电子显微分析词汇.doc

电镜词汇说明：这些词汇按照各章节内容顺序总结，看词汇的同时也在把知识点复习TEM_ Transmission Electron Microscope透射电子显微镜SEM_ Scanning Electron Microscope扫描电子显微镜EPMA_ Electron Probe Microanalyzer电子探针显微分析STEM_ Scanning Transmission Electron Microscope扫描透射电子显微镜EDS_ X-ray energy dispersive spectrometerX光能谱分析CBED_ Convergent Beam Electron Diffraction会聚束电子衍射EELS_ Electron Energy Loss Spectrometry电子能量损失能谱EBSD_ Electron Backscattered Diffraction电子背散射衍射SPM_ Scanning Probe Microscope扫描探针显微镜STM_ Scanning Tunneling Microscope扫描隧道显微镜AFM_ Atomic Force Microscope原子力显微镜HREM_ High Resolution Electron Microscope高分辨电子显微镜NBD_ Nano-beam Electron diffraction纳电子衍射resolution分辨率diffraction衍射Rayleigh criterion瑞利判据accelerating voltage 加速电压aberration像差spherical aberration球差chromatic aberration色差astigmatism像散distortion畸变short magnetic lens短磁透镜magnification放大率Polepieces极靴Cs: spherical aberration coefficient球差系数: semi-angle半角tungsten wire钨丝FEG: Field Emission Gun场发射枪condenser lens会聚镜specimen样品Objective lens物镜objective aperture物镜光阑SAD_ selected area diffraction选取衍射SAD aperture选区光阑Intermediate lens中间镜Projector lens投影镜screen光屏diaphragm隔片（光阑外的部分）insert插入pattern图案，花样camera chamber照相室CCD_ Charge-Coupled Devices电荷耦合器件IP_ Imaging plate成像板vacuum真空DP_ Diffusion Pump扩散泵side-entry specimen holder侧入样品杆grid微栅Single-tilt holder单倾台alignment对中Thin foil薄膜cross section specimen界面样品prethinning预减薄dimpler凹坑减薄仪Tripod polisher三角抛光器Twin-jet electropolishing apparatus双喷电解抛光装置Ion Milling离子减薄slice薄片Ultramicrotomy超薄切片法Extraction Replication萃取复型FIB_ Focused Ion Beam聚焦离子束（Ga）inert惰性(in)elastic scattering（非）弹性散射Braggs Law布拉格定律Reciprocal lattice倒易点阵Ewald Sphere爱瓦德球Systematic absence系统消光Relrod倒易杆camera constant相机常数Weiss zone law晶带定律Plot画出corresponding相关perpendicular垂直Eucentric plane真实中心平面Displacement位移Index指数；标定integer ratio relationship整数比关系radii半径calculate计算ASTM（American Society for Testing Material）card美国试验材料学会180 ambiguity 180度不确定度dislocation位错Calibration校正symmetry对称twinned crystals孪晶twin reflection spots孪生反射点？High Order Laue Zone高阶劳埃带edge边缘superimpose重叠Tetragonal四方Orthorhombic正交Hexagonal六方Kikuchi Lines菊池线hyperbolae双曲线Kikuchi pole菊池极Superlattice超点阵Incommensurate structure无公度结构textured specimen织构样品Contrast衬度Kinematical theory运动学理论Dynamical theory动力学理论Mass-thickness contrast质厚衬度Phase contrast image相衬度Z contrast Z衬度absorption吸收Diffraction contrast衍射衬度BF: bright filed image明场像DF: dark filed image暗场像CDF: Centered Dark Field image中心暗场像complementary互补column approximation柱体近似extinction distance消光距离Thickness fringes等厚条纹Bend Contour弯曲轮廓（等倾条纹）invisibility criterion of defects缺陷不可见判据Stacking fault层错Screw dislocation螺位错Edge dislocation刃位错real dislocation真实位错Burgers vectors泊氏矢量Moir patterns云纹图案effective extinction distance有效消光距离Characteristic X-ray特征X光SE: secondary electron慢二次电子topographic contrast形貌对比Auger Electron俄歇电子CL: cathodoluminescence阴极荧光Transmitted electrons透射电子（EELS）Scan coils扫描线圈specimen chamber样品室Cathode Ray Tube阴极射线管Secondary electron yield 二次电子产率trajectory轨迹BSE: Backscattered electron背散射电子Channelling contrast通道衬度orientation取向spatial distribution of composition成分空间分布Absorption electron image吸收电子像S/N: signal noise ratio信噪比charging充电现象a large depth of focus很大景深Fracture surface断口表面EBSP:Electron Backscatter Diffraction Pattern 电子背散射衍射图案Crystal Orientation Mapping晶体取向成像Variable -Pressure SEM可变气压扫描电镜ESEMTM: Environmental SEM环境扫描电镜GSED: gaseous secondary electron detector气体二次电子探测器Si(Li) detector 锂漂移硅探测器WDS: Wavelength Dispersive X-ray Spectrometer X射线波谱仪MCA: multichannel analyzer多通道分析仪overlapped peak重叠峰spot analysis点分析Line scan线扫描Element mapping元素分布图volume exited激发体积Quantitative analysis定量分析weak-phase-object approximation弱相位物体近似scherzer defocus Scherzer欠焦specimen thickness样品厚度NED: nano-area electron diffraction微衍射disc盘chemical bonding化学键Energy Filtered Image能量过滤