USB_A_TYPE_测试方法与格式.doc

aces electronic co., ltd.qa lab analysis report廠區別：_過嶺廠_report no.：tt1405027release date：2014/07/28page 25 of 25- products number：53088-00442-002products description：usb 2.0 a typeproduct spec.：usb2.0spec-53081-xxxxx-xxxsample quantity：40 pcstest item：1、temperature rise2、durability3、vibration4、thermal shock / humidity5、temperature life6、salt spray7、solder ability8、resistance to soldering heat9、客戶要求測試項目-overload10、客戶要求測試項目-abuse insert 4 sides11、客戶要求測試項目-abuse remove12、鐵殼扣合破壞力test result：1、temperature rise ok2、durability ok3、vibration ok4、thermal shock / humidity ok5、temperature life ok6、salt spray ok7、solder ability ok8、resistance to soldering heat ok9、客戶要求測試項目-overload ok10、客戶要求測試項目-abuse insert 4 sides ok11、客戶要求測試項目-abuse remove ok12、鐵殼扣合破壞力 okcomment：issued by：candy approved by ：joey1、temperature rise1.1. test method1) test equipment：直流電源供應器(abm/8303d)、無紙式記錄器(vr18-4600)2) test condition：a current of 1.8a shall be applied to vbus pin and its corresponding gnd pin .additionally, a minimum current of 0.25a shall be applied to all tile other contacts.3) environment temp.：234) product spec：temperature rise 30 max.1.2. test result unit ：samplevbus gndothers121212housinginitial2322.723.222.422.523.1steady25.626.823.622.925.124.82.64.10.40.52.61.72、durability 2.1 test method1) test description：彈片高度 contact resistance mating / unmating force durability 1500 cycles mating / unmating force contact resistance 彈片高度2) test equipment：durability：automatic load tester ( 順瑩 / 1220s )contact resistance：milliohm meter (zenith / 502b)gap：microscope3) test condition：durability：speed 12.53mm/min / 行程：5mmcontact resistance：20mv max. , 100ma max.4) environment temp.：22.55) product spec：contact resistance：30 m( max )initial for vbus and gnd contacts. 50 m( max )initial for all other contacts. r 10 mmax. afterdurability：i.f.：35n max w.f.：10n min53088-xxxxx-xxx：彈片高度：0.64+/-0.132.2 test result 2.2.1 contact resistance unit：m53088 vs usb2.0before testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)120.521.519.919.726.422.021.9221.320.121.221.727.021.922.2320.920.620.420.726.922.222.6421.221.421.921.827.622.023.1max.21.321.521.921.827.622.223.1min.20.920.119.919.726.421.921.9avg.21.020.920.921.027.022.022.5stdev0.40.70.91.00.50.10.5after testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)122.222.222.622.929.221.422.3222.621.721.220.029.622.323.6323.422.824.925.831.622.827.2423.022.623.623.829.122.424.0max.23.422.824.925.831.622.827.2min.22.221.721.220.029.121.422.3avg.22.8 22.3 23.1 23.1 29.9 22.2 24.3 stdev0.5 0.5 1.6 2.4 1.2 0.6 2.1 rsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)11.70.72.73.22.8-0.60.421.31.60-1.72.60.41.432.52.24.55.14.70.64.641.81.21.72.01.50.40.9max.2.52.24.55.14.70.64.6min.1.30.70-1.71.5-0.60.4avg.1.81.42.22.22.90.21.8stdev0.50.61.92.91.30.51.9 notepin arrangement refer to fig. 1 (fig.1)2.2.22.2.3 durability unit：kgf resultsample53088 v.s. 線端usb2.0 1 cycle100 cycles200 cyclesi.fw.fi.fw.fi.fw.f11.7211.6581.7321.6211.6871.63321.9021.7421.7871.8341.931.77231.8581.7751.7921.7421.7391.76141.8391.921.8321.9021.8291.841max.1.902 1.920 1.803 1.902 1.930 1.841 min.1.721 1.658 1.721 1.621 1.687 1.633 avg.1.830 1.774 1.751 1.775 1.796 1.752 stdev.0.077 0.109 0.036 0.122 0.107 0.087 resultsample500 cycles1000 cycles1500 cyclesi.fw.fi.fw.fi.fw.f11.692 1.628 1.661 1.782 1.659 1.645 21.892 1.774 1.689 1.751 1.931 1.812 31.818 1.741 1.723 1.781 1.875 1.827 41.826 1.756 1.855 1.861 1.766 1.819 max.1.892 1.774 1.855 1.861 1.931 1.827 min.1.692 1.628 1.661 1.751 1.659 1.645 avg.1.807 1.725 1.732 1.794 1.808 1.776 stdev.0.084 0.066 0.086 0.047 0.121 0.087 2.2.3 gap unit：mmcyclessample53088 v.s. 線端usb2.053088：彈片高度：0.64+/-0.13ir前ir後1500 cycles左 pin 1pin 2pin 3右pin 4左 pin 1pin 2pin 3右pin 4左 pin 1pin 2pin 3右pin 410.5510.5590.5680.5800.5530.5590.5680.5800.5510.5610.5540.56220.5500.5660.5800.5870.5520.5660.5800.5870.5500.5560.5570.55730.5600.5790.5890.5870.5600.5790.5890.5870.5620.5550.5600.55140.5650.5870.5900.5940.5650.5870.5900.5940.5500.5680.5500.561max.0.5650.5870.5900.5940.5650.5870.5900.5940.5620.5680.5600.562min.0.5500.5590.5680.5800.5520.5590.5680.5800.5500.5550.5500.551avg.0.5570.5730.5820.5870.5580.5730.5820.5870.5530.5600.5550.558stdev.0.0070.0130.0100.0060.0060.0130.0100.0060.0060.0060.0040.005test photo result sample鐵殼彈片高度：for reference onlyir前ir後5000 cycles尺寸1尺寸2尺寸3尺寸1尺寸2尺寸3尺寸1尺寸2尺寸313.7273.78711.6583.7193.78611.6583.9343.99011.97523.7163.78111.6463.7143.78111.6513.9303.98711.98033.7033.78511.6753.7123.78511.6703.9253.98911.97943.7303.78811.6133.7293.78311.6053.9403.98611.943max.3.7303.78811.6753.7293.78611.6703.9403.99011.980min.3.7033.78111.6133.7123.78111.6053.9253.98611.943avg.3.7193.78511.6483.7193.78411.6463.9323.98811.969stdev.0.0120.0030.0260.0080.0020.0280.0060.0020.0183、vibration 3.1 test method1) test description：contact resistance vibration contact resistance2) test equipment：vibration：reactive type vibration tester ( u. chihen / uvs-5060m)contact resistance：milliohm meter (zenith / 502b)3) test condition：vibration：. amplitude：1.5 mm p-psweep time：10-55-10 hz 2 hrs per each sweep total 6 hrs contact resistance：20mv max. , 100ma max.4) environment temp.：22.35) product spec：contact resistance：30 milliohms maximum appearance：no damagediscontinuity：1 s max.3.2 test result 3.2.1 vibration sample1234appearanceno damageno damageno damageno damagediscontinuity1s1s1s1s3.2.2 contact resistance unit：mbefore testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)122.221.824.123.529.822.129.8221.423.522.422.931.423.530.1322.523.522.523.530.422.131.2423.121.824.522.131.223.531.2max.23.123.524.523.531.423.531.2min.21.421.822.422.129.822.129.8avg.22.322.723.423.030.722.830.6stdev0.71.01.10.70.70.80.7after testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)121.822.523.824.531.525.229.3221.823.424.521.831.524.831.5322.821.522.925.431.525.431.5423.422.823.424.433.227.230.5max.23.423.424.525.433.227.231.5min.21.821.522.921.831.524.829.3avg.22.522.623.724.031.925.730.7stdev0.80.80.71.60.91.11.0rsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)1-0.40.7-0.311.73.1-0.520.4-0.12.1-1.10.11.31.430.3-20.41.91.13.30.340.31-1.12.323.7-0.7max.0.412.12.323.71.4min.-0.4-2-1.1-1.10.11.3-0.7avg.0.2 -0.1 0.3 1.0 1.2 2.9 0.1stdev0.4 1.3 1.4 1.5 0.8 1.1 1.04、thermal shock humidity 4.1 test method1) test description：examination of product contact resistance insulation resistance dielectric strength thermal shock humidity examination of product dielectric strength insulation resistance contact resistance2) test equipment：contact resistance：milliohm meter (zenith / 502b)thermal shock：thermal shock test chamber (itst-080-55-w)humidity：micro processor tem. humidity test chamber (kson / ths-b4150)insulation resistance/dielectric strength：digital hi-pot testers ( extelh /7142 )3) test condition：contact resistance：20mv max. , 100ma max.thermal shock： 5cycles 、-55+0/-3(30minute) 85+3/-0 (30minute) insulation resistance：500v dc for 1 minutes dielectric strength：100v ac for 1 minuteshumidity：40 / 90% 95%rh、96hrs4) environment temp.：22.35) product spec：contact resistance：30 milliohms maximum insulation resistance：1000megohms minimumdielectric strength：1 ma max.thermal shock/ humidity：appearance：no damage4.2 test result 4.2.1 insulation resistance& dielectric strengthsampleinsulation resistancesampledielectric strengthbefore testafter testbefore testafter testresultresultresultresult1pass100 mpass100 m1passpass2pass100 mpass100 m2passpass3pass100 mpass100 m3passpass4pass100 mpass100 m4passpass4.2.2 thermal shock、 humidity & contact resistance unit：mbefore testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)122.121.120.121.328.921.530.5221.822.122.522.127.822.431.5320.820.821.520.430.120.831.2422.519.822.520.432.121.531.8max.22.522.122.522.132.122.431.8min.20.819.820.120.427.820.830.5avg.21.821.021.721.129.721.631.3stdev0.70.91.10.81.80.70.6after testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)125.425.422.823.130.525.432.8225.423.123.424.533.824.133.9323.123.525.122.832.123.435.4423.524.423.423.434.023.533.8max.25.425.425.124.534.025.435.4min.23.123.122.822.830.523.432.8avg.24.424.123.723.532.624.134.0stdev1.21.01.00.71.60.91.1rsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)13.34.32.71.81.63.92.323.610.92.461.72.432.32.73.62.422.64.2414.60.931.922max.3.64.63.6363.94.2min.110.91.81.61.72avg.2.6 3.2 2.0 2.4 2.9 2.6 2.7 stdev1.2 1.7 1.4 0.5 2.1 1.0 1.0 5、temperature life5.1 test method1) test description：examination of product contact resistance insulation resistance dielectric strength temperature life examination of product dielectric strength insulation resistance contact resistance2) test equipment：temperature life：forced convection oven(wit/wpo-090)contact resistance：milliohm meter (zenith / 502b)3) test condition：temperature life：105 for 96hours.contact resistance：20mv max. , 100ma max.4) environment temp.：22.35) product spec：temperature life：appearance：no damagecontact resistance：30 milliohms maximum5.2 test result 5.2.1 insulation resistance& dielectric strengthsampleinsulation resistancesampledielectric strengthbefore testafter testbefore testafter testresultresultresultresult1pass100 mpass100 m1passpass2pass100 mpass100 m2passpass3pass100 mpass100 m3passpass4pass100 mpass100 m4passpass5.2.2 temperature life& contact resistance unit：mbefore testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)121.222.121.220.829.222.531.5222.123.223.522.327.521.431.8321.821.522.121.528.821.830.2423.120.823.421.830.522.531.5max.23.1 23.2 23.5 22.3 30.5 22.5 31.8 min.21.2 20.8 21.2 20.8 27.5 21.4 30.2 avg.22.1 21.9 22.6 21.6 29.0 22.1 31.3 stdev0.8 1.0 1.1 0.6 1.2 0.5 0.7 after testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)124.523.525.525.832.128.133.9223.425.824.826.434.825.534.5324.824.927.225.633.925.436.1425.125.425.424.835.125.835.1max.25.1 25.8 27.2 26.4 35.1 28.1 36.1 min.23.4 23.5 24.8 24.8 32.1 25.4 33.9 avg.24.5 24.9 25.7 25.7 34.0 26.2 34.9 stdev0.7 1.0 1.0 0.7 1.4 1.3 0.9 rsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)13.31.44.352.95.62.421.32.61.34.17.34.12.7333.45.14.15.13.65.9424.6234.63.33.6max.3.34.65.157.35.65.9min.1.31.41.332.93.32.4avg.2.4 3.0 3.2 4.1 5.0 4.2 3.7 stdev0.9 1.3 1.8 0.8 1.8 1.0 1.6 6、salt spray6.1 test method1) test description：examination of product contact resistance salt spray examination of product contact resistance2) test equipment：salt spray：salt spray test chamber ( u. hihen /us-60)contact resistance：milliohm meter (zenith / 502b)3) test condition：contact resistance：20mv max. , 100ma max.salt spray：() gold flash for 8 hours / salt spray from 5 % solution at 35.4) environment temp.：22.35) product spec：appearance：no damagecontact resistance：30 milliohms maximum6.2 test result unit：mbefore testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)120.521.522.521.829.821.530.1221.820.821.520.328.521.531.1322.122.122.821.829.122.530.5421.821.922.620.429.521.831.5max.22.1 22.1 22.8 21.8 29.8 22.5 31.5 min.20.5 20.8 21.5 20.3 28.5 21.5 30.1 avg.21.6 21.6 22.4 21.1 29.2 21.8 30.8 stdev0.7 0.6 0.6 0.8 0.6 0.5 0.6 after testsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)123.823.423.924.833.225.433.8224.424.824.425.431.824.832.9325.125.127.524.432.524.633.4424.225.224.825.734.123.434.5max.25.1 25.2 27.5 25.7 34.1 25.4 34.5 min.23.8 23.4 23.9 24.4 31.8 23.4 32.9 avg.24.4 24.6 25.2 25.1 32.9 24.6 33.7 stdev0.5 0.8 1.6 0.6 1.0 0.8 0.7 rsample1pin(vbus)2pin(d-)3pin(d+)4pin(gnd)5pin(stda_ssrx-)7pin(gnd_drain)9pin(stda_sstx-)13.31.91.433.43.93.722.642.95.13.33.31.83334.72.63.42.12.942.43.32.25.34.61.63max.3.344.75.34.63.93.7min.2.41.91.42.63.31.61.8avg.2.8 3.1 2.8 4.0 3.7 2.7 2.9 stdev0.4 0.9 1.4 1.4 0.6 1.1 0.8 7、solder ability7.1 test method1) test equipment：soldering pot ( kc/ kc100h )2) test condition：soldering time 5 sec solder temperature 24553) environment temp.：22.34) product spec：95 % of immersed area must show no void and pin holes 7.2 test result sample no.test result1pass2pass8、resistance to soldering heat8.1 test method1) test description：examination of product resistance to soldering heat contact resistance 2) test equipment：resistance to soldering heat：forced convection re-flow oven (sm2000cxe)contact resi