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logic symbol This symbol is in accordance with ANSI IEEE Std 91 1984 and IEC Publication 617 12 2VCC 1 5 V 2VCC 1 5 V 2 6 14 7 13 8 C1 C1 C2 C2 1 3 4 5 11 10 12 9 GND 15 0 V VCC 16 VCC C1 C1 C2 C2 T1IN T2IN R1OUT R2OUT T1OUT T2OUT R1IN R2IN VS VS MAX232 MAX232I DUAL EIA 232 DRIVER RECEIVER SLLS047G FEBRUARY 1989 REVISED AUGUST 1998 1 POST OFFICE BOX 655303 DALLAS TEXAS 75265 Operates With Single 5 V Power Supply LinBiCMOS Process Technology Two Drivers and Two Receivers 30 V Input Levels Low Supply Current 8 mA Typical Meets or Exceeds TIA EIA 232 F and ITU Recommendation V 28 Designed to be Interchangeable With Maxim MAX232 Applications TIA EIA 232 F Battery Powered Systems Terminals Modems Computers ESD Protection Exceeds 2000 V Per MIL STD 883 Method 3015 Package Options Include Plastic Small Outline D DW Packages and Standard Plastic N DIPs description The MAX232 device is a dual driver receiver that includes a capacitive voltage generator to supply EIA 232 voltage levels from a single 5 V supply Each receiver converts EIA 232 inputs to 5 V TTL CMOS levels These receivers have a typical threshold of 1 3 V and a typical hysteresis of 0 5 V and can accept 30 V inputs Each driver converts TTL CMOS input levels into EIA 232 levels The driver receiver and voltage generator functions are available as cells in the Texas Instruments LinASIC library The MAX232 is characterized for operation from 0 C to 70 C The MAX232I is characterized for operation from 40 C to 85 C AVAILABLE OPTIONS PACKAGED DEVICES TA SMALL OUTLINE D SMALL OUTLINE DW PLASTIC DIP N 0 C to 70 CMAX232D MAX232DW MAX232N 40 C to 85 CMAX232ID MAX232IDW MAX232IN This device is available taped and reeled by adding an R to the part number i e MAX232DR Copyright 1998 Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date Products conform to specifications per the terms of Texas Instruments standard warranty Production processing does not necessarily include testing of all parameters Please be aware that an important notice concerning availability standard warranty and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet LinASIC and LinBiCMOS are trademarks of Texas Instruments Incorporated 1 2 3 4 5 6 7 8 16 15 14 13 12 11 10 9 C1 VS C1 C2 C2 VS T2OUT R2IN VCC GND T1OUT R1IN R1OUT T1IN T2IN R2OUT D DW OR N PACKAGE TOP VIEW MAX232 MAX232I DUAL EIA 232 DRIVER RECEIVER SLLS047G FEBRUARY 1989 REVISED AUGUST 1998 2 POST OFFICE BOX 655303 DALLAS TEXAS 75265 absolute maximum ratings over operating free air temperature range unless otherwise noted Input supply voltage range VCC see Note 1 0 3 V to 6 V Positive output supply voltage range VS VCC 0 3 V to 15 V Negative output supply voltage range VS 0 3 V to 15 V Input voltage range VI Driver 0 3 V to VCC 0 3 V Receiver 30 V Output voltage range VO T1OUT T2OUT VS 0 3 V to VS 0 3 V R1OUT R2OUT 0 3 V to VCC 0 3 V Short circuit duration T1OUT T2OUT Unlimited Package thermal impedance JA see Note 2 D package113 C W DW package105 C W N package78 C W Storage temperature range Tstg 65 C to 150 C Lead temperature 1 6 mm 1 16 inch from case for 10 seconds 260 C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied Exposure to absolute maximum rated conditions for extended periods may affect device reliability NOTE 1 All voltage values are with respect to network ground terminal 2 The package thermal impedance is calculated in accordance with JESD 51 except for through hole packages which use a trace length of zero recommended operating conditions MINNOMMAXUNIT Supply voltage VCC4 555 5V High level input voltage VIH T1IN T2IN 2V Low level input voltage VIL T1IN T2IN 0 8V Receiver input voltage R1IN R2IN 30V Operating free air temperature TA MAX232070 COperating free air temperature TA MAX232I 4085 C MAX232 MAX232I DUAL EIA 232 DRIVER RECEIVER SLLS047G FEBRUARY 1989 REVISED AUGUST 1998 3 POST OFFICE BOX 655303 DALLAS TEXAS 75265 electrical characteristics over recommended ranges of supply voltage and operating free air temperature range unless otherwise noted PARAMETERTEST CONDITIONSMINTYP MAXUNIT VOHHigh level output voltage T1OUT T2OUTRL 3 k to GND57 VVOHHigh level out ut voltage R1OUT R2OUTIOH 1 mA3 5 V VOL Low level output voltage T1OUT T2OUTRL 3 k to GND 7 5 VVOL Low level output voltage R1OUT R2OUTIOL 3 2 mA0 4 V VIT Receiver positive going input threshold voltage R1IN R2INVCC 5 V TA 25 C1 72 4V VIT Receiver negative going input threshold voltage R1IN R2INVCC 5 V TA 25 C0 81 2V VhysInput hysteresis voltageR1IN R2INVCC 5 V0 20 51V riReceiver input resistanceR1IN R2INVCC 5 TA 25 C357k roOutput resistanceT1OUT T2OUTVS VS 0 VO 2 V300 IOS Short circuit output currentT1OUT T2OUTVCC 5 5 V VO 0 10mA IISShort circuit input currentT1IN T2INVI 0200 A ICCSupply current VCC 5 5 V TA 25 C All outputs open 810mA All typical values are at VCC 5 V TA 25 C The algebraic convention in which the least positive most negative value is designated minimum is used in this data sheet for logic voltage levels only Not more than one output should be shorted at a time switching characteristics VCC 5 V TA 25 C PARAMETERTEST CONDITIONSMINTYPMAXUNIT tPLH R Receiver propagation delay time low to high level outputSee Figure 1500ns tPHL R Receiver propagation delay time high to low level outputSee Figure 1500ns SRDriver slew rate RL 3 k to 7 k See Figure 2 30V s SR tr Driver transition region slew rateSee Figure 33V s MAX232 MAX232I DUAL EIA 232 DRIVER RECEIVER SLLS047G FEBRUARY 1989 REVISED AUGUST 1998 4 POST OFFICE BOX 655303 DALLAS TEXAS 75265 PARAMETER MEASUREMENT INFORMATION 10 ns VCC R1IN or R2IN R1OUT or R2OUT RL 1 3 k See Note C CL 50 pF see Note B TEST CIRCUIT 10 ns Input Output tPHL tPLH 1 5 V VOL VOH 0 V 3 V 10 90 50 500 ns WAVEFORMS 1 5 V 90 50 10 NOTES A The pulse generator has the following characteristics ZO 50 duty cycle 50 B CL includes probe and jig capacitance C All diodes are 1N3064 or equivalent Pulse Generator see Note A Figure 1 Receiver Test Circuit and Waveforms for tPHL and tPLH Measurements MAX232 MAX232I DUAL EIA 232 DRIVER RECEIVER SLLS047G FEBRUARY 1989 REVISED AUGUST 1998 5 POST OFFICE BOX 655303 DALLAS TEXAS 75265 PARAMETER MEASUREMENT INFORMATION T1IN or T2INT1OUT or T2OUT CL 10 pF see Note B TEST CIRCUIT 10 ns 10 ns Input Output tPHL tPLH VOL VOH 0 V 3 V 10 90 50 5 s WAVEFORMS 90 50 10 RL 90 10 90 10 tTLH tTHL EIA 232 Output SR 0 8 VOH VOL tTLH or 0 8 VOL VOH tTHL NOTES A The pulse generator has the following characteristics ZO 50 duty cycle 50 B CL includes probe and jig capacitance Pulse Generator see Note A Figure 2 Driver Test Circuit and Waveforms for tPHL and tPLH Measurements 5 s input EIA 232 Output 3 V 3 V 3 V 3 V 3 k 10 1 5 V 90 WAVEFORMS 20 s 1 5 V 90 10 VOH VOL tTLH tTHL 10 ns 10 ns TEST CIRCUIT CL 2 5 nF Pulse Generator see Note A Input Output SR 6 V tTHLor tTLH NOTE A The pulse generator has the following characteristics ZO 50 duty cycle 50 Figure 3 Test Circuit and Waveforms for tTHL and tTLH Measurements 20 s input MAX232 MAX232I DUAL EIA 232 DRIVER RECEIVER SLLS047G FEBRUARY 1989 REVISED AUGUST 1998 6 POST OFFICE BOX 655303 DALLAS TEXAS 75265 APPLICATION INFORMATION VS VS 2 6 14 7 13 8 C1 C1 C2 C2 1 3 4 5 11 10 12 9 GND 15 0 V VCC 16 5 V EIA 232 Output EIA 232 Output EIA 232 Input EIA 232 Input 1 F 8 5 V 8 5 V 1 F 1 F 1 F From CMOS or TTL To CMOS or TTL Figure 4 Typical Operating Circuit IMPORTANT NOTICE Texas Instruments and its subsidiaries TI reserve the right to make changes to their products or to discontinue any product or service without notice and advise customers to obtain the latest version of relevant information to verify before placing orders that information being relied on is current and complete All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement including those pertaining to warranty patent infringement and limitation of liability TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI s standard warranty Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty Specific testing of all parameters of each device is not necessarily performed except those mandated by government requirements CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH PERSONAL INJURY OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE CRITICAL APPLICATIONS TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGN
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