(内存基本知识)4DRAM工作原理.ppt

DRAM工作原理,Dynamic Random Access Memory Each cell is a capacitor + a transistor Very small size SRAM uses six transistors per cell Divided into banks, rows & columns Each bank can be independently controlled,DRAM,Main Memory Everything that happens in the computer is resident in main memory Capacity: around 100 Mbyte to 100 Gbyte Random access Typical access time is 10- 100 nanoseconds Why DRAM for Main Memory ? Cost effective (small chip area than SRAM) High Speed(than HDD, flash) High Density(Gbyte) Mass Production ,Main memory,Notation: K, M, G In standard scientific nomenclature, the metric modifiers K, M, and G to refer to factors of 1,000, 1,000,000 and 1,000,000,000 respectively. Computer engineers have adopted K as the symbol for a factor of 1,024 (210 ) K: 1,024 (210 ) M: 1,048,576 (220 ) G: 1,073,741,824 (230 ) DRAM density 256M-bit 512M-bit,DRAM Density,What is a DRAM? DRAM stands for Dynamic Random Access Memory. Random access refers to the ability to access any of the information within the DRAM in random order. Dynamic refers to temporary or transient data storage. Data stored in dynamic memories naturally decays over time. Therefore, DRAM need periodic refresh operation to prevent data loss.,Memory: DRAM position Semiconductor memory device ROM: Non volatile Mask ROM EPROM EEPROM Flash NAND: low speed, high density NOR: high speed, low density RAM: Volatile DRAM: Dynamic Random Access Memory SRAM: Static Random Access Memory Pseudo SRAM,DRAM Trend : Future High Speed - DDR(333MHz500MHz), DDR2(533800Mbps), DDR3(8001600Mbps) - Skew-delay minimized circuit/logic : post-charge logic, wave-pipelining - New Architecture : multi-bank structure, high speed Interface Low Power - 5.5V = 3.3V(sdr) = 2.5V(ddr) = 1.8V(ddr2) = 1.5v (ddr3) = 1.2v? - Small voltage swing I/O interface : LVTTL to SSTL, open drain - Low Power DRAM(PASR, TCSR, DPD) High Density - Memory density: 32MB = 64MB = . 1GB = 2GB = 4GB - application expansion : mobile, memory DB for shock (than HDD) - Process shrink :145nm(03) =120nm(04) = 100nm = 90nm = 80nm Other Trends - Cost Effectiveness, Technical Compatibility, Stability, Environment. Reliability,Static RAM,SRAM Basic storage element is a 4 or 6 transistor circuit which will hold a 1 or 0 as long as the system continues to receive power No need for a periodic refreshing signal or a clock Used in system cache Fastest memory, but expensive,Dynamic RAM,DRAM Denser type of memory Made up of one-transistor (1-T) memory cell which consists of a single access transistor and a capacitor Cheaper than SRAM Used in main memory More complicated addressing scheme,Refresh in DRAMs,Capacitor leaks over time, the DRAM must be “REFRESHED”.,Capacitance Leakage,SRAM vs. DRAM,DRAM Lead Frame and Wire bonding,DRAM Architecture,SDRAM has the multi bank architecture. Conventional DRAM was product that have single bank architecture. The bank is independent active. memory array have independent internal data bus that have same width as external data bus. Every bank can be activating with interleaving manner. Another bank can be activated while 1st bank being accessed. (Burst read or write),Multi Bank Architecture,DRAM Multi Bank Architecture,DRAM Single Bank Architecture,DRAM Block Diagram(1),DRAM Block Diagram(2),DRAM Core Architecture,DRAM Address,DRAM Core Architecture,16bit DRAM Core,DRAM Data Path,DRAM 1T-1C structure,RAS: row address strobe CAS: column address strobe WE: write enable Address: code to select memory cell location DQ (I/O): bidirectional channel to transfer and receive data DRAM cell: storage element to store binary data bit Refresh: the action to keep data from leakage Active: sense data from DRAM cell Pre charge: standby state,DRAM Key word,DRAM cell array consist of so many cells. One transistor & One capacitor Small sense amplifier Low input gain from charge sharing CS : Small storage capacitor: 25fF CBL : Large parasitic capacitor: over 100fF Vc: Storage voltage VCP : half Vc for plate bias VBLP : half Vc for BL pre charge bias (initial bias),DRAM Cell,DRAM Array Overview,Simplified Example,Activating a Row,Activating a Row Must be done before a read or write Just latch the row address and turn on a single wordline,Writing,Writing A row must be active Select the column address Drive the data through the column mux Stores the charge on a single capacitor,Reading,Reading A row must be active Select the column address The value in the sense-amplifier is driven back out,The Sense-Amplifier,Sense-Amplifier A pair of cross-coupled inverters Basically an SRAM element Weaker than the column mux Write data will “outmuscle” the sense-amplifier Keeps the data at full level,Precharge,Precharge Inactive state (no wordlines active) Precharge control line high Ties the two sides of the sense-amp together This makes the bitlines stay at VDD/2 Only stable as long as the precharge control line is highotherwise this is unstable! No capacitors connected,Activation Revisited,Activation Turn off the precharge control line Makes the sense-amp unstableit wants to go to either 0 or 1 instead of staying at VDD/2 A very very very short time later, turn on the wordline of the row to be activated. Couples the capacitor onto the bitlines This “tips” the bitlines to hold the stored value. The sense-amp amplifies the capacitor back to full value. (hence the name!),DRAM Refresh,Because the stored memory value is stored on a capacitor (that has resistive leakage), the memory is constantly “forgetting” its contents. Eventually, the charge on the capacitor wont be enough to tip the sense-amp in the right direction. But, activating a row restores the cells on that row to their full value. There is an explicit refresh command that just activates and immediately deactivates a row. The DRAM has an internal counter that contains the next row to be refreshed and increments every time a refresh command is issued.,DRAM Refresh,Data Retention Time DRAM Cell consists of capacitance which has leakage as time Retention time is period for maintaining its data especially 1 data Usually, DRAM Cell refresh period is 64ms Refresh Timing tREF : Real cell retention time (Device characteristic), ex) 90ms(Hot) tRFC : Refresh command operating time, ex) 75ns Refresh Spec. Burst Refresh : 64ms Distribute refresh - 128Mb device (12 Row address) : 64ms / 4K = 15.6us - 256Mb device (13 Row address) : 64ms / 8K = 7.8us,AUTO Refresh,When this command is input from the IDLE state, the synchronous DRAM starts autorefresh operation. During the auto-refresh operation, refresh address and bank select address are generated inside the Synchronous DRAM. For every auto-refresh cycle, the internal address counter is updated. Accordingly, 8192times are required to refresh the entire memory. Before executing the auto-refresh command, all the bank must be IDLE state. In addition, since the Precharge for all bank is automatically performed after auto-refresh, no Precharge command is required after auto-refresh.,Self Refresh,Self-Refresh EntrySELF : When this command is input during the IDLE state, the Synchronous DRAM starts self-refresh operation. After the execution of this command, selfrefresh continues while CKE is Low. Since self-refresh is performed internally and automatically, external refresh operations are unnecessary. Self-Refresh ExitSELFX : When this command is executed during self-refresh mode, the Sync DRAM can exit from self-refresh mode. After exiting from self-refresh mode, the Sync DRAM enters the IDLE state., no Precharge command is required after auto-refresh.,Mode Register,Special command to initialize the DRAM Burst length Interleaving CAS Latency (read command to read data in clocks) For DDR, DLL reset is also here,MRS Block Diagram,Mode Register,Because the stored memory value is stored on a,Extended Mode Register,Special command to initialize DDR DRAM DDR onlydont use for SDR DLL Enable Drive Strength,DRAM Interface,Command Signals CAS#, RAS#, WE#, CS# CS# + CAS# = Read CS# + WE# + CAS# = Write CS# + RAS# + CAS# = Refresh CS# + RAS# = Activate CS# + WE# = Burst Stop CS# + WE# + RAS# = Precharge CS# + WE# + CAS# + RAS# = MRS or EMRS All others: NOP Other signals: CLK, DATA , DQS,DRAM Interface,All signals go from the host to the memory except DQS and data which are bi-directional.,Read Cycle,Typical Read Cycle Burst Length 4 CAS Latency = 3,Write Cycle,Typical Write Cycle Burst Length 4 Write latency is always zero,Data Clocking,CLK is always driven by the host DQS is driven by whoever is driving the data NV chip drives on write cycles Memory chip drives on read cycles This scheme is called “source-synchronous clocking” Eliminates a lot of the timing headaches from SDR Adds margin,Latencies,All kinds Activate to Precharge Last write data to precharge Activate to Read Activate to Write Refresh cycle time Refresh interval Minimum row active ti