A92(TO-92).doc

33SEMICONDUCTOR TECHNICAL DATA NPN EPITAXIAL SILICON TRANSISTORA92(TO-92)Package: TO-92 PINSTYLE123NO.1EBCHIGH VOLTAGE TRANSISTORB * Complement To A42 * High Collector-Emitter Voltage Vceo=-300V * Collector Dissipation Pc=625mW(Ta=25)Absolute Maximum Ratings at Ta=25Characteristic SymbolRating UnitCollector-Base VoltageVcbo-300VCollector-Emitter Voltage Vceo-300VEmitter-Base VoltageVebo-5VCollector Current Ic-500 mACollector Dissipation Pc625 m WJunction Temperature Tj 150 0CStorage Temperature Tstg-55150 0CElectrical Characteristics at Tamb=25CharacteristicSymbolMinTypMaxUnitTest ConditionsCollector-Base Breakdown VoltageBVcbo-300VIc=-100uA Ie=0Collector-Emitter Breakdown VoltageBVceo-300VIc=-1mA Ib=0Emitter-Base Breakdown VoltageBVebo-5VIe=-100uA Ic=0Collector Cutoff Current Icbo-250nAVcb=-200V Ie=0Emitter Cutoff Current Iebo-100nAVeb=-3V Ic=0DC Current GainHfe125Vce=-10v Ic=-1mADC Current GainHfe280250Vce=-10v Ic=-10mADC Current GainHfe340Vce=-10v Ic=-30mACollector-Emitter Saturation VoltageVce(sat)-0.5VIc=-20mA Ib=-2mABase-Emitter Saturation VoltageVbe(sat)-0.90 VIc=-20mA Ib=-2mAOutput Capacitance Cob6pFVcb=-20V Ie=0 f=1MHzCurrent Gain-Bandwidth ProductfT50MHzVce=-20V Ic=-10mAf=100MHZCLASSIFICATION HFEClassification ABCDHfe80-100100-150150-200200-250A92(TO-92)A92测试程序M#项目名:Min. LimitMax. LimitBias1Bias2Bias3时间不良合格1CONT 00.00mV 200.0mVIB= 1.00mA2.50ms2VCESAT-3.000VIC=-50.0mAIB=-5.00mA2.50msSORT3BVCBO-4.000V-250.0VIC=-100uAVmax=-250V2.50msSORT4BVCBO-300.0V-800.0VIC=-100uAVmax=-800V2.50msSORT5BVCEO-4.000V-200.0VIC=-1.00mAVmax=-200V2.50msSORT6BVCEO-300.0V-999.0VIC=-1.00mAVmax=-800V2.50msSORT7BVEB-1.000V-20.00VIE=-100uAVmax=-020V2.50msSORT8BVEB-6.000V-20.00VIE=-100uAVmax=-200V2.50msSORT9ICEO-10.00uAVCE=-200V025usSORT10ICBO-100.0nAVCB=-200V005usSORT11IEB-100.0nAVEB=-6.00V20.0msSORT12VCESAT-0.500VIC=-20.0mAIB=-2.00mA2.50msSORT13VBESAT-0.900VIC=-20.0mAIB=-2.00mA2.50msSORT14BTON-0.580V-0.720VVCE=-5.00VIC=-2.00mA2.50msSORT15HFE 25.00VCE=-10.0VIC=-30.0mA2.50msSORT16HFE 80.00 400.0VCE=-10.0VIC=-10.0mA2.50msSORT17SAME 100.0 150.0M#= 1618SAME 150.0 200.0M#= 1619SAME 200.0 250.0M#= 1620SAME 250.0 300.0M#= 1621SAME 300.0 400.0M#= 1622SAME 400.0 500.0M#= 16S#Bin#逻辑方法分类名称测试项1F1Or接触不良 1F2F2Or开短路 2F 3F 5F 7F3F3Or低击穿 4F 6F 8F4F4Or饱和失效 12F 13F 14F5F5Or漏电 9F 10F 11F6F6Or放大失效 15F