光伏组件PID测试.pdf

Insert picture here 10 x 17 cm T V S D Greater China T V S D Partnership adds value Potential Induced Degradation PID Service Introduction PID T V S D Content Potential Induced Degradation PID Background Introduction PID 1 Standards related to Potential Induced Degradation PID PID 3 What we inspect in Potential Induced Degradation PID 2 7 May 20122 Present ongoing test at lab 4 Q 2 Different wafer resistivity Increasing the base resistivity leads to more resistant solar cells concerning PID since lower base doping leads to a wider depletion region at the junction when the emitter doping is held constant PID 1 2 3 cell level T V S D 5 May 2009The future is brightSlide 19 Emitter sheet resistance 1 2 3 cell level Fig Emitter sheet resistance dependence of PID PID Increasing the emitter sheet resistance for cell process optimizations leads to a higher sensitivity for degradation of the solar cells and lead to a higher tendency for PID PID Higher sheet resistance and in general emitter doping is not totally constant over the whole area The emitter sheet resistance local variations can lead to higher PID sensitivity PID T V S D 5 May 2009The future is brightSlide 20 Anti reflective coating 1 Thickness Going to thinner ARC layers can be a feasible way of reducing PID Si N PID 2 Ratio of Si to N ARC layers with higher Si N ratio can be a feasible way of reducing PID 3 Homogeneity Various SiN deposition methods PID Fig AR coating RI thickness and deposition method dependence of PID PID 1 2 3 cell level PID T V S D Solutions for PID PID 5 May 2009The future is brightSlide 21 T V S D 5 May 2009The future is brightSlide 22 PID PID PID PID PID PID T V S D 5 May 2009The future is brightSlide 23 This potential degradation mechanism is not monitored by the typical PV tests listed in IEC 61215 PV IEC61215 PID T V S D PID TEST Potential Induced Degradation PID Background Introduction T V S D Content Potential Induced Degradation PID Background Introduction PID 1 Standards related to Potential Induced Degradation PID PID 3 What we inspect in Potential Induced Degradation PID 2 7 May 201224 Present ongoing test at lab 4 Q One control module Step 10 1 10 2 and 10 15 refer to IEC 61215 ed 2 Steps MST 01 and MST 13 refer to IEC 61730 2 T V S D 2 3 Samples Two representative and identical samples for each polarity of system voltage and one control sample EVA The test results relate only to the sample structure as tested 5 May 2009The future is brightSlide 27 T V S D PID EVA 5 May 2009The future is brightSlide 28 2 3 Samples T V S D If the module documentation and the nameplate specify usage of the module in strings of only one voltage polarity with respect to earth ground the number of modules selected for test shall be halved and stressed only in that specified polarity 2 1 If the PV module is provided or is specified for use with a specific means for grounding and mounting then they shall be provided and constitute a part of the test sample PV 5 May 2009The future is brightSlide 29 2 3 Samples T V S D 2 4 Marking Each module shall carry the following clear and indelible markings name monogram or symbol of manufacturer type or model number serial number polarity of terminals or leads colour coding is permissible maximum system voltage for which the module is suitable The date and place of manufacture shall be marked on the module or be traceable from the serial number 5 May 2009The future is brightSlide 30 T V S D 2 5 Pass Criteria The degradation of maximum output power between initial and final power measurement does not exceed 5 5 There is no visual evidence of a major defect as defined in IEC 61215 ed 2 Clause 7 IEC61215 2 7 The wet leakage current test requirements are met at the beginning and the end of each sequence Specific requirements of the individual test components are met 5 May 2009The future is brightSlide 31 T V S D 2 6 Test procedures 5 kWh m 2 5 5 kWh m 2 IEC 61730 2 MST 01 EL IEC 61215 IEC 61215 10 15 IEC 61730 2 MST13 5 May 2009The future is brightSlide 32 T V S D 60 C 1 C 85 2 96h IEC 60068 2 78 2 4 IEC61215 10 15 8h IEC61215 25 IEC61730 2 MST01 EL 5 May 2009The future is brightSlide 33 2 6 Test procedures T V S D 2 7 Remark Thresher 5 May 2009The future is brightSlide 34 T V S D Content Potential Induced Degradation PID Background Introduction PID 1 Standards related to Potential Induced Degradation PID PID 3 What we inspect in Potential Induced Degradation PID 2 7 May 201235 Present ongoing test at lab 4 Q A 5 T V S D Reference Standards IEC 61215 Crystalline silicon terrestrial photovoltaic PV modules Design qualification and type approval IEC 61730 2 Photovoltaic PV module safety qualification Part 2 Requirements for testing IEC 60068 2 78 Environmental testing Part 2 78 Tests Test Cab Damp heat steady state 5 May 2009The future is brightSlide 36 T V S D Content Potential Induced Degradation PID Background Introduction PID 1 Standards related to Potential Induced Degradation PID PID 3 What we inspect in Potential Induced Degradation PID 2 7 May 201237 Present ongoing test at lab 4 Q A 5 T V S D Present ongoing test at lab PID control DH 1000V 85 85 EL 48h EL Pmax 48h DH 1000V 5 May 2009The future is brightSlide 38 T V S D 5 May 2009The future is brightSlide 39 T V S D 5 May 2009The future is brightSlide 40 T V S D Content Potential Induced Degradation PID Background Introduction PID 1 Standards related to Potential Induced Degradation PID PID 3 What we inspect in Potential Induc