IC制造流程简介-文档资料

1、1IC制造流程简介ANDY2相关定义半导体是指导电能力介于导体和非导体之间的材料，其指四价硅中添加三价或五价化学元素而形成的电子元件，它有方向性可以用来制造逻辑线路使电路具有处理资讯的功能。半导体的传导率可由搀杂物的浓度来控制：搀杂物的浓度越高，半导体的电阻系数就越底。P型半导体中的多数载体是电洞。硼是P型的掺杂物。N型半导体的多数载体是电子。磷，砷，锑是N型的搀杂物。3相关定义集成电路是指把特定电路所需的各种电子元件及线路缩小并制作在大小仅及2CM平方或更小的面积上的一种电子产品。4相关定义集成电路主要种类有两种：逻辑LOGIC及记忆体MEMORY。前者主要执行逻辑的运算如电脑的微处理器后者

2、则如只读器READ ONLY 及随机处理器RANDOM ACCESS MEMORY等。集成电路的生产主要分三个阶段：硅镜片WAFER的制造，集成电路的制造及集成电路的包装PACKAGE5The Outline6製程7The Introduction to The Manufacturing Process of VLSI 8晶圓(Wafer) 晶棒成長 切片(Slicing) 研磨(Lapping) 清洗(Cleaning) 拋光(Polishing) 檢查(Inspection) 9MeltSeedGraphite CrucibleGrowing CrystalNoncontaminatin

3、g LinerThe Czochralski Method - 110(a) As-grown crystal(b) Grind crystal to remove undulations and saw to remove portions in resistive range(c) Saw into slices (with orienting flats ground before sawing) (d) Round edges of slice by grinding(e) Polish sliceCrystal to Wafe11微影(Photolithography)原理：在晶片表

4、面上覆上一層感光材料，來自光源的平行光透過光罩的圖形，使得晶片表面的感光材料進行選擇性的感光。 感光材料：正片經過顯影(Development)，材料所獲得的圖案與光罩上相同稱為正片。負片如果彼此成互補的關係稱負片12WaferWaferContact Printto expose resistWaferResistApply resist after priming(spinner)ResistOxideLight sourceProjection printto expose resistorWaferResistOxideProjection lensMaskCondenser lens

5、Next PagePhotolithography Process - 1Mask13ContinueWaferWaferWaferDevelop resistEtch oxideStrip resistDeveloped resist showing patternEtch to match resist patternResist removedPhotolithography Process - 214Doping: To get the extrinsic semiconductor by adding donors or acceptors, which may cause the

6、impurity energy level. The action that adding particular impurities into the semiconductor is called “doping” and the impurity that added is called the “dopant”. Introduction to DopingDoping methods: 1.Diffusion 2.Ion Implantation15Pre-deposition: To put the impurities on the wafer surface.Generally

7、 used dopant resource furnace design: Carrier gasHeaterQuartz tubeSolid dopant source furnaceO2Liquid dopant sourceCarrier gasGas dopant sourceValveO2(a)(c)(b)Diffusion Process - 1Solid dopant source 16Drive-in: To implant the dopant into the wafer by the thermal processQuartz tubeQuartz tubeHeaterW

8、aferGas outReaction roomGas inGas outWaferQuartz boats3-Zone heating element Dopants and gas inProfiling Tc(In the tube)Horizontal TypeDiffusion Precess - 2171. The definition: A manufacturing process that can uniformly implants the ions into the wafer in the specified depth and consistence by selec

9、ting and accelerating ions. 2. The purpose: To change the resistance value of the semiconductor by implanting the dopant.3. Energy range (8 years ago)(1) General process：10 KeV - 180 KeV (0.35m) (100KeV for 0.18 m now)(2) Advanced process：10 KeV - 3 MeV ( 100 C/s Uniform Temperature Changing Low Thermal Budget (to compare with Furnace) To A