信息检索综合检索报告

1、华南农业大学珠江学院信息检索综合检索报告08级 电气工程及其自动化 专业 2 班 学 号 姓 名 - 19 -摘 要本文阐述了数字电路的故障、诊断及其研究，并分析了数字电路应用中应注意的问题。随着微电子技术的迅速发展，电路的复杂性日益提高，使得用传统的实验设备和方法进行微电子电路和系统的维护已变得日趋困难，甚至不可能。如何能使电子设备处于完好的状态，如何能使电子设备的维修更加快捷、准确是我们面临的一项重要课题。数字电路的发展与模拟电路一样经历了由电子管、半导体分立器件到集成电路等几个时代。但其发展比模拟电路发展的更快。从60年代开始，数字集成器件以双极型工艺制成了小规模逻辑器件。随后发展到中规

2、模逻辑器件；70年代末，微处理器的出现，使数字集成电路的性能产生质的飞跃。数字集成器件所用的材料以硅材料为主，在高速电路中，也使用化合物半导体材料，例如砷化镓等。逻辑门是数字电路中一种重要的逻辑单元电路 。ttl逻辑门电路问世较早，其工艺经过不断改进，至今仍为主要的基本逻辑器件之一。随着cmos工艺的发展,ttl的主导地位受到了动摇，有被cmos器件所取代的趋势。近年来,可编程逻辑器件pld特别是现场可编程门阵列fpga的飞速进步，使数字电子技术开创了新局面，不仅规模大，而且将硬件与软件相结合，使器件的功能更加完善，使用更灵活。关键词：数字电路 数字电路的故障诊断 数字电路的研究abstrac

3、tthis paper expounds the diagnosis of digital circuit fault, and its research, and analyzes the application of digital circuit should pay attention to problems. with the rapid development of the microelectronics technology, increasing the complexity of the circuit, make with traditional laboratory e

4、quipment and methods of microelectronics circuits and system maintenance has become increasingly difficult, if not impossible. how to make electronic equipment to be in perfect condition, how to make electronic equipment maintenance is more efficient and accurate is we face an important topic.the de

5、velopment of digital circuit with analog circuits as experienced by vacuum tubes, semiconductor division device to integrated circuits and so on several times. but its development than analog circuits development faster. since the 1960s, digital integrated devices to start a bipolar workmanship the

6、small-scale logic devices. then developed to scale logic devices in; in thelate1970s,microprocessors has made the performance of digital ic produce quality leap.digital integrated device used materials with silicone material is given priority to, in high-speed circuit, also use compound semiconducto

7、r materials, such as gaas, etc.logic gates is one of the most important digital circuit logical unit circuit. ttl logic gate, its craft was earlier through continuous improvement for major, still one of the basic logic devices. along with the development of the cmos technology, by the dominance of t

8、tl shaken, have replaced by cmos device the trend.in recent years, programmable logic devices pld especially field programmable gates array fpga rapid progress, make digital electronic technology opened new situation, not only large scale, and will combine the hardware and software of the device and

9、 make use of more functional perfect, more flexible.keywords：digital circuit；digital circuit fault diagnosis ；digital circuit research目 录摘 要iabstractii1 检索课题名称12 检索课题简介13 检索策略13.1 检索工具13.2 检索词14 检索步骤及检索结果24.1 检索工具cnki系列资源库24.1.1 检索式24.1.2 检索年限24.1.3 检索步骤与结果24.2 检索工具维普科技期刊数据库44.2.1 检索式44.2.2 检索年限44.2

10、.3 检索步骤与结果44.3 检索工具美国工程索引ei数据库54.3.1 检索式54.3.2 检索年限54.3.3 检索步骤与结果54.4 检索工具万方资源数据库94.4.1 检索式94.4.2 检索年限94.4.3 检索步骤与结果94.5 检索工具google搜索引擎104.5.1 检索式104.5.2 检索年限104.5.3 检索步骤与结果104.6 检索工具国家知识产权局专利数据库124.6.1 检索式124.6.2 检索年限124.6.3 检索步骤与结果125 检索结果评价186 综述187 学习心得和体会191、检索课题名称数字电路的故障诊断研究digital circuit fau

11、lt diagnosis research2、检索课题简介信息时代的发展与进步，数字电路在各行业中发挥着重要的作用，广泛的应用于电视、雷达、通信、电子计算机、自动控制、航天等科学技术各个领域。我国从事数字电路的工程技术人员应该加强对数字电路故障的诊断与研究，更加重视数字电路的应用，促进我国电机工业的发展，推进我国电机企业的国际化成长。数字电路与数字电子技术广泛的应用于电视、雷达、通信、电子计算机、自动控制、航天等科学技术各个领域。数字电路的分类：包括数字脉冲电路和数字逻辑电路。前者研究脉冲的产生、变换和测量；后者对数字信号进行算术运算和逻辑运算。数字电路的划分：1.按功能分为组合逻辑电路和时序

12、逻辑电路两大类。前者在任何时刻的输出，仅取决于电路此刻的输入状态，而与电路过去的状态无关，它们不具有记忆功能。常用的组合逻辑器件有加法器、译码器、数据选择器等。后者在任何时候的输出，不仅取决于电路此刻的输入状态，而且与电路过去的状态有关，它们具有记忆功能。2.按结构分为分立元件电路和集成电路。前者是将独立的晶体管、电阻等元器件用导线连接起来的电路。后者将元器件及导线制作在半导体硅片上，封装在一个壳体内，并焊出引线的电路。集成电路的集成度是不同的。3、检索策略3.1 检索工具 google、baidu、cnki、万方数据库、维普科技期刊数据库、ei3.2 检索词 数字电路 故障诊断 研究4、检索

13、步骤及检索结果4.1、 cnki系列资源库4.1.1、检索式数字电路的故障诊断研究 数字电路 or 故障 or 诊断4.1.2、检索年限2001年2011年4.1.3、检索结果【作者中文名】马宇飞; 罗永芳;【作者单位】96627部队; 96631部队;【文献出处】科技资讯, science & technology information, 编辑部邮箱 2010年 09期期刊荣誉：aspt来源刊cjfd收录刊【关键词】数字电路; 故障; 诊断; 维修;【摘要】本文结合作者多年来在设备故障诊断及维修中的实践,认真分析了设备中数字电路故障产生的主要原因,提出了故障分析的基本思路,总结出了数字电路

14、的常用维修方法,具有很强的针对性和实用性,对进一步提高设备故障诊断准确率和维修效率具有重大意义。【英文篇名】a fault diagnosis of digital circuits【作者中文名】周继承; 黎飞; 肖庆中;【作者英文名】zhou ji-cheng1; li fei 1; 2; xiao qing-zhong2（1.school of physics science and technology; central south university; changsha 410083; china; 2.national key laboratory for reliability

15、physics and application technology of electronic product; guangzhou 510610; china）;【作者单位】中南大学物理科学与技术学院; 电子元器件可靠性物理及应用技术国家级重点实验室 湖南长沙; 湖南长沙; 电子元器件可靠性物理及应用技术国家级重点实验室; 广东广州;【文献出处】应用科技, applied science and technology, 编辑部邮箱 2008年 02期期刊荣誉：aspt来源刊cjfd收录刊【关键词】数字电路; 固定故障; 桥接故障; 故障诊断;【英文关键词】digital circuits;

16、 stuck-at fault; bridging fault; fault diagnosis;【摘要】针对目前数字电路开发和生产过程中对电路的故障诊断效率低下的问题,开发了故障诊断定位软件,能有效地对数字电路中的固定故障和桥接故障进行诊断定位,应用该软件能有效地缩短查找数字电路中故障的时间,对提高数字电路的开发速度具有重大的现实意义.【英文摘要】low efficiency is a major obstacle in fault diagnosis of digital circuits in the course of design or fabrication.so a fault

17、diagnosis and location software is proposed,which can diagnose and locate the stuck-at faults and bridging faults in digital circuits effectively.using this software can shorten the time of finding faults in digital circuits,and improve the efficiency of digital circuits manufacturing.【基金】国家自然科学基金资助

18、项目(60371046)【作者中文名】魏冲; 祝益芳; 王海军;【作者单位】海南三亚92823部队;【文献出处】信息与电脑(理论版), china computer & communication, 编辑部邮箱 2010年 08期期刊荣誉：aspt来源刊cjfd收录刊【关键词】数字电路; 故障诊断;【摘要】现在最常用的电路形式莫过于数字电路了,电路技术的进步也得益于数字电路的发展。数字电路需要制作精细,如果发生故障将会对整个器械造成影响。【英文篇名】fault testability technology of digital circuit board for radar【作者中文名】王建虹

19、;【作者英文名】wang jianhong（no.38 research institution of cetc; hefei 230031; china）;【作者单位】中国电子科技集团公司第38研究所;【文献出处】国外电子测量技术, foreign electronic measurement technology, 编辑部邮箱 2010年 01期期刊荣誉：aspt来源刊cjfd收录刊【关键词】雷达; 可测试性; 可测试性技术; 故障;【英文关键词】radar; testability; testability technology; fault;【摘要】现代军用电子设备大量采用各种大规模和

20、超大规模集成电路和电子计算机,使其本身变得日益复杂,给使用、维修和保障带来很多严重问题。在这种情况下,研究故障诊断和测试技术就显得十分重要。介绍了一种雷达数字电路板的可测试性设计方法,包括设计采取的措施、测试性工作流程、测试性的工作内容。该技术已经成功应用多种雷达数字电路板故障测试中,效果明显。【英文摘要】modern military affairs are becoming more and more complex for all kinds of large scale integrated and grand scale integration circuit are used.th

21、erefore,a great many problems such as useability,maintain and indemnificatory were come to bing.in this instance,the search of the fault diagnosis and testability technology is very importanc.in this paper the testablity technology of digital circuit board for radar is summarized.the design principl

22、e,research content and work flow for testability,are introduced in.【作者中文名】魏文浩;【作者单位】孝感学院物电学院;【文献出处】硅谷, silicon valley, 编辑部邮箱 2010年 03期期刊荣誉：aspt来源刊cjfd收录刊【关键词】数字电路; 逻辑; 集成; 应用;【摘要】随着数字电路的飞速发展,数字电路的设计和应用要求越来越高,主要通过介绍数字电路的发展、分类、特点、应用等,进一步推动数字电路的发展。4.2、维普科技期刊数据库4.2.1、检索式数字电路的故障诊断研究 数字电路 or 故障 or 诊断4.2.2

23、、检索年限2001年2011年4.2.3、检索结果题名：关于数字电路的故障检测技术研究作者：蔡万清出处：中国科技纵横-2010年4期摘要：目前，数字电路在开发和生产的过程中，对电路故障诊断存在效率低下的问题。本文分析了数字电路及其故障的特点，介绍了在故障诊断过程中相应的检测技术，对提高数字电路的开发具有重要的现实意义。题名：数字电路的故障检测技术 作者：于淑芳出处：科技信息-2007年33期摘要：本文根据数字电路的特点，介绍了数字电路故障的特征以及故障诊断的主要任务，着重介绍和分析了检测和排除故障的基本方法以及在检测过程中应注意的问题。题名：数字电路的故障定位与电路推断问题 作者：李春蔚 王卓

24、 贾银锁出处：西北民族大学学报：自然科学版-2004年1期摘要：布尔函数的微分可以实现对数字电路故障定位，那么如何根据布尔微分求出原来的函数。又如何根据故障定位向量推断出电路结构，这些问题正是本文要解决的问题。题名：数字电路的故障定位与电路推断问题 作者：李春蔚 王卓 贾银锁出处：西北民族大学学报：自然科学版-2004年1期摘要：布尔函数的微分可以实现对数字电路故障定位，那么如何根据布尔微分求出原来的函数。又如何根据故障定位向量推断出电路结构，这些问题正是本文要解决的问题。题名：数字电路故障诊断及维修方法研究 作者：马宇飞1 罗永芳2出处：船电技术-2010年10期摘要：本文结合作者多年来在设

25、备故障诊断及维修中的实践,认真分析了设备中数字电路故障产生的主要原因,提出了故障分析的基本思路,总结出了数字电路的常用维修方法,具有很强的针对性和实用性,对进一步提高设备故障诊断准确率和维修效率具有重大意义。题名：数字电路故障诊断系统接口技术的实现 作者：苏玮出处：微计算机信息-2007年25期摘要：本文通过阐述接口电路设计的概念,就作者近期完成的某科研项目,详细说明了基于vxi总线的数字电路故障诊断系统接口电路的开发方法及电路转接,身份识别和自我检测功能的实现过程。4.3、美国工程索引ei数据库4.3.1、检索式digital circuit fault or diagnosis4.3.2、

26、检索年限2001年2011年4.3.3、检索结果.thedigital circuit faultdiagnosis interface design and realization based on vxiying, liu1;wei, su1;tongshun, fan1source:proceedings - isecs international colloquium on computing, communication, control, and management, cccm 2008, v 2, p 215-219, 2008,proceedings - isecs inte

27、rnational colloquium on computing, communication, control, and management, cccm 2008;isbn-13:9780769532905;doi:10.1109/cccm.2008.256;article number:4609676;conference:isecs international colloquium on computing, communication, control, and management, cccm 2008, august 3, 2008 - august 4, 2008;spons

28、or:ieee; iita intelligent information technology application research; ieee technology management council; ieee computer society; institute of electrical and electronics engineers;publisher:inst. of elec. and elec. eng. computer societyauthor affiliation:1beijing union university, beijing, chinaabst

29、ract:this paper discusses in detail the development process of general interface adapter in thedigital circuit faultdiagnosis system based on vxi. after introducing vxi bus, the paper gives overall description offaultdiagnosis system, presents a method of solving the problem about load matching and

30、interface matching, and realizes the function of identification to read and write on the memory of interfacecircuitand to control chip selection. the method of identity installation in interfacecircuitto be selected is to give an id number and add a memory to interfacecircuitto ensure the accuracy a

31、nd effectiveness. the paper also describes the method of self diagnosis in the interfacecircuitthat is the key to wholefaultdiagnosis system. 2008 ieee.(6 refs.)main heading:identification (control systems)digital circuit faultdiagnosis interface technology based on vxifan, tongshun1;liu, ying1;su,

32、wei1;luo, liming2source:proceedings of the world congress on intelligent control and automation (wcica), p 9297-9301, 2008,proceedings of the 7th world congress on intelligent control and automation, wcica08;language:chinese;isbn-13:9781424421145;doi:10.1109/wcica.2008.4594404;article number:4594404

33、;conference:7th world congress on intelligent control and automation, wcica08, june 25, 2008 - june 27, 2008;sponsor:ieee robotics and automation society; ieee control system society beijing chapter; natural science foundation of china; chinese association of automation; chinese association of artif

34、icial intelligence;publisher:institute of electrical and electronics engineers inc.author affiliation:1automation college, beijing union university, beijing 1001012capital normal university, beijing 100037abstract:this paper explains the concept of interfacecircuitdesign and vxi bus technology, disc

35、usses in detail the development process of general interface adapter in thedigital circuit faultdiagnosis system based on a project of research on automatic detecting and interface technology in missile launch and control system completed by author recently, presents a method of solving the problem

36、about load matching and interface matching, realizes the function of identification by using sr192 which is thedigitalio module of vxi to read and write on the memory of interfacecircuitand to control chip selection, and scanning technology is used because in practical application the transferring i

37、n interfacecircuitis direct connection to meets the demand of self detection. 2008 ieee.(4 refs.)main heading:identification (control systems)research ondigital circuit faultlocation procedure based on lasarwei, su1;shide, zhang1;lijun, xue1source:proceedings - isecs international colloquium on comp

38、uting, communication, control, and management, cccm 2008, v 2, p 322-326, 2008,proceedings - isecs international colloquium on computing, communication, control, and management, cccm 2008;isbn-13:9780769532905;doi:10.1109/cccm.2008.253;article number:4609699;conference:isecs international colloquium

39、 on computing, communication, control, and management, cccm 2008, august 3, 2008 - august 4, 2008;sponsor:ieee; iita intelligent information technology application research; ieee technology management council; ieee computer society; institute of electrical and electronics engineers;publisher:inst. o

40、f elec. and elec. eng. computer societyauthor affiliation:1beijing union universityabstract:this paper describes lasar v6 (logic automated stimulus response) that is the software fordigitaltest program to generatefaultdictionary used as a diagnosis database offaultisolation for a testedcircuitbased

41、onfaultsimulation, presents three core files relating tocircuitfaultdiagnosis which is generated by lasar, i.e.faultdictionary, node truth table and pin connection table, analyses the content offaultdictionary, pin connection table and node truth table, finds the necessary information forfaultlocati

42、on, summarizes the procedure ofcircuittest andfaultlocation. finally thedigitalcircuitdiagnosis system which can locate thefaulton the pin of components is designed. with the help of probe,faultlocation of component pins can be accurately pinpointed. 2008 ieee.(6 refs.)main heading:automatic test pa

43、ttern generationresearch fordigital circuit faulttesting and diagnosis techniquessu, wei1;fan, tongshun1;du, mingfang1source:proceedings of the international symposium on test and measurement, v 1, p 330-333, 2009,ictm 2009 - 2009 international conference on test and measurement;isbn-13:978142444700

44、8;doi:10.1109/ictm.2009.5412926;article number:5412926;conference:2009 international conference on test and measurement, ictm 2009, december 5, 2009 - december 6, 2009;sponsor:institute ofelectrical and electronics engineers; ieee instrumentation and measurement society; intelligent information tech

45、nology; application research association;publisher:international academic publishersauthor affiliation:1beijing union university, beijing, chinaabstract:on basis of scientific research projects recently fulfilled by the author, and through detailed analysis for more than 30 lasarcircuitsimulation re

46、sult documentations, this paper makes a detailed description offaultdiagnosis software development process, which provides design basis for relevant development ofcircuitfaultsimulation software. the assay stipulates data domain testing technology and its approaches; on basis of testing system compr

47、ehensive description, realizing process offaultdiagnosis software is states accordingly. in the research, lasar (logic automatic stimulate and response)circuitsimulation resultsfaultdictionary and vxi bus technology are adopted, and lab windows/cvi for dummy instrument software development environme

48、nt are used as the platform forfaultdiagnosis software development. 2009 ieee.(6 refs.)main heading:computer softwareresearch and realization ofdigital circuit faultprobe location processsu, wei1;zhang, shide1;xue, lijun1source:proceedings - international conference on intelligent computation techno

49、logy and automation, icicta 2008, v 2, p 897-900, 2008,proceedings - international conference on intelligent computation technology and automation, icicta 2008;isbn-13:9780769533575;doi:10.1109/icicta.2008.361;article number:4659892;conference:international conference on intelligent computation tech

50、nology and automation, icicta 2008, october 20, 2008 - october 22, 2008;publisher:inst. of elec. and elec. eng. computer societyauthor affiliation:1beijing union universityabstract:this paper presents three core files relating tocircuitfaultdiagnosis which is generated by lasar(logic automated stimu

51、lus response), i.e.faultdictionary, node truth table and pin connection table, analyses the content offaultdictionary, pin connection table and node truth table, finds the necessary information forfaultlocation, summarizes the procedure ofcircuittest andfaultlocation. finally thedigitalcircuitdiagno

52、sis system which can locate thefaulton the pin of components is designed. with the help of probe,faultlocation of component pins can be accurately pinpointed. 2008 ieee.(6 refs.)main heading:automatic test pattern generation4.4、万方资源数据库4.4.1、检索式数字电路的故障诊断研究 数字电路 or 故障 or 诊断4.4.2、检索年限2001年2011年4.4.3、检索

53、结果题名：基于bp网络的数字电路多故障诊断研究作者：田树新，孙胜春，王红霞出处：电子器件2006年2期摘要：为了更有效地对数字电路进行多故障诊断,提出了一种利用电路的故障真值表来表征电路在有故障和无故障状态下的特征信息来对电路进行故障诊断的新方法.该方法使用bp型神经网络,运用误差反向传播算法,把从电路中提取的有效特征信息作为样本对网络反复训练,从而实现用单故障对多故障进行诊断的目的. 实验表明该方法可以有效、方便地实现电路的故障检测和定位,为多故障诊断的研究提供了一种新思路。题名：一种数字电路故障诊断方法的研究及实现作者：周治杰，胡昌华，张伟，禹春来出处：测试技术学报2003年1期摘要：为了

54、对数字电路进行元件级故障诊断, 采用组合测试方案生成故障字典, 并且设计了相应的硬件电路和软件流程. 达到了将故障定到元件级的目的. 研究表明, 本组合测试方案能够直观简便地反映电路的故障。题名：基于dtif数据的数字电路故障诊断技术研究作者：张波，包肖平，陈岩申出处：仪器仪表学报2005年8期摘要：系统全面地阐述了在数字电路故障诊断系统中使用数字测试交换格式(dtif)数据的方法,使dtif数据应用到海军某型ate系统中.在故障字典诊断方法中提出991法并成功应用;在探笔引导方法中采用智能技术,有效提高了探测效率。题名：数字电路测试中的关键技术研究作者：郭希维，苏群星，谷宏强出处：科学技术与

55、工程2006年18期摘要：随着数字电路的广泛应用,电路的测试与故障诊断已成为其设计与生产过程的重要组成部分.讨论了电路的测试及故障诊断中的一些问题,主要包括故障模型、故障仿真、故障压缩及可测试性度量与测试矢量生成算法(atpg),并研究了电路测试技术的发展趋势。题名：应用multisim 9对数字电路的故障诊断作者：张明金出处：实验室研究与探索2009年10期摘要：设计数字电路,由于元器件或设计线路的缺陷,需要反复检查调试.利用multisim 9先对所设计的电路进行仿真,故障诊断,可避免一些不必要重复工作.对multisim 9软件作一简介并,以24进制计数器为例,利用muhisim 9对电路中的元器件故障对电路的影响及所设计电路故障进行诊断分析。4.5、google搜索引擎4.5.1、检索式数字电路的故障诊断研究 数字电路 or 故障 or 诊断4.5.2、检索年限2001年2011年4.5.3、检索结果数字电路板故障诊断研究2009-3-23中国设备网文字选择：大中小摘 要：随着微电子技术的迅速发展，电路的复杂性日益提高，使得用传