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1、,Better For Business Better For The Environment,CEPREI,中国赛宝实验室,1,中国赛宝实验室 罗 道 军,中国赛宝实验室 罗道军,无铅焊料与无铅工艺技术,主 要 内 容,1. 为什么要无铅? 2. 无铅焊料研究状况 3. 目前已实用的无铅焊料介绍 4. 无铅工艺相关技术问题 5. 典型无铅制程工艺 6. 无铅制程的可靠性评价,1. 为什么要无铅 ?,1.1 铅元素毒性对人类健康的影响。,含铅废物处理问题(Disposal)不当导致铅的浸出以及循环(Lenching and Recycling),然后进入生态系统!

2、铅有关的健康危害包括神经系统和生育系统紊乱、神经和身体发育迟缓。铅中毒特别对儿童的神经发育有危害。,铅污染的机理,关键:Pb Pb2,铅在各种产品中的使用量(1),产品蓄电池氧化物(用于油画、玻璃和陶瓷、颜料和化学品) 消耗量(%)80.814.78 产品弹药铅箔纸电缆覆盖物 铸造金属铜锭、铜坯 消耗量(%)4.691.791.40 1.130.72 产品管道、弯头和其它挤压成型产品非电子焊料 消耗量(%)0.720.70 产品电子焊料其它 消耗量(%)0.492.77 在电子产品中禁止使用铅并不能解决全部的铅中毒问题。,0,10,20,30,40,50,60,70,80,90,Total e

3、xemption: 93.5%,Electronic solder 0.5%,Ammunition,Other Oxide,Storage Batteries,Sheet Lead,Cable covering,Casting Metals,Brass, Bronze, Billets Senju Metals, Harima Chemicals, Alpha Metals Japan, Nihon Handa, Ishikawa, Metals, Uchibashi Estec, Speria Japan Solder Coat, Univ.of Tokyo, Osaka Univ, ICS

4、, SC Lab, Tokyo Electric Univ. Tabai Espec, Mitsui Mining,Nippon Mining & Metals, Nippaku, Ishihara Chemicals, Tanaka Electronics Ind. Furukawa Electric Ind., TDK, Murata, Rubicom, Sony, Fujitsu, NEC, Hitachi, Toshiba, Panasonic, Fuji Electric and Ornron.,Modelling of Solder Joint Reliability for El

5、ectronic Interconnects, Cambridge University - ESPRC Funded,IDEALS -Brite Euram Funded,NPL Research in lead-free solders,2.5 基本共识,(1) 无铅焊料的基体为Sn(一般不少于90wt.%),即新型无铅焊料应为Sn基合金; (2) 目前为止,还没有一种无铅焊料可以“即时取代”(drop-in)传统的Sn-Pb共晶焊料合金 根据:1997年美国国家制造科学中心(NCMS, National Center for Manufacturing Sciences)的结论;1994

6、年,作为欧洲IDEALS(Improved Design Life and Environmentally Aware Manufac-turing of Electronic Assemblies by Lead-free Soldering)计划的一部分,研究了超过200种合金,只有不到10种合金是可行的; (3) Sn基无铅焊料中,其它可能元素包括Ag, Cu, Sb, In, Bi, Zn等。,2. 无铅焊料的研究状况,2. 无铅焊料的研究状况,2.6 替代元素/焊料的基本要求(1),无铅焊料不是新技术。但今天的无铅焊料研究是要寻求年使用量为 超过6万吨的Sn-Pb焊料的替代产品。 (

7、1) 其全球储量足够满足市场需求。某些元素,如铟和铋,储量较小,因此只能作为无铅焊料的添加成分; (2) 无毒性。某些在考虑范围内的替代元素,如镉、碲,是有毒的。而某些元素,如锑,如果改变毒性标准的话,也可以认为是有毒的; (3) 能被加工成需要的所有形式,包括用于修补的wire;用于焊料膏的powder;用于波峰焊的bar等。不是所有的合金能够被加工成所有形式,如铋的含量增加将导致合金变脆而不能拉拔成丝状; (4) 替代合金也可以再循环利用。如果无铅焊料中包含3到4种金属元素将使再循环工艺复杂化并增加成本。,2.6 替代元素/焊料的基本要求(2),(5) 相变温度(固/液相线温度)与Sn-P

8、b焊料相近; (6) 合适的物理性能,特别是电导率、热导率、热膨胀系数; (7) 与现有元件基板/引线及PCB材料在金属学性能上兼容; (8) 足够的力学性能:剪切强度、蠕变抗力、等温疲劳抗力、热机疲劳抗力、金属学组织的稳定性; (9) 良好的润湿性; (10) 可接受的成本价格。,2. 无铅焊料的研究状况,2.7 替代元素的价格,铅的市场价格约为0.4美元/磅(2000),2.8 替代元素的供需情况(1998),单位:万吨,2.9 合金成本情况(2000),2. 无铅焊料的研究状况,2.10 关于熔点(固相线/液相线),替代元素应该使新型合金的熔点低于Sn的熔点(232oC) 。,2. 无铅

9、焊料的研究状况,2.11 关于金属学组织,合金的性能,特别是力学性能取决于其金属学组织。 Se(硒)和Te(碲)将导致Sn基合金脆化。 Sb(锑)的含量不适当将恶化Sn基合金的润湿性能。 In(铟)原子在Sn晶格中的分布显著影响其疲劳性能。 如果存在Bi(铋)的第二相沉淀将显著脆化Sn基合金。 Sn与Cu、Ag、Sb等之间金属间化合物的形成将显著影响其强度和疲劳寿命。 可以断定,新型无铅焊料中各组分含量必须是特定的,或者只能在一个很窄的范围内变动。,2. 无铅焊料的研究状况,2.13 无铅焊料的定义,RoHS 0.1wt%Pb JEIDA 0.1wt%Pb EUELVD 0.1wt%Pb,EU

10、ELVD - EU End of Life Vehicles Directive JEIDA - Japanese Electronic Industry Development Association JEDEC - Joint Electronic Device Engineering Council,Note: Solders with 85wt%Pb are exempted!,At present, there is no common world (or GB) standardfor the stipulation of the lead content as impuritie

11、s to lead-free solders (i.e., maximum concentration values). However,3 实用化的无铅焊料,3.1无铅焊料简介与分类,目前已经有超过100(?)个无铅焊料的专利,由于性能与价格方面的原因,只有其中一小部分可以实用化。,实用化焊料通常按熔点范围作如下分类:,1.Low melting temperature (below 180OC), 2.Melting temperature equivalent to the tin-lead eutectic (180-200OC), 3.Mid-range melting temper

12、ature (200-230OC), 4. High temperature alloys (230-350OC).,3.2 低温无铅焊料Low Temperature Alloys,Table1 Examples of lead-free solder alloys melting below 180OC,3.3 Sn-Pb Equivalents无铅焊料,Table2 : Example of lead-free solder alloys melting 180-200OC,3.4 Mid-range Melting Temperature Alloys,Table 3: Example

13、s of lead-free solder alloys melting 200-230OC,3.5 可能替代锡铅焊料的合金熔点系列,3.6 高温无铅焊料,Table 4: Examples of lead-free solder alloys melting above 230 oC,Dieattach (Sn10Pb90),For this particular high power, high temperature application it is not yet possible to propose a suitable lead-free alternative.(RoHS ,

14、exempt for Pb85),3.7 Lead-free alloys: A comparison,Diagram Illustrating Fillet Lifting,3.7.1 无铅工艺(含Bi或铅污染)易产生的问题,3.7.2典型无铅焊料的物理性能比较,3.8 Suppliers And Patents,非专利产品:Sn-Cu与Sn-Ag共晶合金,Sn-4Ag-0.5Cu,3.8.1 Overview of SnAgCu Patent Coverage,US Patent no. 5,527,628 (Iowa State & Ames) 3.5-7.7Ag1-4Cu0-10Bi0

15、-1Zn JP Patent no. 5,050,286 (Senju) 3-5Ag0.5-3Cu0-5Bi0-5Sb,3.9 Solders Used by Area of Industry Served,3.10 部分机构推荐使用的无铅焊料,Specific Alloy Compositions Reviewed and/or Recommended by Other Organizations,3.11 典型的无铅焊料商品举例,3.12 美国NEMI推荐选用的无铅焊料,NEMI (Nat. Elec. Manuf. Initiative) 95.5Sn-3.9Ag-0.6Cu for r

16、eflow soldering (217oC) 99.3Sn-0.7Cu for wave soldering (227oC) (Note, dont use this solder, otherwise youll have 2 different kinds of solders on your PCBA),3.13 欧洲BRITE-EURAM & IDEALS推荐的无铅焊料,The European Consortium - BRITE-EURAM (IDEALS) 95.5Sn-3.8Ag-0.7Cu - an all purpose alloy. Other alloys with

17、potential are 99.3Sn-0.7Cu, 96.5Sn-3.5Ag and SnAgBi UK, Department of Trade and Industry (DTI) 1)High professional group (automotive, military) - SnAgCu(Sb) 2)Medium professional group (industrial, telecommunications) -SnAgCu, SnAg 3)General consumer & low professional group (TV, audio-video, office

18、 equipment) - SnAgCu(Sb), SnAg, SnCu, SnAgBi,3.14 日本JIEDA &JIETA推荐的无铅焊料,3.14 IPC 组织对所推荐焊料的研究评估,IPC Solder Products Value Council (SPVC) Aim *Kester Northrup Grumman Alpha Metals & Fry *Koki Company, Ltd. Advanced Metals *Nihon Superior Amtech, Inc. *P. Kay Metals EFD, Inc. *Qualitek Henkel Loctite *

19、Thai Solder Heraeus *Senju Metal Industry Indium *Cookson Electronics,(一阶段),IPC SPVC (First Phase) for Process Parameters The solders being investigated are: (1) Sn-3wt%Ag-.5wt%Cu (2) Sn-3.8wt%Ag-.7wt%Cu (3) Sn-4wt%Ag-.5wt%Cu Tested by multiple vendor (1) DSC (Differential Scanning Calorimetry) for

20、melting point (2) IPC-TM-650, 2.4.14.2, for wetting balance (3) IPC-TM-650, 2.4.46 for solder spreading,The IPC SPVC will standardize on a single solder, to reduce costs and benefit the supply chain.,Tw = Time to cross the zero,Fmax = Max wetting force,3.14.1 评价不同组成SAC焊料的润湿性方法,Wetting Balance Curve,

21、润湿性评估 结果,3.14.2 三种不同组成SAC之间的评价结果,*Results: No significant difference among these solders!,Board Processing Solder Paste SnAg4%Cu0.5% Board Surface Finish ImAg OSP (within limitations) Rework SnAg3.5-4%Cu0.5%,Intel preferred* Pb-free materials,3.15 合金选择公司案例,4 实施无铅工艺的相关问题,Sn-Pb共晶焊料只需要30-50秒的再流时间来保证充分铺

22、展。,无铅焊料需要50-70秒的再流时间来保证充分铺展。,4.0 无铅工艺的特点01-高热容,Pb-free Reflow Profile (Example),4.0 无铅工艺特点02工艺窗口明显缩小,工艺窗口的大幅缩小!,如采用SnAgCu焊料(熔点为217oC),再加上5oC的控制限制,实际的工艺窗口只有8oC。如此之窄,对于电子组装绝对是一个挑战。同时,工艺过程的温度实时监控更为重要。,应对策略:增加窗口上限? 提高焊接的最高温度?,元器件的安全温度235245,SAC熔点217,SnPb熔点183,4.0 无铅工艺特点03无铅焊料润湿性下降,SnCu(260): 1.82.3s SnP

23、b(235): 0.8s同样条件下:助焊剂、(温度)被焊面,tw,焊接设备的改进01氮气保护,增加温度区数目,同时减小每个温度区的尺寸,以便在高温时更好控制。如上图中oven总长度为150英寸,而传统oven总长度为183英寸。,4.1 无铅制造设备,针对无铅焊料/焊料膏,再流焊设备的改进,温度超过150oC时,PCB会发生玻璃态相变,引起其中间部分下塌。再流焊温度越高,下塌越显著,回复平整的可能性越小。特别是对于双面PCB,这一问题更为重要。,传统的支撑条贯穿整个加热区,会阻碍空气向PCB流动,增加PCB上的温差。同时由于设置支撑结构会降低PCB的整体温度水平,因此有/无支撑结构需要不同的再

24、流温度规范。 改进:只在再流区和冷却区设置支撑结构,而去除预热区的支撑结构(因为其温度小于150oC)。,焊接设备的改进02印刷电路板中间的支撑问题,4.1 无铅制造设备,再流焊设备的改进03环保的考虑,闭环焊剂分离/收集系统可去除再流焊设备内部95%的焊剂残渣,同时保证氮气的再循环利用。,4.1 无铅制造设备,以下设备分别在介绍工艺流程时介绍: 波峰焊设备的改进 手工焊设备的改进 返修设备的改进,4.1 无铅制造设备,4.2 无铅元器件,无铅元器件的定义与标识 无铅元器件面临的挑战 无铅元器件的工艺适用性要求,4.2.1 无铅元器件的定义,RoHS 0.1wt%Pb JEIDA 0.1wt%

25、Pb EUELVD 0.1wt%Pb,Note: Solders with 85wt%Pb are exempted!,物理性能满足无铅工艺的要求; 材料组成符合如下要求:,4.2.2 无铅元器件的标识(1),IPC1066,4.2.2 无铅元器件的标识(2),Note: Items that contain Pb shall not use this label even if exempted by RoHS.,Pb-Free label be a minimum of 75 mm by 50 mm.,e1,e2,e3,e4,e5,e6,e7,4.2.2.1 无铅可焊性涂层材料分类标识,I

26、dentification of Interconnect Material Differences 2nd Level Connection for packages and boards,4.2.3 无铅PCB与PCBA的标识,BOARD/ASSEMBLY MARKING,4.2.4 无铅元器件面临的挑战,热损伤,Cross-section of 144LQFP package after level2a/260C indicating crack in mold compound.,元器件热损伤失效的例子1,Cross-section of the 2-layer PBGA packag

27、e afterlevel 2a/260C stressing indicating delamination within thedie attach layer and internal substrate layers,元器件热损伤失效的例子2,4.2.5无铅元器件工艺适应性要求,Solderability可焊性 Resistance to Solder Heat 耐焊接热(Reflow,flow ,Hand soldering) Resistance to Dissolution of Metallization金属化涂层(或端子)耐熔解(260-30s) Whisker Risk 锡须

28、风险 MSL塑料封装器件潮湿回流敏感度评价 可焊性涂层与焊料的兼容性,4.2.5.1 无铅元器件可焊性要求,由有铅工艺向无铅工艺转换过程中各要素的变化,有铅,良好焊点形成要素100,无铅,无铅,无铅,无铅,端子可焊性S,焊接温度T,助焊剂活性A,焊料润湿性w,4.2.5.1.1 无铅元器件可焊性测试评价01,Wetting Balance 润湿天平法 测试方法与依据:ANSI/J-STD-002B, IEC 60068-2-58,MIL-STD-202G,4.2.5.1 无铅元器件可焊性测试评价02,Dip and Look,4.2.5.2 Resistance to Soldering He

29、at 耐焊接热,Reflow,flow ,Hand soldering,Hand soldering,wave soldering,Reflow235(30S),Flow 260(10S) ,Hand soldering 350(5S),Soldering Heat 造成的元件损伤,4.2.5.3 Resistance to Dissolution of Metallization,金属化涂层(或端子)耐熔解(260-30s)-SMD,Moisture/Reflow Senstive问题由来,4.2.5.4 MSL? 塑封器件的回流敏感度,Wire-Bonded Plastic Ball Gr

30、id Array (PBGA) Package,Plastic Quad Flat Pack (PQFP) Package,Molding Compound,塑封器件的典型封装形式介绍,4.2.5.4塑料封装器件潮湿回流敏感度评价(1),4.2.5.4塑料封装器件潮湿回流敏感度等级评价(2),回流工艺条件Reflow profile,4.2.5.4塑料封装器件潮湿回流敏感度评价(3),4.2.5.4塑料封装器件潮湿回流敏感度等级评价(4),4.2.5.5 锡须风险,Leading Component Finishes主要的无铅可焊性涂层 PTH Leaded Components: (e.g.

31、, PGA) Sn (either plate or dip) SMT Leaded Components: (e.g., PQFP) Matte-Sn (for short life cycle applications) Matte-Sn with Ni barrier underlayer* Solder Balled Components: (e.g., PBGA) Sn4wt%AgCu Discrete Components: (e.g., chip resistor) Matte-Sn,锡须的由来,4.2.5.5.1 纯锡镀层的主要问题,纯锡单晶,最长可达10mm 典型大小:13微

32、米300微米 锡须的主要形状:Filament/Nodule/Column/Hillock 危险:可导致将来短路的可靠性问题,锡须的产生与锡须特征,4.2.5.5.2 Various Kinds of Tin Whiskers,For Fine Pitch Leaded Components Tin Whiskers May Short Circuits!,4.2.5.5.2 锡須的结构,4.2.5.5.3Tin Whisker Mechanisms,(1) The diffusion of Cu into Sn and the formation of Cu6Sn5 can generate

33、 compressive stress in the Sn layer. (2) The thermal loads. (3) The mechanical loads. (4) The shock and vibration loads. (5) The self-diffusion of Sn along Sn grain boundaries to the root of a whisker will supply more Sn atoms to push the Sn whisker upward (dislocation loop climbing effect on the gr

34、ain boundaries). (6) SnOx layer with weak spots,4.2.5.5.4 锡须生长过程,Nodule Pictures Taken Periodically (x1700),4.2.5.5.5如何降低锡須造成的可靠性风险?,镀大结晶颗粒的matte-锡以减低锡须生长速率 镀厚锡,最好10um,最少8um 回流或再熔化一次锡镀层,以释放镀层中的压缩应力 使用镍阻挡层,阻止铜扩散入锡层形成锡铜IMC 使用合金镀层(如SnCu/Bi) 采用退火工艺(1503h) 锡表面形成较厚的SnO,但不能太厚以免润湿不良,For High-End (Long Life

35、Cycle) Lead-Free SMT Leaded Components,The stress in the Sn-layer due to the formation of the Ni3Sn4 IMC (inter-Metallic Compound) is in tension,1m,10m,JEDEC STANDARD JESD22A121 Measuring Whisker Growth on Tin and Tin Alloy Surface Finishes,4.2.5.5.6 锡須评价使用方法(1),Sony Technical Standard SS-00245-8(10

36、) Tin Whisker evaluation 1)High Temperature/Humidity Test: 85oC , 85% RH for 500 hrs 2)Thermal Cycling Test: -35oC for 30min to 125oC for 30min 500 cycles Notes: No Bias Voltage and heat treatment Evaluation criteria:Whisker formation 50 um or less,4.2.5.5.6 锡須评价使用方法(2),4.2.5.5.6 锡須评价使用方法(3),Intel:

37、Whisker growth not to exceed 50 microns (2 mils) at any time during following tests Temperature Cycling (-55 to 85C): -55 +0, -10C to 85 +10, -0C air to air temperature cycle per JEDEC Temperature Cycling Standard No. 22-A104, Test condition A, soak mode 3(10 minutes), typically 3 cycles/hour Readou

38、ts every 500 cycles (1000 cycles minimum) Temperature/Humidity Storage (60C/93%RH): 60 + 5 C, 93 +2, -3 % RH Readouts at 3 weeks, 6 weeks, 13 weeks, 6 months, 1 year and annually there after (6 weeks minimum) Ambient storage (23C): Readouts at 3 weeks, 6 weeks, 13 weeks, 6 months, 1 year and annuall

39、y there after (6 weeks minimum) 20 - 25 C, 30-80% RH,Equipment Needed: An air to air temperature cycling equipment capable of cycling from 55(+0,-10)C to +85(+10 0) C A temperature humidity chamber capable of 60+5C, 93 + 2, -3 %RH Capability to store in ambient conditions (20 -25C, 30-80% RH) Scanni

40、ng Electron Microscope (SEM) Whisker Inspection: 3 leads per device,Sample Size:,Sample Size, Equipment Needed,SEM检查锡须时注意与枝晶的区别(1),SEM检查锡须时注意与枝晶的区别(2),4.2.5.6 材料及其兼容性问题,Another important technological issue is the compatibility of fluxes, board finishes and component finishes with lead-free solders.

41、,(i) Components finishes,(ii) Board finishes,(iii) Fluxes,The SnAgCu alloy is not compatible with Ag/Pd which exhibits very poor solderability.,SnCu is compatible with OSP and Sn/Pb HASL finishes. SnAgCu alloy is compatible with Sn, Ag, Au and (OSP) finishes.,Warpage Delamination(T288,IPC-TM-650 2.2

42、.4.1) CAF Via Integrity (Barrel /Foil Crack/ Interconnect separation) PCBFR4? 材料参数:Tg/Td(ASTM D3850)/ CTE/ IST(1cycle/5min)/SIR?,4.3 无铅PCB,4.3.1 PCB Materials stability/reliability.,PCB热应力失效案例,4.3.2 无铅PCB 焊盘Pad的主要可焊性涂层,OSP Benzotriazole Imidazole Benzimidazole (substituted) Preflux (rosin/resin) Ni/

43、Au Electrolytic Ni/Au, or EG Electroless Ni/Electroless (immersion) Au, or ENIG Electroless Ni/Electroless (autocatalytic) Au Electroless Ni/Electroless (substrate-catalyzed) Au Ag Electroless (immersion, or galvanic) Ag,Bi Electroless (immersion) Bi Pd Electrolytic Pd or Pd-alloys Electroless (auto

44、catalytic) Pd Electroless (autocatalytic) Pd/Electroless (immersion) Au Ni/Pd Electroless Ni/Electroless (immersion) Pd Electroless Ni/Electroless (autocatalytic) Pd Electroless Ni/Electroless (autocatalytic) Pd/Electroless (immersion) Au,现有的Finishes1,现有PCB PadFinishes2,Ni/Pd(X) Electrolytic Ni/PdCo

45、/Au flash (Electroless) Ni/(Electroless) PdNi/Electroless (immersion) Au Sn Electrolytic Sn Electroless (immersion) Sn Electroless (Modified immersion + autocatalytic) Sn,Ni/Sn Electrolytic Ni/Electrolytic Sn SnAg Electrolytic SnAg SnBi Electrolytic SnBi Electroless (immersion) SnBi SnCu Electrolyti

46、c SnCu SnNi Electrolytic SnNi,4.3.2 .1 无铅PCB主流的PadFinishes,Leading PCB Cu-Pad Finishes OSP (Organic Solder Preservative), Entek ENIG (Electroless Nickel-Immersion Au) ImAg (Immersion Silver) HASL (Hot-Air Solder Leveling), SnCu/SAC Sn(Plated/Immersion),4.3.3 无铅焊盘finishes的典型问题,Black Pads in ENIG,4.3.

47、3.1无铅焊盘典型问题Black Pads 产生机理,4.4 其它无铅工艺材料,无铅助焊剂(Flux Requalification) 活性增强 、高温稳定性改善 (更加注意:残留物增加、SIR 、离子残留、电迁移) 无铅焊锡丝 焊锡芯助焊剂增加,典型:2 3 无铅焊锡膏 润湿性提升、存储稳定性改善,4.4.1 无铅助焊剂,需要关注的关键性能与可靠性指标: 助焊性(扩展率,最好90) 腐蚀性(铜镜腐蚀、铜板腐蚀) 表面绝缘电阻(SIR,1012欧姆) 卤素含量(Cl) 残留物 固体含量 参考标准:ANSI/J-STD-004,GB9491,JIS Z3197,PCBA腐蚀的案例,应该关注的性能

48、与可靠性指标: 本身项目(粘度、坍塌性能、润湿性、锡珠试验、金属含量、工艺性可印刷性、干燥时间) 助焊剂部分(SIR、腐蚀性、卤素) 合金部分(化学成分、粒度形状以及分布) 参考的技术标准:ANSI/J-STD-005,4.4.2 无铅焊锡膏,焊锡膏的坍塌性能测试,应该关注的关键性能与可靠性指标: 合金部分(合金比例/杂质) 助焊剂(SIR、腐蚀性、卤素、残留物) 本身项目(助焊剂含量、线径、连续性、喷溅量) 参考的标准:ANSI/J-STD004/006,JIS Z3283,4.4.3 无铅焊锡丝,焊锡丝喷溅试验,喷溅量,焊锡丝,电烙铁,注意:无铅焊锡丝 助焊剂含量增大; 腐蚀性增加; 喷溅

49、量增加!,4.5 Logistical 生产实施的后勤物流问题,The lack of a single drop-in replacement has several implications as far as the logistics of actually implementing lead-free soldering are concerned. It should be noted that the overall trend of the electronics industry is towards contract manufacture rather than in h

50、ouse assembly. The consequence of this is that the contract manufacturers will have to address most of these logistical issues.,A particular concern is that, in the event of large customers specifying more than one alloy for their assemblies the contract manufacturer may be faced with having to have

51、 different assembly lines for each alloy.,4.6 Transition 生产实施中的过度问题,案例分析。,4.7 Inspection 检验检查,IPC-A-610C IPCA610D !,An important part of the electronics assembly process is the visual inspection of boards to pick up possible or potential defects and faults.,无铅焊点与有铅焊点之间有非常大的差异,因此组件可接受外观标准需要及时修订,但要基于新

52、的标准(IPC-A-610D/J-STD-001D)以及时间的可靠性测试数据,4.8 Reliability 可靠性问题,If it does exist, is not freely available for lead-free solders and indeed even with accelerated testing will still take many years to establish. While this may not be so critical for consumer electronics such as mobile telephones, with pr

53、oduct lifetimes as low as 6 months, for other products which require service lifetimes from a few years to decades or more, this lack of knowledge is of real concern.,A great deal of accelerated testing needs to be carried out before any conclusions can be drawn about the long term reliability of th

54、e SnCu alloy under a variety of conditions. Of prime concern is the lack of data on high lead out devices such as BGAs and flip-chips.,4.9 Rework and Repair 返修与修理,where issues with higher soldering temperatures have been thought to be of concern. These concerns are most likely to be manifest for rew

55、ork of complex components such as BGAs which require a high level of background heat to remove and reflow effectively.,返修焊料的兼容性问题,被维修点的材料确认问题。,4.10 Recycling - Solder Recovery再利用,Current solder recycling processes,无铅焊料的循环利用由于组成难度变化很大 SnAgCu(B)-SnCu(S),Government regulations in many countries are bec

56、oming more stringent with regards to landfill and therefore companies are forced to find alternative methods for the disposal of their high-tech scrap, particularly following recycling.(WEEE),4.11 Costs 实施成本,Raw materials(Ag,In、Bar&Paste、PCB),主要构成因素,Requalification,Equipments,Energy Consumption,Retr

57、aining,Recycling,4.11.1Impact of Lead-free Solder to Product Cost,4.11.2 Energy Consumption,5 典型无铅工艺,无铅制程工艺准备: 无铅元器件选用与评估 PCB选用与评估 材料(助焊剂、焊料、锡膏)等评价 设备评估 工艺优化,5.1 典型的Lead-free solder wave Process,两个波之间的距离要短一些,防止由于PCB降温造成焊锡炉的冲击,焊接时间一般控制35s;,t,双波峰焊实时温度曲线一例,5.1.0 典型的无铅波峰焊过程参数(1),波峰焊锡炉温度的选择,5.1.0 典型的无铅波峰

58、焊过程参数(2),5.1.1 无铅波峰焊过程影响因素分析(1),注意无铅波峰焊的焊料对锡炉与焊件的影响: 使用的无铅焊料(Sn-Cu, Sn-Cu-Ni,Sn/Ag/Cu)的锡含量均超过90%,这些高锡焊料在高温下对铁(Fe)有很强的溶解能力, 因此锡炉容易受到溶蚀,如果含有银则会加速腐蚀锡炉。因此需对原有锡炉进行修改,采用钛合金钢锡炉、或在炉内壁镀防护层。 对不锈钢腐蚀率: Sn3Ag0.5Cu Sn0.7Cu Sn0.7Cu0.05Ni 对Cu 腐蚀率: Sn3Ag.5Cu Sn37Pb Sn 0.7Cu0.5 Ni,锡炉与叶轮腐蚀的典型照片,对大尺寸的PCB可能需增加中间支撑,预防高温引

59、起 PCB变形; 为了减少焊环提升现象使焊点光亮和增加强度,需增加冷却装置以改善冷却效率,使焊点快速降温,但如果冷风进入锡炉表面,则会影响焊接温度; 由于润湿性差,除了需要改良助焊剂性能,还需要适当增加涂覆量。 由于助焊剂涂覆量多,同时由于水基助焊剂需要充分地将水分挥发掉,需要改善预热效果,设备的预热区的加热效率需要进一步提高。 充N2可以减少焊渣的形成,但为了节约,大多情况下可以不充氮气(N2)也可满足要求,但一定要比有铅焊接更注意每天的清理和日常维护。,5.1.1 无铅波峰焊过程相关因素分析(2),改善PTH填充效果的方法,1 2 3 。 9,插装孔内上锡可能达不到75%,。改进等等可以改善填充量。,某些情况下(Fine Pitch/SnCu),N2可能必须,

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