6Sigma六西格玛精益生产持续改善分析管理常用工具资料 六西格玛案例R2_Measure_v2008a

1、MeasureOutlineIdentify Input, Process and Output IndicatorsFishboneCE metricsCollect DataData Collection Plan and Operation DefinitionMSAMSA PlanMSA ConclusionProcess CapabilityDPPM, Cpk, Yield, Z valueID IPO IndicatorsCollect DataMSAProcessCapabilityFishbone DiagramID IPO IndicatorsCollect DataMSAP

2、rocessCapabilityDetermine the major categories (Input &/or Process Indicators) of the effect (CTQ/CTP)CTQ / CTPWhy Gap?Manpower(Generic Category)Machine(Generic Category)Material(Generic Category)Method(Generic Category)Measurement(Generic Category)Input IndicatorsProcessIndicatorsProcessIndicatorsP

3、rocessIndicatorsInput IndicatorsCause & Effect MatrixID IPO IndicatorsCollect DataMSAProcessCapabilityScale: 0=None, 1=Low, 3=Moderate, 9=StrongX4X5X6ID IPO IndicatorsCollect DataMSAProcessCapabilityOperational definitionOperational definitionX20.X4X3X2X1Source of XsInput/ Process Indicator (X)Sl. N

4、o.Y4Y3Y2Fishbone or CE MatrixY1Source of YsOutput Indicator (Y)Sl. No.Remarks:While writing operational definition keep in mind the data to be collected for each Y & X.Data Collection Plan-1Fishbone or CE Matrix Key Indicator Operation Definition & SummaryData Collection Plan -2ID IPO IndicatorsColl

5、ect DataMSAProcessCapabilityRemarks:Other data refers to additional information from stratification perspective.Performance measure (Y)Operational definitionData source and locationSamplesizeWho willcollect the dataWhen will data be collectedHow will data be collectedOther data that should be collec

6、ted at the same timeY1 客户退货率#退货Qty/ /#出货Qty品保1QA/ Andy Chenby Lot1.Customer complainX1-X15MSAProcess / Input (X)Operational definitionData source and locationSamplesizeWho willcollect the dataWhen will data be collectedHow will data be collectedOther data that should be collected at the same timeMSA

7、 Plan (for all Ys)ID IPO IndicatorsCollect DataMSAProcessCapability外观离散型特性Y1:污点Y2:刮伤Y3:印刷位置测试人员3 person3 person3 person测试设备目视目视目视进行方法编号130给3位进行 判定，循环2次编号130给3位进行 判定，循环2次编号130给3位进行 判定，循环2次判定方法共取得180个资料, 依Gage R&R计算之数值判定共取得180个资料, 依Gage R&R计算之数值判定共取得180个资料, 依Gage R&R计算之数值判定Sampling10 good, 10 NG, 10 g

8、rey10 good, 10 NG, 10 grey10 good, 10 NG, 10 greyMesurement Methods卡尺厚薄规温度计CCD投影机Calibration PlanGRR PlanMSA Plans (for Key Xs)ID IPO IndicatorsCollect DataMSAProcessCapabilityID IPO IndicatorsCollect DataMSAProcessCapability% ConP/TV(SV/Proc)P/SV(%SV)P/T(SV/Toler)Distinct CategoriesAcceptable 1% 10

9、% 10% 5Maybe Accept1 9%10 30%10 30%10 30%3 - 4Not Acceptable 9% 30% 30% 30%0)1OK0.857730.1290996.6440.0000空焊0.498270.1290993.85960.0001站立0.944340.1290997.31480.0000短路1.00000.1290997.7460.0000锡少0.384740.1290992.98020.0014Overall0.748070.06534911.44730.00002OK0.944340.1290997.31480.0000空焊0.666370.1290

10、995.16160.0000站立10.1290997.7460.0000短路10.1290997.7460.0000锡少0.551670.1290994.27320.0000Overall0.833040.06471912.87170.00003OK0.90180.1290996.98530.0000空焊0.591440.1290994.58130.0000站立0.944340.1290997.31480.0000短路10.1290997.7460.0000锡少0.327310.1290992.53530.0056Overall0.769330.065211.79960.0000Action

11、PlanOwnerDue dateAssign SMT inspectors to attend the IPC-A-610C training course and get the certification.SMT/Ray7/ESMT inspectors must be certified by QA every 3 months to ensure their capability.SMT/RayFrom now on1. Reliability of SMT inspector need to be improved.2. The detection sensitivity of s

12、older open and solderinsufficiency need to clarify and train the SMTinspectors.Remark: Agreement Analysis, 算出Kappa 值要大于90%,若Kappa 70%, 表示 人员需要重新训练后, 重作Attribute gauge实验.Key Findings and Conclusion:Baseline Y1 (Continue Data)ID IPO IndicatorsCollect DataMSAProcessCapabilityCurrent Baseline Performanc

13、e:Mean: 7.28 Standard Deviation: s =2.36Distribution Shap：Too WidlyConclusion: variance is big and shift mean, both of Mean and variance need to be improvedBaseline Y2 (Discrete Data)ID IPO IndicatorsCollect DataMSAProcessCapabilityCurrent Baseline Performance: Yield Rate 80%Baseline SummaryID IPO IndicatorsCollect DataMSAProcessCapabilityBaseline Summarization (Ys)Continuous (Y)Output indicatorAverageStandard deviationCpCpkSigma LevelY1Y2Y3Discrete (Y)Output indicatorNo. of unitsNo. of opportunities per unitNo. of defectsDPMOSigma LevelY1Y2Y3Baseline definitionProcess Capabilit