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(绩效考核)SRM(封装考核评估资料)发行日期版本号修改事项IssuingRevisioProceedingDatenA首版发行Firstversionissue1、Purpose目的ThisdocumentprovidestemplatesforrecordingpackagequalificationdataforRFMDproductandinstructionsforcomplyingwithMaterialsDeclaration.提供记录RFMD产品考核认证所需信息资料的模板,及遵从物质申明的说明2、Scope范围ApplytoRFMDpackagequalification适用于RFMD考核认证产品3、Instruction说明3.1MaterialsDeclaration:TheSubcontractorAssemblyhouseisrequiredtosubmitMaterialsDeclarationformslistingtherequiredbanned,bannedwithacceptablethresholdlevel,reportableorothermaterialsrequiredbyRFMDQAL-21-1028forassembliesmanufacturedforRFMD.Thesearerequiredforcurrentandnewassembliesandmustbeupdatedwhenevermaterialchangesoccurorwheneveranewsubstrateprocessdevelopmentorassemblyqualificationbegins.Thesupplierwillberequiredtoprovideproofofcompliancywithachemicalanalysis.SeeQAL-21-1028fordetailsonrequirements,reportingstructure,andreportingformat.物质申明:外包封装厂需要提交物质声明书,列明禁用材料,禁用但可接受门限的材料、需告知的或其他由RFMDQAL-21-1028文件规定的用于RFMD封装制造产品的材料.这些规定适用于现有及未来新的封装产品当材料变更,新基板工艺流程的开发或开始封装考核认证时都要提交该声明书.供应商还需要提供化学分析作为依据.参考QAL-21-1028文件中的详细要求,报告的结构和格式。3.2Addlines,inserttables,embedobjectsateachapplicableprocesssteptocapturepertinentprocessdata.各工序可根据需收集的相关信息资料增加表格的行数,插入新的表格和对象3.3Compresspicturesonceallapplicableprocessinformationhasbeeninserted.Gotoviewtoolbars,selectpictures.Gotopicturestoolbarandcompresspictures,OK.完成相应的所有工序的信息资料后压缩图片.在视图工具栏中选择图片后压缩或在图片工具栏栏中压缩图片4、Reference参考CSR-CM012(PKG-21-1013)SubcontractorAssemblySpecificationforModulesCSR-CM029(QAL-21-1028)BannedSubstancesListandRFMDGreenDefinition5、QualificationData考核评估资料拟制:审核:批准:QualificationDataPartNumberQualLotNumberTraceCodePackageTypePackageSizeThicknessWaferSizeThickness(listalldie)LeadCountPONumberMSLTargetLevelAssemblyLocationBondingDiagramPartNumberBOMPartNumberBrandingDiagramPartNumberPreparedByExecutiveSummaryYieldSummaryLot#1Lot#2Lot#3TotalYieldSMTYieldLot#1Lot#2Lot#3TotalYieldAssyYieldLot#1Lot#2Lot#3TotalYieldFinalYieldDataSummaryAllLotscombinedProcessTestCriteriSSMaxMinAvgStdCpka±SMTPasteThicknessSMTComponentShear(gramforcepereachSMDsize)SMTFluxThicknessDieAttachPlacementXDieAttachPlacementYProcessTestCriteriSSMaxMinAvgStdCpka±DieAttachShear(eachdie)DieAttachRotationFlipChipAttachShear(eachdiesize)FlipChipAttachPlacementFlipChipAttachStandoffWireBondPullsDietoSubWireBondPullsDietoDieWireBondPullsSubtoSubWireBondPullsRSSBWireBondLoopHeightWireBondSpanWireBondPlacementXWireBondPlacementYWireBondBallShear>71umBPOWireBondBallShear>60<=71umBPOWireBondBallShear>52<=60umBPOWireBondSSBShear>71umBPOWireBondSSBShear>60<=71umBPOWireBondSSBShear>52<=60umBPOProcessTestCriteriSSMaxMinAvgStdCpka±WireBondBallshearonsubstratePlatingThicknessPlatingCompositionBallBallShearattachBallBallHeightattachSolderBumpBumpDiameterSolderBumpBumpCompositionSolderBumpBumpHeightSolderBumpBumpShearSolderBumpBumpCo-planarityonwaferSolderBumpBumpCo-planarityonDieSingulatioSizeXnSingulatioSizeYnSingulatioSizeZnSingulatioRegistrationXProcessTestCriteriSSMaxMinAvgStdCpka±nSingulatioRegistrationYnSingulatioCoplanaritynTrim/FormTiptoTipTrim/FormStandoffTrim/FormCoplanarityConclusionsandRecommendationsBOMQualLot#1(repeatforquallot2and3)BuildDateTracecodeWaferLotNumbersSolderBumpManf(ifapplicable)PartNumberLotNumberAlloySubstrateorLeadframeManfPartNumberLotNumberMaterialSetorAlloyFlipChipFluxManfPartNumberLotNumberSolderPasteManfPartNumberLotNumberAlloyDieAttachManfPartNumberLotNumberWireManfPartNumberLotNumberLidManfPartNumberLotNumberShieldEpoxyManfPartNumberLotNumberShieldManfPartNumberLotNumberAlloyMoldCompManfPartNumberLotNumberTabletSizeSolderBallManfPartNumberLotNumberAlloyManufactureDieDescriptionPadOpeningPadPitchDieSizeDieThicknessD1D2D3D4D5ManufactureFlipChipDieDescriptionPadOpeningBumpPitchDieSizeDieThicknessD1D2D3D4D5PassiveComponents(Useifapplicable)ManufactureDescriptionValueTypeCapacitorResistorInductorBackgrind(UseifApplicable)EquipmentMakeandModelnumberBladeTypeFeedRateSpindleSpeedWaterTypeWaterResistivityWaferSaw(UseifApplicable)EquipmentMakeandModelnumberBladeTypeFeedRateSpindleSpeedWaterTypeWaterResistivitySMT(UseifApplicable)SMTLineNumberorindividualequipmentnumbersProvideReflowProfileGraphofQuallot(repeatforqualificationlot2and3).Profiletobeobtainedprelotforallquallots.Providedata:TimeaboveLiquidousPeakTemperatureTimeto150°CTimeabove150°CReflowprofilenameNitrogenovenO2ppmZoneSettingsZ1Z2Z3Z4Z5Z6Z7Z8Z9Z10Z11Z12TopBTMFluxPrinting(forFlipChip–useifapplicable)Attachsamplepictureforeachdie.FluxStencilParameters:StencilThicknessStencilMaterialApertureOpeningDesign–(Specialdesignand%ofsoldermaskormetalopening)FluxPrintProcessParameters:Bladetype(plastic&hardness/metal)andAngleBladeForceBladeSpeedSeparationspeed&distanceSolderStencilParameters:StencilThicknessStencilMaterialApertureOpeningDesign–(Specialdesignand%ofsoldermaskormetalopening)ForFlipChip–RecessZdepth&openingX,Ydistance(s)PastePrintProcessParameters:Bladetype(plastic&hardness/metal)andAngleBladeForceBladeSpeedSeparationspeed&distanceProvidesamplepictureofsolderpasteprint.FluxThickness(ifapplicable),(repeatforlots2and3)12345678910MinMaxAvgST1PasteThickness,(repeatforlots2and3)12345678910MinMaxAvgST10402ComponentSheargramforce,(repeatforlots2and3)12345InductorsCapacitorsResistorsMinMaxAvg0201ComponentSheargramforce,(repeatforlots2and3)12345InductorsCapacitorsResistorsMinMaxAvg01005ComponentSheargramforce,(repeatforlots2and3)12345InductorsCapacitorsResistorsMinMaxAvgAddrowsorcolumnsforanyothersize/shapesurfacemountcomponentnotlisted.Performsamequantityofshearsandlisteddatagatheringrequirements.FlangePackages(ifapplicable)PreFlangeFlatnessMeasurement–DatapertenflangesMeasurefivelocationsperflange,centerandfourcorners.FlangeFlatness,(repeatforlot2and3)12345MinMaxAvgF1F2F3F4F5F6F7F8F9F10DieAttachEquipmentMakeandModelnumberAttachMethodParametersDiePlacement,(repeatforlot2and3)12345678910MinMaxAvgD1xD1yD2xD2yD3xD3yD4xD4yD5xD5yDieShear,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5DieRotationinDegrees,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5FlipChipAttach(ifapplicable)EquipmentMakeandModelnumberProvideReflowProfileGraphofQuallot(repeatforqualificationlot2and3)ifdifferentfromSMTreflowprofile.Profiletobeobtainedprelotforallquallots.Providedata:TimeaboveliquidousTimeto150°CTimeabove150°CReflowprofilenameNitrogenOvenO2ppmZoneSettingsZ1Z2Z3Z4Z5Z6Z7Z8Z9Z10Z11Z12TopBTMAttachMethodParametersNeedle(perdie):Provideimageofpushuppinconfiguration.Providesamplepictureofbacksideofdie.Providesamplepictureofbumpsafterdieplacement(perdie).Removediefromboard.Manualdiepeelingafterreflow.Fivesamplesandattachasamplepictureofdieandboard.DieHeight,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5DieShear,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5BumpShear,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5Bumpwettingtosubstratepad,(repeatforlot2and3)AttachX-rayof5samplesDieAttachCureEquipmentMakeandModelnumberPeakTemperatureRampTimeupDwellTimeRampTimeDownPlasmaorUV(UseifApplicable)MakeandModelnumberPowerTimeGasMixtureWireBondMakeandModelnumberCapillaryManfPartNumberStdBondParametersDie1Die2Die31stbond2ndbond1stbond2ndbond1stbond2ndbondVelocityTimePowerForcePreHeatTempBondSiteTempRSSBBondParametersDie1Die2Die3Bump1stbond2ndbondBump1stbond2ndbondBump1stbond2ndbondVelocityTimePowerForcePreHeatTempBondSiteTempSubstratetoSubstrateBondParameters1stbond2ndbondVelocityTimePowerForcePreHeatTempBondSiteTempAddBondingDiagram(completelayoutdrawing)WirePulls,DietoSubstrate,nonRSSB(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5WirePulls,DietoSubstrate,RSSB(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5WirePulls,DietoDie(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5WirePulls,SubstratetoSubstrate(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5LoopHeights,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5WireSpan,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5WirePlacement,(repeatforlot2and3)12345678910MinMaxAvgD1xD1yD2xD2yD3xD3yD4xD4yD5xD5yBallShear,Measure>71umPadOpening,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5BallShear,Measure10balls>60um<=71umPadOpening,Minimum2Strips(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5BallShear,Measure10balls>52um<=60umPadOpening,Minimum2Strips(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5StitchStudBump(SSB)Shear,Measure>71umPadOpening,(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5StitchStudBump(SSB)Shear,Measure10balls>60um<=71umPadOpening,Minimum2Strips(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5StitchStudBump(SSB)Shear,Measure10balls>52um<=60umPadOpening,Minimum2Strips(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5BallShearonsubstrate,Measure10balls>52um<=60umPadOpening,Minimum2Strips(repeatforlot2and3)12345678910MinMaxAvgBSSWedgeBondShear(ifapplicable),Measure10balls>65um<=80umPadOpening,Minimum10units(repeatforlot2and3)12345678910MinMaxAvgD1D2D3D4D5PlasmaorUV(UseifApplicable)MakeandModelnumberPowerTimeGasMixtureLidAttachB-stageorSolder(ifapplicable)MakeandModelnumberCureTimeCureTemperature&ToleranceTransferSpeedStage1StartPositionmm/sStage1StartPositionmm/sMoldCureTimeFlangePackages(ifapplicable)PostFlangeFlatnessMeasurement–DatapertenflangesMeasurefivelocationsperflange,centerandfourcorners.FlangeFlatness,(repeatforlot2and3)12345MinMaxAvgF1F2F3F4F5F6F7F8F9F10MoldMakeandModelofmachine:MoldCompoundTransferProgram:mm:Positionofplungeratstart(mmPelletHeight,PS(PS=PositionStart)):mm/sec:Speedofplunger(mm/secfromstarttonextposition,PStoP1):mm:Positionofplungerfornextposition(mmP1):mm/sec:Speedofplunger(mm/secfromP1toP2):mm:Positionofplungerfornextposition(mmP2):mm/sec:Speedofplunger(mm/secfromP2toP3):mm:Positionofplungerfornextposition(mmP3):mm/sec:Speedofplunger(mm/secfromP3toP4):mm:Positionofplungeratfinalendposition(PE=PositionEnd):mm:mm:*CullHeightsetting&actualmm(actualismeasuredwithmicrometer):mm:Positivecullvalue(distanceabovebottommolddie):PSISetting:PSIActual:TransferPressuresetting&actualPSI:Sec:TransferTime(timefromPStoPE):ºCSetting:ºCMax/Min:**MoldTemperaturesetting&range(Max/Min):ºCSetting:ºCActual:***PelletPreheatsettingandactual:SecSetting:SecActual:****LaminateorLeadframeinmoldpreheattime,settingandactualºC:Sec:LaminateorLeadframepreheatplatetemperature,timeonplate:Ton:ClampForce:Quantity:Pelletsperplungersleeve:Lengthmm:Gramweight:Pelletsize:Torr,mBar,orotherCavityvacuumdegree:*Cullheightsettingisfrommachineprogram.Actualmmisfullcullpieceheightasmeasuredfromextremetoptobottom.Pleasenoteifatopcullsettingfeatureisaddedorsubtractedfromanypositionsetting(s)–(positiveornegativecull).Cullheightcull的最顶端到底端测试culltopcull的设定特性参数为正数还是负数。**Moldtemperaturerange:includesallsurfacesinwhichmoldcompound&laminate/leadframecomeincontactwithmolddie.模温区域:包括所有与料饼,基板/引线框相接触的模具表面。***Pelletpreheattimeactualistobemeasuredwithstopwatch.Actualtimeisdefinedas-timewhenpellet(s)arereleasedintoplungersleeveuntilplungerrammoves.Ifpelletcrushfeatureisenabled,thentimeisdefinedaspelletreleaseinsleeveuntilP1toP2plungermove.使用秒表测量料饼的实际预热时间。预热时间是从料饼放入套筒中到顶杆开始移动的时间。如果Pelletcrush特性是激活的,预热时间为从料饼放入套筒中到顶杆开始从P1向P2运动的时间****Laminate/leadframeinmoldpreheattimeactualisdefined-fromlaminate/leadframereleaseonmolduntilmoldclamp.Measurewithstopwatch.基板/引线框的预热时间定义-从基板/引线框放入模具到模具压合的时间。使用秒表进行测量。FlipChipAttach.SupplyX-ray.jpg’sof5samplesperlot(repeatforlot2and3).(Focustoballalignmentatinterconnect.)WireSweep,Top5worstCaseperlot.SupplyX-Ray.jpg’sofEachWorstCase(repeatforlot2and3)SweepPercentageWireLocationPostMoldCureEquipmentMakeandModelnumberCureTemperatureRampTimeupDwellTimeRampTimeDownPlating(UseifApplicable)MakeandModelnumberPlatingThicknessTolerancePlatingCompositionTolerancePlatingThickness,(repeatforlot2and3)12345678910MinMaxAvgPL1PlatingComposition,(repeatforlot2and3)12345678910MinMaxAvgPC1LaserMarkingMakeandModelnumberFontParameterBallAttach(UseifApplicable)MakeandModelnumberBallDiameterBallCompositionFluxType/PartNoBallShear,(repeatforlot2and3)12345678910MinMaxAvgBS1BallHeight,(repeatforlot2and3)12345678910MinMaxAvgBH1ProvideReflowProfileGraphofQuallotSolderBump(UseifApplicable)MakeandModelnumberSolderBumpDiameterSolderBumpCompositionFluxType/PartNo(IfApplicable)SolderBumpShear,(repeatforlot2and3)12345678910MinMaxAvgBS1SolderBumpHeight,(repeatforlot2and3)12345678910MinMaxAvgBH1SolderBumpCoplanarity,(repeatforlot2and3)12345678910MinMaxAvgCProvideReflowProfileGraphofQuallotSawSingulation(UseifApplicable)MakeandModelnumberBladeTypeSpindleSpeedFeedRatemm/sWaterResistivityPackageSize,(repeatforlot2and3)12345678910MinMaxAvgXYZPackageRegistration,(repeatforlot2and3)12345678910MinMaxAvgXYPackageCoplanarity,(repeatforlot2and3)12345678910MinMaxAvgCPunchSingulation(UseifApplicable)MakeandModelnumberStrokeper/minPackageSize,(repeatforlot2and3)12345678910MinMaxAvgXYZPackageRegistration,(repeatforlot2and3)12345678910MinMaxAvgXYPackageCoplanarity,(repeatforlot2and3)12345678910MinMaxAvgCTrim&Form(UseifApplicable)MakeandModelnumberStrokeper/minPackageTiptoTip,(repeatforlot2and3)12345678910MinMaxAvgTTPackageStandoff,(repeatforlot2and3)12345678910MinMaxAvgPSPackageCoplanarity,(repeatforlot2and3)12345678910MinMaxAvgCLeadIntegrity,(repeatforlot2and3)Pass/failEndofLineInspectionandYieldReportSMT(IfApplicable)DefectBreakdownQtyinQtyoutYieldDieAttachDefectBreakdownQtyinQtyoutYieldFlipChipAtachDefectBreakdownQtyinQtyoutYieldWireBondDefectBreakdownQtyinQtyoutYield3rdOpticalDefectBreakdownQtyinQtyoutYieldMoldDefectBreakdownQtyinQt
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