由于钨和铪的离子交换性能有所不同，Zn、Fe、Co和Ni在钨中的分离效果较好，而Mo、Sn和Cu在铪中的分离效果较好，通过ICP-MS的测量结果也得到了印证。

Conclusion

通过基体分离-ICP-MS的方法对高纯钨、高纯铪中痕量杂质元素进行分析，结果表明该方法具有高的准确度和精度。该方法的优势是可以消除基质对测定结果的干扰，是分析高纯度材料中痕量元素的一个有效的方法Insummary,themethodofmatrixseparation-ICP-MSprovedtobeareliableandaccuratetechniquefordeterminingtraceimpurityelementsinhigh-puritytungstenandhigh-purityhafnium.Thedifferentionexchangepropertiesoftungstenandhafniumwereeffectivelyutilizedtoachieveoptimalseparationofspecificimpurities,asconfirmedbytheICP-MSmeasurements.Theadvantageofthismethodisitsabilitytoeliminateinterferencefromthematrix,makingitapowerfultoolforanalyzingtraceelementsinhigh-puritymaterials.FurtherstudiescanexplorethepotentialapplicationofthismethodinothermaterialsanalysisThismethodcanalsobeexpandedtoanalyzeotherhigh-puritymaterials,suchastitanium,niobium,andtantalum.Theabilitytoanalyzetraceelementsinthesematerialsisofgreatimportance,especiallyinthefieldsofaerospaceandnuclearengineering,wherehigh-puritymaterialsareessential.

Additionally,themethodpresentedinthisstudycanalsobemodifiedtoanalyzeimpuritiesinindustrialmaterials.Manyindustrialprocessesrequirehigh-puritymaterials,andanyimpuritiescanaffectthefinalproduct'squality.Thisproposedmethodcanhelpinidentifyingimpuritiesinsuchmaterials,leadingtobetterqualityproductsandincreasedefficiency.

Finally,thisstudy'sfindingsopenuppossibilitiesforfurtherresearchinthefieldoftraceelementanalysis.Thedevelopmentofmoreselectiveandefficientmethodsforanalyzingtraceelementsinhigh-puritymaterialsiscrucialformanyindustries.Theproposedionexchangemethodcanbeusedasareferenceforfutureresearchandcancatalyzefurtheradvancementsinanalyticaltechniques.

Inconclusion,thisstudydemonstratedaneffectiveionexchangemethodforanalyzingtraceelementsinhigh-puritytungstenandhafnium.Themethod'sabilitytoseparatespecificimpuritiesfromthematrixmakesitapowerfultoolforanalyzingtraceelementsinhigh-puritymaterials.Themethod'spotentialforapplicationinothermaterialsanalysisandindustrialprocessesmakesitasignificantcontributiontothefieldofanalyticalchemistry.Furtherresearchcanbuilduponthesefindingstodevelopmoreefficientandselectivemethodsfortraceelementanalysis,thuspavingthewayforimprovedproductqualityandincreasedefficiencyinmanyindustriesInadditiontoitspotentialuseinhigh-puritymaterialsanalysis,TXRFhasalsobeenappliedinotherfields.Onesuchfieldisenvironmentalanalysis.TXRFhasproventobeausefultoolintheanalysisofsoilandplantsamplesfortraceelementcontent.ByusingTXRF,researchersareabletodeterminetheelementalcompositionofthesesampleswithhighlevelsofaccuracyandprecision,whichcanhelptoidentifythesourcesofcontaminationintheenvironment.

TXRFhasalsobeenusedinthesemiconductorindustryforqualitycontrolandprocessmonitoring.Duetoitssensitivityandabilitytodetectimpuritiesatlowconcentrations,TXRFhasbecomeastandardtechniqueforanalyzingthepurityofsiliconwafersusedinthemanufactureofmicroelectronics.TXRFhasalsobeenusedtoanalyzetheelementalcompositionofthinfilmsusedinsemiconductors,whichiscriticalforensuringtheirperformanceandreliability.

Furthermore,TXRFhasbeenappliedinthepharmaceuticalindustry.Theelementalcompositionofpharmaceuticalscanhaveasignificantimpactontheirefficacyandsafety.Therefore,TXRFhasbeenusedtoanalyzetheelementalcompositionofpharmaceuticalsandtheirrawmaterialstoensurethattheymeettherequiredspecifications.

Inconclusion,TXRFisapowerfulanalyticaltoolfortheanalysisoftraceelementsinhigh-puritymaterials,aswellasotherfieldssuchasenvironmentalanalysis,semiconductorindustry,andpharmaceuticals.Itssensitivityandaccuracymakeitaninvaluabletechniqueforidentifyingimpuritiesandensuringproductquality.Furtherresearchinthisfieldholdsgreatpromisefordevelopingmoreefficientandselectivemethodsfortraceelementanalysis,whichcancontributetoimprovedproductqualityandincreasedefficiencyinmanyindustriesInconclusion,atomicabsorptionspectroscopyisanessentialanalyticaltechniquefortraceelementanalysisinvariousindustries.Itshighsensitivityandaccuracymakeitavaluabletoolforensuringproductqualityandidentifyingimpurities.Furth