8D报告案例模板example.doc

CUSTOMER COMPLAINT - FINAL REPORT8D Report number: F040358000FQS -8DGLOBAL INFORMATION8D Close Date:February 04, 2004CUSTOMER NAME:ARRAY ELECTRONICS LTD.Customer contact:Tony ChenCustomer ref.:Customer part number:Area ref. number:NA401012ST creator:Mr Gary HUA, Field Quality Service Asia PacificST manager:(8D report creator)Mr. Bt LEE, Muar plant Quality & Reliability St ref.:F040358000FQS ST commercial product:TDA2007AST Distribution list:Mr Blancky HO, Field Quality Service Asia PacificMrs Cathy LI, Field Quality Service Asia PacificEDDY GAN, PDIP TESTMr Gary HUA, Field Quality Service Asia PacificSP LOW, QA / FAMr Austin WU, Field Quality Service Asia PacificReport approved by:Title:Date:Signature:BT LEECHIEF FA ENGINEER04 Feb 04Report prepared by: SP LOWFA ENGINEER04 Feb 04Detail informationComplaint informationCustomer date:January 19, 2004ST creation date:January 19, 2004ST evidence received date (by FAR Mgr.):January 26, 2004Quantity received by ST:12Quantity affected at Customer:Customer failure rate (ppm):Origin of the defect:ManufacturingCustomer symptom description:The end cusomer believes this part has potential risk.Customer contact:Tony ChenST complaint creatorMr Gary HUA, Field Quality Service Asia PacificST complaint manager:(8d report creator)Mr. Bt LEE, Muar plant Quality & Reliability Device informationCustomer part # :ST commercial product :TDA2007AST raw line #:BA7A*L443CAX Product family (code & description):70 AUDIO SYSTEMSPackage:7A SIL 9Wafer fab. process:OF MT/-HWafer fab.:0857 AMKF AMK 5; CFMAssembly fab.:0959 MU1A ST MUAR - MALAYSIATest plant:0959 MU1T ST MUAR - MALAYSIA8D RESULTS SYNOPSIS / PROBLEM DESCRIPTIONDominant defect description:1: EOS, ESD2: EOS - ESD3: EOS - ESD generalSample RefQty QA numberTracecode19W99CE034123W99CD0341Root Cause:Application / Electrical overstressContainment action:Implementation date:None.February 04, 2004Corrective action:Implementation date:Not ApplicableFebruary 04, 20048D REPORT DETAILS: F040358000FQS -8DST Analysis results synopsisDominant defect description:1: EOS, ESD2: EOS - ESD3: EOS - ESD generalSample RefQty QA numberTracecode19W99CE034123W99CD03411D Team8D team leader :Mr. Bt LEE, Muar plant Quality & Reliability Team members :EDDY GAN, PDIP TESTSP LOW, QA / FA2D Problem descriptionCustomer symptomSample:1Cust. symptom description: the end cusomer believes this part has potential risk.Sample:2Cust. symptom description: the end cusomer believes this part has potential risk.Symptom comments11 units were tested failed catastropy. Burnt marks due to electrical overstress were observed. 1 unit was tested good in ATE.Muar FA Findings:StepsFindingsExternal visual inspectionOnly 3 units with tracecodeW99CE0341 have unbroken leads, the other 9 units were having broken leads.Curve tracingLeakage or short at Pin 8 or Pin 9 vs ground except for unit with reference #1.X-raysNo anomalies.ATEOnly unit with reference #1 was tested good in ATE, the other 11 units were tested fail Bin #6, #27 and #28.Decapsulation-Internal visual inspectionBurnt marks were observed on die top between Pin 8 and Pin 9 rails for units with reference #4, #5, #10 and #11. Note: Units with reference #1 to #9 are from tracecode W99CE0341; units with reference #10 to #12 are from tracecode W99CD0341.Enclosure:Pin 9 of Unit Reference #10Pin 8 of Unit Reference #11Pin 9 of Unit Reference #11Pin 8 of Unit Reference #4Pin 9 of Unit Reference #4Pin 8 of Unit Reference #5Pin 9 of Unit Reference #53D Containment actionNot Applicable.4D CauseArea involvedMacro process:CUSTOMERLocation:CUSTOMERProcess step:APPLICATION (EOS)Root causeRoot cause:Application / Electrical overstressDefect intentionally reproduced:Escape root cause description:Not Applicable.Problem root cause description:Not Applicable.5D Corrective action & VerificationNot Applicable.6D Implementation of permanent corrective actionNot Applicable.7D PreventionRevised Quality System Doc.Reference & version changesDate of create-updateError of process: NOControl plan Ref.:Not applicableError of application: YESFailure Modes Effects Analysis Ref.:Not applicableSpecification Ref.:Not applicableCross-fertilization Ref.:Not applicableText - Comments :Not required since the unit was failed during the customers application.8D Information & ConclusionStatus:CompletedClose date:February 04, 2004Estimated date of parts delivery after containmentAdditional comments:None.Electrical Analysis ANALYSIS DATA AND RESULTS : Sample ref.:F040358000FQS -EA1 - 2Units ser. no:All unitsFail type:StableCorrelation with customer:noElectrical defect:1- TESTING2- DC tests3- Short.Remark:All units were tested failed catastropy in ATE.Sample ref.:F040358000FQS -EA1 - 1Units ser. no:All unitsFail type:StableCorrelation with customer:noElectrical defect:1- TESTING2- DC tests3- Short.Remark:Unit with reference #1 was teste