MIL-STD-202G-Method-310(中文版)

MIL STD 202G METHOD 310 CONTACT CHATTER MONITORING 接點抖動監測接點抖動監測 1 PURPOSE This test is conducted for the purpose of detecting contact chatter in electrical and electronic component parts having movable electrical contacts such as relays switches circuit breakers etc where it is required that the contacts do not open or close momentarily as applicable for longer than a specified time duration see 4 3 under environmental test conditions such as vibration shock or acceleration This test method provides standard test procedures for monitoring such opening of closed contacts or closing of open contacts 1 目的 這測試執行確定在電器和電子零件部份有作切換電器接觸時的接點抖動目的 如繼 電器 開關 電流斷路器 等 接觸的地方不能有短暫的斷開或導通 如適用的環境試驗條 件下 特定的持續長時間期間 見 4 3 如 振動 衝擊或加速 這檢驗方法提供標準測試程 序對於監測如 閉合接點打開 或 打開接點閉合 兩種測試電路 2 TEST CIRCUITS 2 測試電路 2 1 Selection In this method there are two test circuits A see 3 1 and B see 3 2 The selection of the test circuit depends largely upon the type of electrical contacts to be tested Test circuit B is preferred whenever possible to avoid contact contamination caused by the formation of carbonaceous deposits on the contacts The individual specification shall specify the test circuit and time duration see 4 3 required in connection with monitoring of shock and vibration tests The test circuits listed herein are recommended reference circuits Any comparable test circuit which meets the test requirements and the calibration procedures as stated herein may be used for this test 2 1 選擇 這方法有兩個測試電路 A 見 3 1 和 B 見 3 2 測試電路的選擇取決於主要根據電 氣接觸的類型來做測試 測試電路 B 是首選的 盡可能 以避免接觸形成的積炭造成的接 觸污染 特定規格應註明衝擊的監測和震動測試時測試電路和持續時間的要求 呈列於此 的測試電路為建議的參考電路 任何類似的測試電路都應符合本文中指定的測試要求和校 正程序 才能被用作使用測試 2 1 1 Selection of test circuit A Test circuit A is for monitoring test specimens with a single set of contacts for the opening of normally closed contacts or false closures of normally opened contacts see figure 310 1 Test circuit A should not be specified for specimens whose capability includes low level or dry circuit ratings 10 milliamperes or less and 2 volts or less for openings or closings less than 10 microseconds since the current through the electrical contacts under test from the test circuit may cause arcing thus damaging the contacts 2 1 1 測試電路 A 的選擇 測試電路 A 是對於監測樣品 單一組連接設定 如正常導通接觸 的 斷開或正常切斷接觸時不正確的導通 見圖 310 1 測試電路 A 不應指定測試樣 品其 功能包含低等級或微電路等級 10mA 或更低和 2V 或切斷時間或導通時間比 10 s 更低 因為在測試情況下從測試電路電流穿過電子觸點可能造成電弧 從而損壞接 觸 觸點 2 1 2 Selection of test circuit B Test circuit B is for monitoring test specimens with a single set of contacts for the opening of normally closed contacts and false closures of normally open contacts see figure 310 3 Test circuit B should not be used for openings or closings of less than 10 microseconds Test circuit B does not allow current in excess of 20 milliamperes or an open circuit voltage in excess of 2 volts during monitoring which insures that there will be no arcing which will cause damage to low level and dry circuit test specimens 2 1 2 選擇測試電路 B 測試電路 B 是對於監控測試樣品 一組接點設定 如正常導通接觸 的斷開或正常切斷接觸時不正確的導通 見圖 310 3 測試電路 B 不應使用於切 斷或 導通時間低於 10 s 的開關 測試電路 B 不允許測試電流超過 20 m A 或 或在監測 期間 開路電壓超過 2V 在測試低等級和微電流的樣品期間 應保證樣品沒有電弧和造成 損害 發生 註 A 低於切換時間 10 s B 不應低於切斷或導通時間低於 10 s 3 TEST SYSTEMS 3 測試系統 3 1 Test circuit A The test circuit shall be the thyratron circuit shown on figure 310 1 or an approved equivalent circuit The values for R1 C1 and the suppressor grid cathode voltage controlled by R7 principally controls the firing of the thyratron and are so chosen that the thyratron will fire when the duration of the contact opening exceeds the time duration specified in the individual specification see 4 3 and 5 For the longer time durations such as above 1 millisecond it may be necessary to change the values of R2 R5 and R6 3 1 測試電路 A 測試電路應如圖 310 1 所示的閘流管電路或適當等效電路 R1 C1 和抑制 柵極電壓值由 R7 來作控制 主要是在控制閘流管的觸發和當接觸斷開超過在特定規 格指定的時間期間 閘流管將改變觸發 見 4 3 章和 5 章 對於較長的持續時間 如 1ms 以上 它需要改變 R2 R5 和 R6 的阻值 a To monitor normally closed contacts the normally closed contacts are connected to BP1 and BP2 with switch S1 in the normally closed position The grid of the thyratron is placed at ground potential The cathode of the thyratron is at a positive potential depending on the setting of R7 thus providing sufficient negative bias to cut the thyratron off Any contact chatter opening of closed contacts will cause the grid of the thyratron to rise exponentially to 150 volts at a rate determined by the preselected time constant of R1 and C1 As long as the contacts remain open the grid potential will continue to rise If the contacts remain open for longer than the specified interval the grid potential rises to the point at which the thyratron conducts and ionizes thus lighting DS1 Since in a thyratron the grid loses control of conduction as soon as the tube conducts the contacts being monitored can reclose at any time thereafter without affecting the monitoring circuit Thus lamp DS1 will remain on until the thyratron is manually reset by operation of switch S2 a 監測正常導通接觸 正常導通位置應是正常導通接點連接到 BP1 和 BP2 和 Switch S1 閘流 管的柵極因放置於接地位置 而閘流管 SCR 的陰極 cathode 正確電位 取決在 R7 的 設定 從而提供了充足的負偏差 以切斷閘流管的為 切斷 任何的接觸抖動 導通接觸點 的 斷開 將造成閘流管的柵極 透過預選的 R1 和 C1 的時間常數決定的速率成倍上升到 150 V 只要接觸保持斷開 柵極電位將繼續上升 如果觸點繼續斷開大於指定的時間間隔 柵極電位將爬升點到閘流管傳導和電離 從而點燃 DS1 至從在閘流量管的柵極失去傳導控 制立刻由管做傳導 被監視的接觸 可以在任何重合閘 此後的時間不影響監控電路 因 此 DS1 的燈泡將保持 導通 直到閘流管手動重新設置開關 S2 的操作 b To monitor normally open contacts for false closures it is necessary to operate switch S1 to the normally open position so that the connection between the 150 volts and the time constant charging circuit is open When open contacts are connected to BP1 and BP2 and the connection is made these contacts close At contact closure voltage is applied to the charging circuit starting a build up in the same manner as described in a for normally closed contacts At the conclusion of the test if lamp DS1 is off then there has been a no chatter interval exceeding the specified duration if the lamp is on then there was at least one interval when the specified time duration was exceeded After an indication of failure the thyratron circuit shall be restarted by operation of switch S2 b 對於監測正常斷開接觸時不正確的導通 它是需要操作開關 S1 到常開位置 這樣的連接 介於 150V 和時間常數充電電路是斷開之間 當斷開觸點連接到 BP1 和 BP2 和連接之後 那些連接觸點將 導通 在接觸導通時 電壓是適用於充電電路 以同樣的方式開 始建 立描述為正常閉觸點 在測試結速之後 如果燈 DS1 是關閉 之後它會有一個非抖動時 間間隔超過特定時間間隔 如果燈是 斷開 當特定時間持續時間超過時它至少有一 個時間間隔 故障指示後 閘流管電路開關 S2 的操作應重新啟動 3 1 1 Calibration procedure for test circuit A The calibration circuit shown on figure 310 2 may be used to calibrate the monitoring circuit shown on figure 310 1 by using the following procedure 3 1 1 測試電路 A 校正程序 如圖 310 2 所示的校正電路能被用於校正監測電路如圖 310 1 所示 通過使用以下步驟 a Make the proper connections of the monitoring circuit to the calibration circuit as shown and set switch S1 to position A a 設為監控電路的正確連接校準電路如圖所示 設置開關 S1 位置 A b Calibrate the oscilloscope triggering input as follows b 校正示波器觸發輸入如以下 1 Set switch S4 to position A so that the trigger input is connected to the Y axis input of the oscilloscope 1 設定開關 S4 至位置 A 所以觸發輸入是連接到示波器 Y 軸輸入 2 Set the time base control of the oscilloscope for approximately 20 percent of the time duration for which the calibration is being made 2 設定示波器的時間基準控制大約為校正設定的持續時間 20 3 Set the Y amplitude of the oscilloscope for 1 volt per centimeter 3 示波器的 Y 振幅為 1V cm 4 Set the triggering coupling to ac sensitivity 4 設定觸發偶合至 AC 感應 5 Open the switch S3 and adjust the triggering level and stability control so that the trace on The oscilloscope will trigger at 0 5 volt or less The closer the trigger level is to zero the greater the accuracy of calibration 5 打開開關 S3 和調整觸發水平和穩定的控制 以便示波器軌跡將觸發在 0 5V 或以下 當觸發水平越接近 0 其校正的精度須越大 c Set switch S4 to position B so that the Y axis input of the oscilloscope is connected through capacitor C4 to the plate of the thyratron in the test circuit C 設定開關 S4 至位置 B 其示波器的 Y 軸是在測試電路中是透過電容 C4 到閘流管的陽極作 連接 d Close switch S3 d 關閉開關 s3 e Set the Y amplitude of the oscilloscope for a usable display and the time base as in preceding b 2 e 對於可用的顯示範圍設定示波器的 Y 振幅 和時間基準如前面 b 的第 2 f Depress monitor circuit reset switch S2 of figure 310 1 to set the circuit in the ready position i e with the circuit being calibrated and lamp DS1 extinguished f 減少監控電路重新設定圖 310 1 的開關 S2 去設定電路到 準備 位置 即校準電路和燈 DS1 的熄滅 g Open switch S3 the observed trace of the oscilloscope should move across the screen at a positive amplitude until it is deflected downward by the negative pulse created when the thyratron fires The time interval between the start of the trace and the negative pulse is the detection time Adjust R7 of figure 310 1 to the time duration specified in the individual specification g 打開開關 S3 觀察示波器軌跡應橫相移動在正極振幅直到閘流管點燃陰極脈衝產生偏移下 降 軌跡的開始和負脈衝之間的時間間隔是檢測時間 調整圖 310 1 的 R7 至持續時間 規 定在特定規格內 圖表 310 1 Resistors Capacitors R1 35K 1 2W 1 see note 1 C1 0022 F 600 VDCW see note 1 R2 27K 1 2W 5 R3 47K 1W 5 R4 200K 1 2W 5 R5 70K 1W 5 R6 2 4K 1W 5 R7 5K 1W R8 500 1 2W 5 Miscellaneous DS1 NE 51 S1 DPDT S2 SPSTNC 125V 1 amp push V1 JAN 5727 2D21W NOTES 註 1 These values are to be chosen to obtain the desired time duration for the applicable test condition see 4 3 These particular values are applicable to 10 microseconds time duration only 1 對於適合測試條件 見 4 3 這些值是被挑選而獲得想要的持續時間 那些特定的值緊適用 於 10 S 的持續時間 FIGURE 310 1 Test circuit A monitor circuit for contact opening and closing 圖 310 1 測試電路 A 接點斷開和導通的監測電路 圖表 310 2 NOTE The oscilloscope shall have an accuracy of 3 percent or better on time base and have provision for external triggering 註 示波器應有 3 的精確度或好的時間基準和有外部觸發的提供 FIGURE 310 2 Calibration circuit for test circuit A 圖 310 2 測試電路 A 的校正電路 3 2 Test circuit B The monitor circuit shown on figure 310 3 permits detection of contact chatter of closed contacts and false closure of open contacts independently or simultaneously The low contact load levels see 2 1 2 insure that there will be no arcing of the contacts during monitoring 3 2 測試電路 B 這監測電路在圖 310 3 所示 它允許導通觸點的接觸抖動的檢測和斷開觸 點 的錯誤導通的檢測 單獨或同時發生 低接觸負載等級 見 2 1 2 確保其監控期間的 接 觸不會有電弧的發生 a The chatter portion of figure 310 3 resistors R3 and R4 form a voltage divider with their junction at 2 volts The closed contacts of the component under test short circuit R4 and place the base of transistor amplifier Q1 to ground potential When the contacts under test chatter open resistor R4 is no longer short circuited and capacitor C1 starts to charge through R2 and R7 to 2 volts The time necessary for C1 to charge to the correct bias level is determined by the resistance of R2 and R7 and the capacitance value of C1 As transistor Q1 draws current through the gate of SCR1 the unit will fire and turn on lamp DS1 Since in a silicon controlled rectifier the gate loses control after it is turned on the contacts can reclose at any time thereafter without affecting the monitoring circuit The time delay before turn on can be adjusted by varying R2 and selecting the capacitance value of C1 For example C1 002 F gives a 10 microsecond open contact time a 圖 310 3 的抖動部份 電組 R3 和 R4 組成一個電壓分壓器在 2V 連接處 在測試下零件的 導通接觸 短路 R4 和放置在電晶體放大器 Q1 的基極到接地電位處 當測試抖動 斷開 下 的接觸 電阻 R4 不在是短路和電容 C1 開始充電穿過 R2 和 R7 到 2V 對 C1 充電到正確的偏 壓等級時間需求是取決於 R2 電阻和 R7 和 C1 的電容值 由於電晶體 Q1 吸引電流通過 SCR1 的柵極 直到點然和打開燈 DS1 由於在一個矽控整流流器 柵極失去控制之後它會轉成 導 通 接觸點能重新導通之後在任何時間不影響監控電路 在導通之前的時間延遲能由改變 R2 和選擇 C1 電容值來作調整 例如 C1 0 002 F 的給出了一個 10 S 的斷開接觸時 間 b In the false make portion of figure 310 3 transistor amplifier Q2 is normally on with the gate of SCR2 being effectively held at ground potential by the low output impedance of transistor Q2 When a false make occurs the base of Q2 transistor is grounded turning Q2 off This allows the gate of the SCR2 which is tied to the collector of transistor Q2 to rise to 12 volts The rate of increase is determined by the value of C2 and R8 For example C2 002 F gives a 10 microsecond false make time When the voltage reaches the gate turn on level of SCR2 lamp DS2 will light indicating a false closure of the open contacts b 在圖 310 3 錯誤製造部份 電晶體放大器 Q2 在正常導通時與 SCR2 的柵 G 極藉由 Q2 的低 輸出阻抗將有效地流到接地電位處 即 SCR2 的 GATE 到 Q2 到接地 當一個錯誤的動作 產生 電晶體 Q2 的基 B 極是接地 之後 Q2 轉成斷開 允許 SCR2 的柵極 Gate 連繫到 電 晶體 Q2 的集極 C 上升到 12V 增加率是取決於 C2 和 R8 的值 當電壓達到時 SCR2 的 柵極切換導通等級 燈 DS2 將亮起 指示切斷接觸的錯誤的導通發生 c When this circuit is being used to simultaneously monitor both the open and closed contacts of a double set of contacts c 當這電路被使用於同時監控一個雙接觸設定兼有切斷和導通接觸的部份 1 If DS1 lights it is an indication of contact chatter 1 如果 DS1 亮啟 表示觸點抖動 2 If DS1 and DS2 lights it is an indication of false transfer or possible bridging i e the movable contact of the open circuit closes but the closed circuit has not opened 2 如果 DS1 和 DS2 都亮啟 表示錯誤轉換的指示或可能橋接 例如 開路的移動接觸到 導通 但短路沒有被斷開 3 If DS2 lights it is an indication of bridging 3 如果 DS2 亮啟 表示橋接指示 d Restoration of the circuit for an indication of failure is accomplished by the operation of S1 d 對於故障的指示可藉由 S1 的操作來恢復電路 3 2 1 Calibration procedure for test circuit B The calibration circuit shown on figure 310 4 may be used to calibrate the monitoring circuit shown on figure 310 3 by using the following procedure 3 2 1 對於測試電路 B 的校正程序 校正電路在圖 310 4 所示能被使用在圖 310 3 所示的 監 測電路中 使用程序如下 a Make the proper connections of the monitoring circuit to the calibration circuit a 作出適當的監控電路到校正電路的連接 1 BP1 and BP2 for contact chatter calibration 1 對 BP1 和 BP2 做接觸抖動校正 2 BP1 and BP3 for false contact make calibration 2 對 BP1 和 BP3 做錯誤製造的校正 b Select the appropriate 5 volt square wave pulse polarity and pulse width to be furnished by the pulse generator and monitor the pulse on the oscilloscope as follows b 選擇適當的 5V 方波 脈衝極性 和 脈衝寬度 由脈衝發生器的提供的和示波器的 監視脈衝 如下 1 For contact chatter calibration Negative pulse 1 對於接觸抖動校正 使用負脈衝波形 2 For false contact make calibration Positive pulse 2 對於錯誤接觸製造校正 使用正脈衝波形 3 Pulse width for either of the preceding 1 or 2 equal to the required detection time 3 對任一前 1 或 2 項所需的檢測時間等於脈衝寬度 c If DS1 or DS2 as applicable lights adjust R2 or R8 until the light is extinguished C 如果 DS1 或 DS2 如適當 亮啟 調整 R2 或 R8 直到燈熄滅 d Slowly adjust R2 and R8 as applicable to the time duration specified in the individual specification as indicated by the first point at which DS1 or DS2 lights d 慢慢的調整 R2 和 R8 如適當 至個別規格中指定的時間期限內 如第 1 點 DS1 或 DS2 的 亮啟 顯示 圖 310 3 C1 C2 Choose for specified time see note 1 R6 1 000 ohms 1 4W 5 DS1 DS2 No 344 Lamp R7 100 ohms 1 4W 5 R1 750 ohms 1 4W 5 R8 200 ohms pot R2 2 000 ohms pot Q1 Q2 2N332A or equivalent R3 R5 10 000 ohms 1 4W 5 SCR1 SCR2 2N1595 or equivalent R4 2 500 ohms 1 4W 5 S1 SPST NC Push NOTE 註 1 Use 0 0022 F for 10 microsecond time duration Other time duration will require larger capacitors 1 對於 10 S 持續時間使用電容 0 0022 F 其它持續時間將需要更大的電容 FIGURE 310 3 Test circuit B monitor circuit for contact chatter and false closures 圖 310 3 測試電路 B 對於接觸抖動和錯誤的導通的監測電路 圖表 310 3 NOTES 註 1 The square wave pulse generator and oscilloscope shall have an accuracy of 3 percent or better 1 方波脈衝產生器和示波器應有 3 的精確度或更好 2 The ratio of off time to detection time shall be 10 1 or better 2 斷開時間的速率取決時間應 10 1 或更好 FIGURE 310 4 Calibration circuit for test circuit B 圖 310 4 對於測試電路 B 的校正電路 4 PROCEDURE 4 程序 4 1 Preparation The monitor circuits of figures 310 1 and 310 3 shall be calibrated immediately prior to use using the applicable calibration circuit see figures 310 2 and 310 4 respectively The calibration circuit shall then be disconnected from the monitoring circuit 4 1 事前準備 圖 310 1 和 310 3 監控電路應被校正 在使用前應先校正 使用適當校正電 路 見圖 310 2 和 310 4 各別地 4 2 Points of connection The contacts of the test specimen being monitored shall be connected to points BP1 and BP2 for test circuit A for both contact chatter and false make contact conditions For test circuit B the points of connection shall be BP1 and BP2 for contact chatter condition and to points BP1 and