T/SCGS 313010-2024磁粒子成像设备激励系统工作参数评价规范

ICS01.100.01

CCSJ04

团体标准

T/SCGS313010—2024

磁粒子成像设备激励系统

工作参数评价规范

Specificationforevaluationofoperatingparametersof

excitationsystemsformagneticparticleimagingequipment

2024⁃03⁃11发布2024⁃03⁃11实施

中国图学学会发布

中国标准出版社出版

T/SCGS313010—2024

目次

前言··························································································································Ⅲ

引言··························································································································Ⅳ

1范围·······················································································································1

2规范性引用文件········································································································1

3术语和定义··············································································································1

4磁粒子成像设备激励系统····························································································2

4.1磁粒子成像设备系统组成······················································································2

4.2磁粒子成像设备组成和各部件主要功能····································································2

4.3激励系统组成及功能····························································································3

5磁粒子成像设备激励系统工作参数评价指标····································································3

5.1概述·················································································································3

5.2激励磁场均匀性指标····························································································3

5.3机械结构稳定性指标····························································································3

5.4系统电力稳定性指标····························································································4

5.5系统散热效率指标·······························································································4

6检测方法·················································································································5

6.1通用要求···········································································································5

6.2激励磁场均匀性检测方法······················································································5

6.3机械结构稳定性检测方法······················································································5

6.4系统电力稳定性检测方法······················································································5

6.5系统散热效率检测方法·························································································5

附录A（规范性）激励磁场均匀性检测方法·······································································6

A.1检测仪器··········································································································6

A.2准备测试条件·····································································································6

A.3设置扫描参数·····································································································6

A.4测试激励磁场均匀性方法······················································································6

A.5结果表述···········································································································7

附录B（规范性）机械结构稳定性检测方法········································································8

B.1制作机械结构稳定性检测模体················································································8

B.2准备测试条件·····································································································8

B.3设置扫描参数·····································································································8

B.4测试机械结构稳定性····························································································8

B.5结果表述···········································································································9

Ⅰ

T/SCGS313010—2024

附录C（规范性）系统电力稳定性检测方法······································································10

C.1检测仪器·········································································································10

C.2准备测试条件···································································································10

C.3设置扫描参数···································································································10

C.4测试系统电力稳定性··························································································10

C.5结果表述·········································································································10

附录D（规范性）系统散热效率检测方法·········································································12

D.1检测仪器·········································································································12

D.2准备测试条件···································································································12

D.3设置扫描参数···································································································12

D.4检测激励线圈散热情况·······················································································12

D.5结果表述·········································································································13

参考文献····················································································································14

Ⅱ

T/SCGS313010—2024

前言

本文件按照GB/T1.1—2020《标准化工作导则第1部分：标准化文件的结构和起草规则》的规

定起草。

请注意本文件的某些内容可能涉及专利。本文件的发布机构不承担识别专利的责任。

本文件由北京航空航天大学提出。

本文件由中国图学学会归口。

本文件起草单位：北京航空航天大学、中国科学院自动化研究所、中国科学院昆明动物研究所。

本文件主要起草人：安羽、李光辉、杜洋、田捷、惠辉、刘晏君、雷思奥、何杰、张博、冯欣、钟景、牟玮、

刘振宇、尹琳、禹晓梅、王建红、李鸿丽。

Ⅲ

T/SCGS313010—2024

引言

磁粒子成像是新一代生物医学成像技术，基于磁粒子作为示踪剂，利用其非线性磁化响应信号，具

有高灵敏度、高特异性、高时空分辨率、无辐射且无成像深度限制等优势，在国内外均得到了快速的发

展和应用，且已展现出一定的技术积累和应用潜力。目前，该技术已经在检测深层微小肿瘤、植介入血

管成像、在体细胞示踪、实时动态血流监测、脑卒中和脑损伤检测、肺灌注成像等多领域开展预临床研

究，被证明在临床上具有广泛的应用前景。

磁粒子成像设备激励系统的工作参数直接决定设备工作性能，影响成像质量，最终关乎到诊断检

查结果的准确性。磁粒子成像设备工作激励系统工作参数是设备性能的核心要素，这些参数的设定直

接关系到成像质量，进一步影响诊断结果的准确性。然而磁粒子成像设备激励系统的评价和规范方

面，目前尚无统一的标准和定量的指标。因此对磁粒子成像设备激励系统工作参数进行评定和相关指

标的定量分析，形成统一标准，具有重要意义。

本文件制定通用要求，以规范磁粒子成像设备激励系统的研发与质量评估，推动磁粒子成像技术

的高质量发展。

本文件的发布机构提请注意,声明符合本文件时,可能涉及到专利（CN114533016B）“基于梯形波

激励的多色定量磁纳米粒子成像方法及系统”，（CN114521883B）“闭孔式无场线扫描磁粒子成像装置、

系统及方法”，（CN115778353B）“基于旋转谐波图的磁场自由线磁粒子成像方法”，（CN115153490B）

“基于非旋转场自由线的磁纳米粒子检测成像装置、方法”，（CN117686954B）“基于振荡梯度磁场编码

的磁粒子成像方法及设备”，（US11,454,681B1）“Magneticparticleimagingmethodbasedonnon⁃ideal

fieldfreepoint”以及相关的专利的使用。

本文件的发布机构对于这些专利的真实性、有效性和范围无任何立场。

该专利持有人已向本文件的发布机构承诺,他们愿意同任何申请人在合理且无歧视的条款和条件

下,就专利授权许可进行谈判。该专利持有人的声明在本文件的发布机构备案。相关信息可以通过以

下联系方式获得：

专利持有人姓名：田捷、安羽、惠辉、唐振超、李光辉、刘晏君、雷思奥、何杰、张博、张浩然、钟景；

地址：北京市海淀区花园路街道37号北京航空航天大学学院路校区。

请注意除上述专利外，本文件的某些内容仍可能涉及专利。本文件的发布机构不承担识别专利的

责任。

Ⅳ

T/SCGS313010—2024

磁粒子成像设备激励系统

工作参数评价规范

1范围

本文件规定了磁粒子成像设备激励系统工作参数评价指标与检测方法。

本文件适用于永磁体、常导磁体和超导磁体磁粒子成像设备的验收检验和状态检验。

2规范性引用文件

下列文件中的内容通过文中的规范性引用而构成本文件必不可少的条款。其中，注日期的引用文

件，仅该日期对应的版本适用于本文件；不注日期的引用文件，其最新版本（包括所有的修改单