GR-1221-CORE简单培训ppt课件

,GE-1221-CORE培训,2016.3.31,黎波锐,1,XZH,2,Contents,1定义2专业用语3注意事项4可靠性测试5可靠性测试程序6Telcordia其他标准,XZH,3,1定义,定义-GenericReliabilityAssuranceRequirementsforPassiveOpticalComponents-光无源器件可靠性一般要求测试机构,XZH,4,2专业用语,要求R-Requirement目标O-Objecticve容忍疵品比率LTPD-LotTolerancePercentageDefective有条件要求CR-ConditionalRequirement条件CN-Condition,XZH,5,3注意事项,Devicequalificationhastwoprimarypurposes-Itconfirmstheabilityofthedevicetomeettheequipmentsuppliersperformancerequirements.-Qualificationtestingverifiesthelong-termperformanceofthedevice.,XZH,6,包装与运输-包装必须充分保障产品在正常处置、运输和存处时不被损坏。故障率的预测（SampleFormatforReportingFailureRatePredictions）,XZH,7,临时使用设备的合格要求（RequirementsforProvisionalUseofDevicesinQualification）,XZH,8,可靠性测试状态的示例报表格式（SampleReportFormatforReliabilityTestStatus）,XZH,9,安全原则（SafetyConsiderations）-辐射危险-清洁材料-易燃纤维,XZH,10,4可靠性测试,可靠性测试通过/不合格的标准（ReliabilityTestPass/FailCriteria）-被测组件必须满足所有参数的限制-Componentsthattest“out-of-spec”foranyparametershallbeconsideredafailedunit,regardlessofwhetherittests“in-spec”aftersubsequentstresstesting.-The“Time-on-Test”creditedtoacomponentthatfailsduringaninterimdowntimetestshallbefromthestartofthetesttothelastinterimdowntimetestatwhichthedevicetested“in-spec”forallparameters.,XZH,11,5可靠性测试程序,机械冲击实验MechanicalShock(ImpactTest)-基于MIL-STD-883,Method2002NumberofShocks:5timesperdirectionfor6directions(on3axes)ShockLevel:500GDuration:1msOR-基于theproceduresstatedinEIA/TIA-455-2AforlightserviceapplicationsDropHeight:1.8meters(6feet)Numberofdropsperthreemutuallyperpendicularaxes:8Numberofrepetitionsofimpacttestcycle:5,XZH,12,变频振动测试（VariableFrequencyVibrationTest）-基于MIL-STD-883,Method2007Condition:ConditionAAcceleration:20GmaximumaccelerationFrequency:20-2,000HzDuration:4minpercycleand4cyclesperaxisOR-基于theproceduresstatedinEIA/TIA-455-11A,testconditionIVVibrationType:SinusoidalFrequency:10to2,000HzAccel.(orAmplitude):20G(or1.52mmor0.060indoubleamplitude),whicheverisless.SweepTime:10to2000Hzandreturnedto10Hzin20minutes.Duration:Sweepcycleperformed12timesineachofthreemutuallyperpendiculardirections(totalof36times).,XZH,13,热冲击实验（ThermalShockTest）-基于MIL-STD-883Method1011TemperatureRange:T=100C(0Cto100C),liquid-to-liquidDwellTimes:5minutesattemperatureextremesTransferTime:10secondsNumberofCycles:15OR-基于theproceduresstatedinEIA/TIA-455-71TemperatureRange:T=100C(withintheoperatingtemperaturerangeofthedeviceundertest),liquid-to-liquidDwellTimes:30minutesattemperatureextremesTransferTime:2minutesNumberofCycles:20,XZH,14,高温存储实验（干热）HighTemperatureStorageTest(DryHeat)-基于theproceduresstatedinEIA/TIA-455-4ATemperature:85C(2C)orthemaximumstoragetemperatureHumidity:40%RHTestDuration:2,000hrsforqualificationand5,000hrsforinformation高温存储试验（湿热）HighTemperatureStorageTest(DampHeat)-基于MIL-STD-883Method103orEIA/TIA-455-5A,testtype1,XZH,15,Temperature:75C(2C)Humidity:90%(5%)RHORTemperature:85C(2C)Humidity:85%(5%)RHTestDuration:Asspecifiedbythepackages(hermeticornot)andtheoperationalenvironments(COorRT/UNC)inSection4Table3.Note:Thetestat85C/85%RHaccordingtotheproceduresspecifiedinIECPub.68-2-3orMIL-STD-202Method103isacceptable.ThetestshallmeetthedurationsspecifiedinTable2inSection4,whichmaybedifferentfromthoseintheIECorMIL-STDdocuments.,XZH,16,低温存储试验（LowTemperatureStorageTest）-基于theproceduresstatedinEIA/TIA-455-4ATemperature:-40C(5C)Humidity:UncontrolledTestDuration:2,000hrsforqualificationand5000hrsforinformation温度循环实验（TemperatureCyclingTest）-基于theproceduresstatedinMIL-STD-883,Method1010orEIA/TIA-455-3ATemperature:-40Cto70C(2C)forCO40Cto85C(2C)forRT/UNCDwellTimeatExtremes:15minutesNumberofCycles:100pass/fail,500forinformationforCO500pass/fail,1000forinformationforRT/UNC,XZH,17,循环抗湿性实验（CyclicMoistureResistanceTest）-基于theproceduresstatedinMIL-STD-883,Method1004orIEC68-2-38TemperatureProfile:RefertoFigure6.1Rel