Agilent-3070-系统介绍省名师优质课获奖课件市赛课一等奖课件

Agilent3070系统介绍

&软硬件综述第1页概要Part13070系统介绍Part23070硬件综述Part33070软件综述Part4基本测试原理第2页Part13070系统介绍概要在线测试（ICT）在产线中位置ICT基本测试原理Agilent3x7y系列测试界面–夹具安全事项测试程序开发流程测试工具第3页在线测试（ICT）在产线中位置SP505DXSeries5000

SJ50SeriesII

SJ50SeriesIIXL

SJ50SeriesIIValue3070Series3目标:尽早发觉制造缺点－降低PCB板制造成本第4页Agilent3070基本测试原理Agilent3070第5页Agilent3070基本测试原理通常是PCB板安装完成后第一次电学测试经过检测PCBA上单个或多个元器件来验证器件值检验器件安放位置确认电路连接查找PCB制造中缺点（短路，开路，错件及零件错位等）第6页常见制造缺点焊点短路第7页常见制造缺点焊点开路第8页常见制造缺点零件安装错位第9页常见制造缺点零件翘起第10页在线测试功效(Summary)模拟器件测试上电测试数字测试局部功效测试准确测试特殊测试验证PCB安装过程在测试阶段尽快消除显著PCBA上零件错误提供最正确测试方案以取得最大测试覆盖率第11页Agilent3x7y系列5184nodes2592nodes1296nodes第12页Agilent3x7y系列ProcessTesterLowCostTesterHighPerformanceTester3X723X733X75TestCapabilities&StandardProducts:ShortsAnalogICTQuick70Short-wirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTAnalogfunctionalIn-circuitboundaryscanQuick70ShortwirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTanalogfunctionalin-circuitboundaryscanQuick70shortwirefixturingPanelTestTestJetDynamicTestAccessflashprogrammingsolutionPolarityCheck第13页Agilent3x7y系列30703x71-unpowerorlimitedpowersystem3x72-ProcessTestSystem3x73-IncircuitTestSystem3x74-FunctionalTestSystem3x75-CombinationTestSystem3x79-TelecommunacationsTestSystem第14页测试界面–夹具第15页短线夹具结构第16页为何选取短线夹具第17页安全事项第18页测试程序开发流程第19页测试工具第20页Part23070硬件综述OutlineAgilent3070结构DUTPowerSupplyTestheadModuleDesignationsCardsinTestheadMotherCardModuleControlCardASRUCardPinCard第21页AnatomyofAgilent3070第22页AnatomyofAgilent3070(Cont.)第23页DUTPowerSuppliesCurrentVoltageOutputNumberAgilent6621AHighLow2Agilent6624AMediumMedium4Agilent6634ALowHigh1Agilent6642AHighHigh1第24页Testhead第25页ModuleDesignations第26页CardsintheTestheadMotherCardModuleControlCardAnalogStimulus-ResponseUnit(ASRU)CardPinCards第27页MotherCard提供系统内部板卡DC电源SuppliesDCpower分配电信号到指定ModuleControlCard解析地址Decodesaddress第28页MotherCard(Cont.)MultiplexingtheASRUcardtopincardsbymothercard第29页ModuleControlCard控制实际测试过程程序自动读取码(AutofileCode)带有8个通用开关(GPRelay)必须放在每个module第6槽位四种类型:ControlCardControlPlusCardControlXTCardControlXTP第30页ASRUCard提供正确激励信号Appliestheappropriatestimulus使用测量运算放大器进行电压信号测量MakesavoltagemeasurementwithMOA(MeasuringOperationalAmplifier)提供直流点信号和波形发生器ProvidesDCsourceandawaveformgenerator分配在1号槽Residesinslot1有A,B,C三个版本第31页PinCardHybridDoubleDensityCardHybrid32CardChannelPlusCard(Nolongeravailable,butstillsupported)AccessPlusCardAnalogPlusCardSerialTestPlusCard(STC+)第32页HybridDoubleDensityCardTwosides:SideA,SideBMUXratio(MINTpins:D/Rlines):9:216channelsx9pins=144MINTpins第33页Hybrid32Card第34页Part33070软件综述概要标准测试流程软件综述BT-Basic及相关命令3070操作步骤测试原理第35页标准测试流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests第36页软件综述第37页BT-Basic界面StatuslineCommandlineOperatingmodeProcessIDnumberWorkingspaceSpecialfunctionkeys第38页快捷键F1–Edit/CommandF2–RecallPlusF3–RecallMinusF4–ExecuteF5–Mark/SecondMark/ClearMarkF6–TestConsultantF7–PushbuttonQSTATSF8–StoreLineF9–InsertLineF10–DeleteLineF11–ClearLineF12–ClearDisplay第39页操作模式第40页惯用BT-Basic命令catchangechange“A”to“BA”changemchangem“cd”to“ab”copytocopy<file1>to<directory2>copyovercopy<file1>over<directory2>/<file3>createdirdeleteduplicate第41页惯用BT-Basic命令editfind,findnfind“string1”,findn“string2”get,loadmergemerge“file1”;“file2”,5,6;“file3”movemsi,msi$numberscratchsave,re-savesave“file1”第42页操作步骤打开系统电源Turnonsystem用设定用户名登陆Logonashp3070user打开BT-BasicOpenBT-Basic进入到待测板目录Gettoboardtestdirectory输入：testheadpoweron,testheadis1输入：load“testplan”索紧夹具Fixturelock运行程式Run松开夹具Fixtureunlock输入：testheadpoweroff,testheadis*退出BT-Basic操作exit登出logoff关机shutdown第43页Testhead操作命令testheadpoweron/offtestheadis1/*fixturelock/unlockfaon/faoffexit第44页Testhead‘Config’file第45页Testhead‘Config’file(Cont.)Thefilemustbelocatedinthe/..3070/diagnostics/th1/directoryThefilemustbecompiledwiththetestheadoptionThetestheadmaynotbootiftheconfigfileinincorrectThistestheadconfigfileisdefinedduringtheinitialsysteminstallationThetestheadconfigfilemaynotbeusedasaboardlevelconfigfile第46页Board‘Config’file第47页Part4基本测试原理测试流程回顾‘testplan’模拟测试基本原理惯用测试选项介绍BoardConsultantPushbuttonDebugOtherIssue第48页标准测试流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests第49页AnalogTest–“testplan”第50页Analogtest-concept第51页Analogtestbasic第52页Shortstest第53页Shortstest(Cont.)Expectsshorts−Jumpers−Closedswitches−Fuses−Smallvalueresistors−Etc.Unexpectedshorts−Highimpedancenodes−Digitalpins−Resistorsabove10kUnexpectedshorts−Lowimpedancenodes−Powernodes−Resistorsbelow10k第54页Shortstest(Cont.)第55页Pinstest第56页Resistivetest第57页CapacitororInductortest第58页StatementsyntaxCapacitorcapacitor<value>,<+tol>,<-tol>,<return>,<comp/nocomp>Diodedi